| 2004 |
|---|
| 8 | EE | Chee-Kian Ong,
Dongwoo Hong,
Kwang-Ting Cheng,
Li-C. Wang:
Jitter spectral extraction for multi-gigahertz signal.
ASP-DAC 2004: 298-303 |
| 7 | EE | Chee-Kian Ong,
Dongwoo Hong,
Kwang-Ting Cheng,
Li-C. Wang:
Random Jitter Extraction Technique in a Multi-Gigahertz Signal.
DATE 2004: 286-291 |
| 6 | EE | Dongwoo Hong,
Chee-Kian Ong,
Kwang-Ting (Tim) Cheng:
BER Estimation for Serial Links Based on Jitter Spectrum and Clock Recovery Characteristics.
ITC 2004: 1138-1147 |
| 5 | EE | Chee-Kian Ong,
Dongwoo Hong,
Kwang-Ting Cheng,
Li-C. Wang:
A Scalable On-Chip Jitter Extraction Technique.
VTS 2004: 267-272 |
| 2002 |
|---|
| 4 | EE | Chee-Kian Ong,
Kwang-Ting (Tim) Cheng:
Self-Testing Second-Order Delta-Sigma Modulators Using Digital Stimulus.
VTS 2002: 123-128 |
| 2000 |
|---|
| 3 | EE | Jing-Reng Huang,
Chee-Kian Ong,
Kwang-Ting Cheng,
Cheng-Wen Wu:
An FPGA-based re-configurable functional tester for memory chips.
Asian Test Symposium 2000: 51-57 |
| 2 | EE | Jiun-Lang Huang,
Chee-Kian Ong,
Kwang-Ting Cheng:
A BIST Scheme for On-Chip ADC and DAC Testing.
DATE 2000: 216-220 |
| 1 | EE | Jan Arild Tofte,
Chee-Kian Ong,
Jiun-Lang Huang,
Kwang-Ting (Tim) Cheng:
Characterization of a Pseudo-Random Testing Technique for Analog and Mixed-Signal Built-in-Self-Test.
VTS 2000: 237-246 |
