| 2004 |
|---|
| 9 | EE | Bin Li,
Michael S. Hsiao,
Shuo Sheng:
A Novel SAT All-Solutions Solver for Efficient Preimage Computation.
DATE 2004: 272-279 |
| 8 | EE | Shuo Sheng,
Michael S. Hsiao:
Success-Driven Learning in ATPG for Preimage Computation.
IEEE Design & Test of Computers 21(6): 504-512 (2004) |
| 2003 |
|---|
| 7 | EE | Shuo Sheng,
Michael S. Hsiao:
Efficient Preimage Computation Using A Novel Success-Driven ATPG.
DATE 2003: 10822-10827 |
| 2002 |
|---|
| 6 | EE | Shuo Sheng,
Koichiro Takayama,
Michael S. Hsiao:
Effective safety property checking using simulation-based sequential ATPG.
DAC 2002: 813-818 |
| 5 | EE | Shuo Sheng,
Michael S. Hsiao:
Efficient Sequential Test Generation Based on Logic Simulation.
IEEE Design & Test of Computers 19(5): 56-64 (2002) |
| 4 | EE | Ashish Giani,
Shuo Sheng,
Michael S. Hsiao,
Vishwani D. Agrawal:
State and Fault Information for Compaction-Based Test Generation.
J. Electronic Testing 18(1): 63-72 (2002) |
| 2001 |
|---|
| 3 | EE | Ashish Giani,
Shuo Sheng,
Michael S. Hsiao,
Vishwani D. Agrawal:
Efficient spectral techniques for sequential ATPG.
DATE 2001: 204-208 |
| 2 | EE | Ashish Giani,
Shuo Sheng,
Michael S. Hsiao,
Vishwani D. Agrawal:
Novel Spectral Methods for Built-In Self-Test in a System-on-a-Chip Environment.
VTS 2001: 163-168 |
| 2000 |
|---|
| 1 | EE | Ashish Giani,
Shuo Sheng,
Michael S. Hsiao,
Vishwani D. Agrawal:
Compaction-based test generation using state and fault information.
Asian Test Symposium 2000: 159-164 |
