| 2008 |
|---|
| 18 | EE | Yiwen Shi,
Kellie DiPalma,
Jennifer Dworak:
Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization.
DFT 2008: 403-411 |
| 17 | EE | Elif Alpaslan,
Yu Huang,
Xijiang Lin,
Wu-Tung Cheng,
Jennifer Dworak:
Reducing Scan Shift Power at RTL.
VTS 2008: 139-146 |
| 2007 |
|---|
| 16 | EE | Jennifer Dworak:
An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting.
VTS 2007: 205-210 |
| 2006 |
|---|
| 15 | EE | Vladimir Stojanovic,
R. Iris Bahar,
Jennifer Dworak,
Richard Weiss:
A cost-effective implementation of an ECC-protected instruction queue for out-of-order microprocessors.
DAC 2006: 705-708 |
| 2005 |
|---|
| 14 | EE | Jennifer Dworak:
An Investigation of Excitation Balance and Additional Mandatory Conditions for the Diagnosis of Fortuitously Detected Defects.
MTV 2005: 48-54 |
| 2004 |
|---|
| 13 | EE | Jennifer Dworak,
Brad Cobb,
James Wingfield,
M. Ray Mercer:
Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects.
DATE 2004: 1066-1071 |
| 12 | EE | Jennifer Dworak,
James Wingfield,
M. Ray Mercer:
A Preliminary Investigation of Observation Diversity for Enhancing Fortuitous Detection of Defects.
DFT 2004: 460-468 |
| 11 | EE | Jennifer Dworak,
David Dorsey,
Amy Wang,
M. Ray Mercer:
Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets.
VTS 2004: 9-15 |
| 2003 |
|---|
| 10 | EE | James Wingfield,
Jennifer Dworak,
M. Ray Mercer:
Function-Based Dynamic Compaction and its Impact on Test Set Sizes.
DFT 2003: 167-174 |
| 2002 |
|---|
| 9 | EE | Jing-Jia Liou,
Li-C. Wang,
Kwang-Ting Cheng,
Jennifer Dworak,
M. Ray Mercer,
Rohit Kapur,
Thomas W. Williams:
Enhancing test efficiency for delay fault testing using multiple-clocked schemes.
DAC 2002: 371-374 |
| 8 | EE | Sooryong Lee,
Brad Cobb,
Jennifer Dworak,
Michael R. Grimaila,
M. Ray Mercer:
A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults.
DATE 2002: 94-101 |
| 7 | EE | Jennifer Dworak,
James Wingfield,
Brad Cobb,
Sooryong Lee,
Li-C. Wang,
M. Ray Mercer:
Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults.
DFT 2002: 177-185 |
| 6 | EE | Jing-Jia Liou,
Li-C. Wang,
Kwang-Ting Cheng,
Jennifer Dworak,
M. Ray Mercer,
Rohit Kapur,
Thomas W. Williams:
Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme.
ITC 2002: 407-416 |
| 2001 |
|---|
| 5 | EE | Jennifer Dworak,
Jason D. Wicker,
Sooryong Lee,
Michael R. Grimaila,
M. Ray Mercer,
Kenneth M. Butler,
Bret Stewart,
Li-C. Wang:
Defect-Oriented Testing and Defective-Part-Level Prediction.
IEEE Design & Test of Computers 18(1): 31-41 (2001) |
| 2000 |
|---|
| 4 | EE | Jennifer Dworak,
Michael R. Grimaila,
Brad Cobb,
Ting-Chi Wang,
Li-C. Wang,
M. Ray Mercer:
On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction.
Asian Test Symposium 2000: 151- |
| 3 | | Jennifer Dworak,
Michael R. Grimaila,
Sooryong Lee,
Li-C. Wang,
M. Ray Mercer:
Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D.
ITC 2000: 930-939 |
| 1999 |
|---|
| 2 | | Jennifer Dworak,
Michael R. Grimaila,
Sooryong Lee,
Li-C. Wang,
M. Ray Mercer:
Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies.
ITC 1999: 1031-1037 |
| 1 | EE | Michael R. Grimaila,
Sooryong Lee,
Jennifer Dworak,
Kenneth M. Butler,
Bret Stewart,
Hari Balachandran,
Bryan Houchins,
Vineet Mathur,
Jaehong Park,
Li-C. Wang,
M. Ray Mercer:
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen.
VTS 1999: 268-274 |
