| |
| 2003 | ||
|---|---|---|
| 2 | EE | Marie-Lise Flottes, Christian Landrault, A. Petitqueux: A Unified DFT Approach for BIST and External Test. J. Electronic Testing 19(1): 49-60 (2003) |
| 2000 | ||
| 1 | EE | Marie-Lise Flottes, Christian Landrault, A. Petitqueux: Design for sequential testability: an internal state reseeding approach for 100 % fault coverage. Asian Test Symposium 2000: 404- |
| 1 | Marie-Lise Flottes | [1] [2] |
| 2 | Christian Landrault | [1] [2] |