Rajesh Kannah
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2000
1
EE
Rajesh Kannah,
C. P. Ravikumar
: Functional Testing of Microprocessors with Graded Fault Coverage.
Asian Test Symposium 2000
: 204-
Coauthor
Index
1
C. P. Ravikumar
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
