S. Mourad

2005
4	EE	M. E. Litvin, S. Mourad: Self-reset logic for fast arithmetic applications. IEEE Trans. VLSI Syst. 13(4): 462-475 (2005)
3	EE	T. Egan, S. Mourad: Design-for-testability for embedded delay-locked loops. IEEE Trans. VLSI Syst. 13(8): 984-988 (2005)
2001
2	EE	S. L. Liu, S. Mourad, S. Krishnan: At-speed testing of data communications transceivers. ISCAS (4) 2001: 9-12
2000
1	EE	S. L. Lin, S. Mourad, S. Krishnan: A BIST methodology for at-speed testing of data communications transceivers. Asian Test Symposium 2000: 216-221

Coauthor Index

1	T. Egan	[3]
2	S. Krishnan	[1] [2]
3	S. L. Lin	[1]
4	M. E. Litvin	[4]
5	S. L. Liu	[2]

Colors in the list of coauthors