2002 |
7 | EE | Wen-Ben Jone,
Der-Cheng Huang,
S. C. Wu,
K. J. Lee:
An efficient BIST method for distributed small buffers.
IEEE Trans. VLSI Syst. 10(4): 512-515 (2002) |
6 | EE | Der-Cheng Huang,
Wen-Ben Jone:
A parallel built-in self-diagnostic method for embedded memoryarrays.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(4): 449-465 (2002) |
5 | EE | Der-Cheng Huang,
Wen-Ben Jone:
A parallel transparent BIST method for embedded memory arrays bytolerating redundant operations.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(5): 617-628 (2002) |
2001 |
4 | EE | Der-Cheng Huang,
Wen-Ben Jone,
Sunil R. Das:
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers.
VLSI Design 2001: 379-384 |
3 | EE | Der-Cheng Huang,
Wen-Ben Jone,
Sunil R. Das:
A Parallel Built-In Self-Diagnostic Method For Embedded Memory Buffers.
VLSI Design 2001: 397-402 |
2000 |
2 | EE | Der-Cheng Huang,
Wen-Ben Jone:
An efficient parallel transparent diagnostic BIST.
Asian Test Symposium 2000: 299- |
1999 |
1 | EE | Wen-Ben Jone,
Der-Cheng Huang,
S. C. Wu,
K. J. Lee:
An Efficient BIST Method for Small Buffers.
VTS 1999: 246-251 |