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Érika F. Cota

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2008
26EECarlos Roberto Moratelli, Felipe Ghellar, Érika F. Cota, Marcelo Lubaszewski: A fault-tolerant, DFA-resistant AES core. ISCAS 2008: 244-247
25EEJulien Dalmasso, Érika F. Cota, Marie-Lise Flottes, Bruno Rouzeyre: Improving the Test of NoC-Based SoCs with Help of Compression Schemes. ISVLSI 2008: 139-144
24EEÉrika F. Cota, Fernanda Gusmão de Lima Kastensmidt, Maico Cassel, Marcos Herve, Pedro Almeida, Paulo Meirelles, Alexandre M. Amory, Marcelo Lubaszewski: A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip. IEEE Trans. Computers 57(9): 1202-1215 (2008)
2007
23EEEmilena Specht, Ricardo Miotto Redin, Luigi Carro, Luís da Cunha Lamb, Érika F. Cota, Flávio Rech Wagner: Analysis of the use of declarative languages for enhanced embedded system software development. SBCCI 2007: 324-329
22EEArthur Pereira Frantz, Maico Cassel, Fernanda Lima Kastensmidt, Érika F. Cota, Luigi Carro: Crosstalk- and SEU-Aware Networks on Chips. IEEE Design & Test of Computers 24(4): 340-350 (2007)
2006
21EEArthur Pereira Frantz, Luigi Carro, Érika F. Cota, Fernanda Lima Kastensmidt: Evaluating SEU and Crosstalk Effects in Network-on-Chip Routers. IOLTS 2006: 191-192
20EECarlos Roberto Moratelli, Érika F. Cota, Marcelo Lubaszewski: A cryptography core tolerant to DFA fault attacks. SBCCI 2006: 190-195
19EEArthur Pereira Frantz, Fernanda Lima Kastensmidt, Luigi Carro, Érika F. Cota: Evaluation of SEU and crosstalk effects in network-on-chip switches. SBCCI 2006: 202-207
18EEÉrika F. Cota, Chunsheng Liu: Constraint-Driven Test Scheduling for NoC-Based Systems. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2465-2478 (2006)
2005
17EEMarcelo de Souza Moraes, Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski: A constraint-based solution for on-line testing of processors embedded in real-time applications. SBCCI 2005: 68-73
16EEChunsheng Liu, Vikram Iyengar, Jiangfan Shi, Érika F. Cota: Power-Aware Test Scheduling in Network-on-Chip Using Variable-Rate On-Chip Clocking. VTS 2005: 349-354
2004
15EEChunsheng Liu, Hamid Sharif, Érika F. Cota, Dhiraj K. Pradhan: Test Scheduling for Network-on-Chip with BIST and Precedence Constraints. ITC 2004: 1369-1378
14EEAntonio Andrade Jr., Érika F. Cota, Marcelo Lubaszewski: Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST. SBCCI 2004: 105-110
13EEAlexandre M. Amory, Érika F. Cota, Marcelo Lubaszewski, Fernando Gehm Moraes: Reducing test time with processor reuse in network-on-chip based systems. SBCCI 2004: 111-116
12EEÉrika F. Cota, Luigi Carro, Marcelo Lubaszewski: Reusing an on-chip network for the test of core-based systems. ACM Trans. Design Autom. Electr. Syst. 9(4): 471-499 (2004)
11EEÉrika F. Cota, Luigi Carro, Marcelo Lubaszewski, Alex Orailoglu: Searching for Global Test Costs Optimization in Core-Based Systems. J. Electronic Testing 20(4): 357-373 (2004)
2003
10EEÉrika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski: Power-aware NoC Reuse on the Testing of Core-based Systems. ITC 2003: 612-621
9EEÉrika F. Cota, Márcio Eduardo Kreutz, Cesar Albenes Zeferino, Luigi Carro, Marcelo Lubaszewski, Altamiro Amadeu Susin: The Impact of NoC Reuse on the Testing of Core-based Systems. VTS 2003: 128-133
2002
8EEÉrika F. Cota, Luigi Carro, Marcelo Lubaszewski, Alex Orailoglu: Test Planning and Design Space Exploration in a Core-Based Environment. DATE 2002: 478-485
2001
7EEÉrika F. Cota, Fernanda Lima, Sana Rezgui, Luigi Carro, Raoul Velazco, Marcelo Lubaszewski, Ricardo Reis: Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults. J. Electronic Testing 17(2): 149-161 (2001)
2000
6EELuigi Carro, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs, Michel Renovell: TI-BIST: a temperature independent analog BIST for switched-capacitor filters. Asian Test Symposium 2000: 78-83
5EEÉrika F. Cota, Michel Renovell, Florence Azaïs, Yves Bertrand, Luigi Carro, Marcelo Lubaszewski: Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte. DATE 2000: 226-
1999
4EEÉrika F. Cota, Luigi Carro, Marcelo Lubaszewski: A Method to Diagnose Faults in Linear Analog Circuits using an Adaptive Tester. DATE 1999: 184-188
3 Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois: Fault modeling of suspended thermal MEMS. ITC 1999: 319-328
1998
2EEMarcelo Lubaszewski, Érika F. Cota, Bernard Courtois: Microsystems Testing: an Approach and Open Problems. DATE 1998: 524-
1997
1 Érika F. Cota, José Di Elias Domênico, Marcelo Lubaszewski: A CAT Tool for Frequency-domain Testing and Diagnosis on Analog. J. Braz. Comp. Soc. 4(2): (1997)

Coauthor Index

1Pedro Almeida [24]
2Alexandre M. Amory [13] [24]
3Antonio Andrade Jr. [14]
4Florence Azaïs [5] [6]
5Yves Bertrand [5] [6]
6Luigi Carro [4] [5] [6] [7] [8] [9] [10] [11] [12] [17] [19] [21] [22] [23]
7Maico Cassel [22] [24]
8Benoît Charlot [3]
9Bernard Courtois [2] [3]
10Julien Dalmasso [25]
11José Di Elias Domênico [1]
12Marie-Lise Flottes [25]
13Arthur Pereira Frantz [19] [21] [22]
14Felipe Ghellar [26]
15Marcos Herve [24]
16Vikram Iyengar [16]
17Fernanda Gusmão de Lima Kastensmidt (Fernanda Gusmão de Lima, Fernanda Lima Kastensmidt) [19] [21] [22] [24]
18Márcio Eduardo Kreutz [9]
19Luís C. Lamb (Luís da Cunha Lamb) [23]
20Fernanda Lima [7]
21Chunsheng Liu [15] [16] [18]
22Marcelo Lubaszewski [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [17] [20] [24] [26]
23Paulo Meirelles [24]
24Salvador Mir [3]
25Fernando Gehm Moraes (Fernando Moraes) [13]
26Marcelo de Souza Moraes [17]
27Carlos Roberto Moratelli [20] [26]
28Alex Orailoglu [8] [11]
29Dhiraj K. Pradhan [15]
30Ricardo Miotto Redin [23]
31Ricardo Augusto da Luz Reis (Ricardo A. L. Reis, Ricardo Reis) [7]
32Michel Renovell [5] [6]
33Sana Rezgui [7]
34Bruno Rouzeyre [25]
35Hamid Sharif [15]
36Jiangfan Shi [16]
37Emilena Specht [23]
38Altamiro Amadeu Susin [9]
39Raoul Velazco [7]
40Flávio Rech Wagner [10] [17] [23]
41Cesar Albenes Zeferino [9]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)