| 2007 |
|---|
| 16 | EE | Shiyi Xu:
An Accurate Model of Software Reliability.
PRDC 2007: 77-84 |
| 2006 |
|---|
| 15 | EE | Shiyi Xu:
A New Approach to Improving the Test Effectiveness in Software Testing Using Fault Collapsing.
PRDC 2006: 73-80 |
| 2005 |
|---|
| 14 | EE | Shiyi Xu:
Pseudo-Parity Testing with Testable Design.
Asian Test Symposium 2005: 354-359 |
| 13 | EE | Shiyi Xu:
High-Order Syndrome Testing for VLSI Circuits.
PRDC 2005: 101-108 |
| 2004 |
|---|
| 12 | EE | Shiyi Xu:
A Systematic Way of Functional Testing for VLSI Chips.
Asian Test Symposium 2004: 170-175 |
| 11 | | Debesh K. Das,
Hideo Fujiwara,
Yungang Li,
Yinghua Min,
Shiyi Xu,
Yervant Zorian:
Design & Test Education in Asia.
IEEE Design & Test of Computers 21(4): 331-338 (2004) |
| 2003 |
|---|
| 10 | EE | Shiyi Xu:
Build-In-Self-Test for Software.
Asian Test Symposium 2003: 220-223 |
| 2002 |
|---|
| 9 | EE | Shiyi Xu,
Jianwen Chen:
Maximum Distance Testing.
Asian Test Symposium 2002: 15- |
| 2001 |
|---|
| 8 | EE | Shiyi Xu:
Non-exhaustive Parity Testing.
Asian Test Symposium 2001: 468 |
| 2000 |
|---|
| 7 | EE | Shiyi Xu,
Wei Cen:
Forecasting the efficiency of test generation algorithms for digital circuits.
Asian Test Symposium 2000: 179- |
| 6 | EE | Shiyi Xu,
Tukwasibwe Justaf Frank:
Forecasting the Efficiency of Test Generation Algorithms for Combinational Circuits.
J. Comput. Sci. Technol. 15(4): 326-337 (2000) |
| 1999 |
|---|
| 5 | EE | Shiyi Xu,
Tukwasibwe Justaf Frank:
An Evaluation of Test Generation Algorithms for combinational Circuits.
Asian Test Symposium 1999: 63-69 |
| 1998 |
|---|
| 4 | EE | Shiyi Xu,
Jianhua Gao:
An Efficient Random-like Testing.
Asian Test Symposium 1998: 504- |
| 1997 |
|---|
| 3 | EE | Shiyi Xu,
Peter Waignjo,
Percy G. Dias,
Bole Shi:
Testability Prediction for Sequential Circuits Using Neural Network.
Asian Test Symposium 1997: 48- |
| 1995 |
|---|
| 2 | EE | Shiyi Xu,
Gercy P. Dias:
Testability forecasting for sequential circuits.
Asian Test Symposium 1995: 199-205 |
| 1985 |
|---|
| 1 | | Shiyi Xu,
Stephen Y. H. Su:
Detecting I/O and Internal Feedback Bridging Faults.
IEEE Trans. Computers 34(6): 553-557 (1985) |
