Florence Azaïs

2008
50	EE	Norbert Dumas, Florence Azaïs, Frédérick Mailly, Andrew Richardson, Pascal Nouet: A novel method for test and calibration of capacitive accelerometers with a fully electrical setup. DDECS 2008: 304-309
2007
49	EE	Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. European Test Symposium 2007: 211-216
2006
48	EE	Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. European Test Symposium 2006: 159-164
47	EE	Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Design & Test of Computers 23(3): 234-243 (2006)
46	EE	Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet: Electro-thermal Stimuli for MEMS Testing in FSBM Technology. J. Electronic Testing 22(2): 189-198 (2006)
45	EE	Christophe Entringer, Philippe Flatresse, Philippe Galy, Florence Azaïs, Pascal Nouet: Electro-thermal short pulsed simulation for SOI technology. Microelectronics Reliability 46(9-11): 1482-1485 (2006)
2005
44	EE	Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet: On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor. VTS 2005: 213-218
43	EE	Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell: Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. VTS 2005: 389-394
42	EE	Jean Marc Gallière, Michel Renovell, Florence Azaïs, Yves Bertrand: Delay Testing Viability of Gate Oxide Short Defects. J. Comput. Sci. Technol. 20(2): 195-200 (2005)
41	EE	Florence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell: A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters. J. Electronic Testing 21(1): 9-16 (2005)
40	EE	Tiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell: Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. J. Electronic Testing 21(2): 135-146 (2005)
39	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. J. Electronic Testing 21(3): 291-298 (2005)
38	EE	Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell: Built-in self-test of global interconnects of field programmable analog arrays. Microelectronics Journal 36(12): 1112-1123 (2005)
37	EE	Florence Azaïs, B. Caillard, S. Dournelle, P. Salomé, Pascal Nouet: A new multi-finger SCR-based structure for efficient on-chip ESD protection. Microelectronics Reliability 45(2): 233-243 (2005)
2004
36	EE	Antonio Zenteno, Víctor H. Champac, Michel Renovell, Florence Azaïs: Analysis and Attenuation Proposal in Ground Bounce. Asian Test Symposium 2004: 460-463
35	EE	Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski: Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC 2004: 893-902
34	EE	Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell: An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. VTS 2004: 383-388
33	EE	Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell: Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. J. Electronic Testing 20(3): 257-267 (2004)
32	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. J. Electronic Testing 20(4): 375-387 (2004)
2003
31	EE	Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand: Delay Testing of MOS Transistor with Gate Oxide Short. Asian Test Symposium 2003: 168-173
30	EE	Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell: A New Methodology For ADC Test Flow Optimization. ITC 2003: 201-209
29	EE	Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei: An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Design & Test of Computers 20(1): 60-67 (2003)
28	EE	Uros Kac, Franc Novak, Florence Azaïs, Pascal Nouet, Michel Renovell: Extending IEEE Std. 1149.4 Analog Boundary Modules to Enhance Mixed-Signal Test. IEEE Design & Test of Computers 20(2): 32-39 (2003)
27	EE	Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand: Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short. J. Electronic Testing 19(4): 377-386 (2003)
26	EE	Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell: On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. J. Electronic Testing 19(4): 469-479 (2003)
25	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: A-to-D converters static error detection from dynamic parameter measurement. Microelectronics Journal 34(10): 945-953 (2003)
2002
24	EE	Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, Regis Lorival: European Network for Test Education. DELTA 2002: 230-234
23	EE	Michel Renovell, Florence Azaïs, Yves Bertrand: Improving Defect Detection in Static-Voltage Testing. IEEE Design & Test of Computers 19(6): 83-89 (2002)
2001
22	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: Implementation of a linear histogram BIST for ADCs. DATE 2001: 590-595
21	EE	Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell: Analog BIST Generator for ADC Testing. DFT 2001: 338-346
20		Michel Renovell, Jean Marc Gallière, Florence Azaïs, Serge Bernard, Yves Bertrand: Boolean and current detection of MOS transistor with gate oxide short. ITC 2001: 1039-1048
19		Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: On-chip Generator of a Saw-Tooth Test Stimulus for ADC BIST. VLSI-SOC 2001: 425-436
18	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Xavier Michel, Michel Renovell: A Low-Cost Adaptive Ramp Generator for Analog BIST Applications. VTS 2001: 266-271
17	EE	André Ivanov, Sumbal Rafiq, Michel Renovell, Florence Azaïs, Yves Bertrand: On the detectability of CMOS floating gate transistor faults. IEEE Trans. on CAD of Integrated Circuits and Systems 20(1): 116-128 (2001)
16	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs. J. Electronic Testing 17(2): 139-147 (2001)
15	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST. J. Electronic Testing 17(3-4): 255-266 (2001)
2000
14	EE	Luigi Carro, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs, Michel Renovell: TI-BIST: a temperature independent analog BIST for switched-capacitor filters. Asian Test Symposium 2000: 78-83
13	EE	Érika F. Cota, Michel Renovell, Florence Azaïs, Yves Bertrand, Luigi Carro, Marcelo Lubaszewski: Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte. DATE 2000: 226-
12	EE	Michel Renovell, Florence Azaïs, Serge Bernard, Yves Bertrand: Hardware Resource Minimization for Histogram-Based ADC BIST. VTS 2000: 247-254
11	EE	Michel Renovell, Florence Azaïs, J-C. Bodin, Yves Bertrand: Combining Functional and Structural Approaches for Switched-Current Circuit Testing. J. Electronic Testing 16(3): 259-267 (2000)
1999
10		Michel Renovell, André Ivanov, Yves Bertrand, Florence Azaïs, Sumbal Rafiq: Optimal conditions for Boolean and current detection of floating gate faults. ITC 1999: 477-486
9	EE	Yves Bertrand, Florence Azaïs, Marie-Lise Flottes, Regis Lorival: A Successful Distance-Learning Experience for IC Test Education. MSE 1999: 20-21
8	EE	Michel Renovell, Florence Azaïs, Yves Bertrand: Detection of Defects Using Fault Model Oriented Test Sequences. J. Electronic Testing 14(1-2): 13-22 (1999)
1998
7	EE	Michel Renovell, Florence Azaïs, J-C. Bodin, Yves Bertrand: BISTing Switched-Current Circuits. Asian Test Symposium 1998: 372-377
6	EE	Florence Azaïs, André Ivanov, Michel Renovell, Yves Bertrand: A Methodology and Design for Effective Testing of Voltage-Controlled Oscillators (VCOs. Asian Test Symposium 1998: 383-387
5	EE	Michel Renovell, Florence Azaïs, Yves Bertrand: Optimized Implementations of the Multi-Configuration DFT Technique for Analog Circuits. DATE 1998: 815-821
4	EE	Florence Azaïs, Michel Renovell, Yves Bertrand, J-C. Bodin: Design-For-Testability for Switched-Current Circuits. VTS 1998: 370-375
1997
3	EE	Michel Renovell, Florence Azaïs, Yves Bertrand: On-chip analog output response compaction. ED&TC 1997: 568-572
1996
2	EE	Michel Renovell, Florence Azaïs, Yves Bertrand: The multi-configuration: A DFT technique for analog circuits. VTS 1996: 54-59
1995
1	EE	Michel Renovell, Florence Azaïs, Yves Bertrand: A design-for-test technique for multistage analog circuits. Asian Test Symposium 1995: 113-119

Coauthor Index

1	Antonio Q. Andrade	[40]
2	Antonio Andrade Jr.	[34] [35] [38] [43]
3	Tiago R. Balen	[34] [35] [38] [40] [43]
4	Serge Bernard	[12] [15] [16] [18] [19] [20] [21] [22] [24] [25] [26] [30] [32] [33] [39] [47] [48] [49]
5	Yves Bertrand	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [29] [30] [31] [32] [33] [39] [42]
6	J-C. Bodin	[4] [7] [11]
7	B. Caillard	[37]
8	Luigi Carro	[13] [14]
9	Philippe Cauvet	[47] [48] [49]
10	Víctor H. Champac (Víctor H. Champac Vilela)	[36]
11	Mariane Comte	[25] [30] [32] [33] [39] [47] [48] [49]
12	Érika F. Cota	[13] [14]
13	S. Dournelle	[37]
14	Norbert Dumas	[44] [46] [50]
15	Christophe Entringer	[45]
16	Philippe Flatresse	[45]
17	Marie-Lise Flottes	[9] [24]
18	Jean Marc Gallière	[20] [27] [31] [42]
19	Philippe Galy	[45]
20	André Ivanov	[6] [10] [17] [29]
21	Uros Kac	[28]
22	Vincent Kerzerho	[47] [48] [49]
23	Laurent Latorre	[24] [44] [46]
24	Regis Lorival	[9] [24]
25	Marcelo Lubaszewski	[13] [14] [34] [35] [38] [40] [41] [43]
26	Frédérick Mailly	[50]
27	Xavier Michel	[18]
28	Pascal Nouet	[28] [37] [41] [44] [45] [46] [50]
29	Franc Novak	[28]
30	Gustavo Pereira	[43]
31	Sumbal Rafiq	[10] [17]
32	Michel Renovell	[1] [2] [3] [4] [5] [6] [7] [8] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [38] [39] [40] [41] [42] [43] [47] [48] [49]
33	Andrew Richardson	[50]
34	P. Salomé	[37]
35	Sassan Tabatabaei	[29]
36	Gustavo Vieira	[38]
37	Antonio Zenteno	[36]