Hiroyuki Yotsuyanagi

2009
29	EE	Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume: A Novel Approach for Improving the Quality of Open Fault Diagnosis. VLSI Design 2009: 85-90
28	EE	Hiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu: Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. VLSI Design 2009: 91-96
2007
27	EE	Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume: Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. DFT 2007: 243-251
2006
26	EE	Masaki Hashizume, Tomomi Nishida, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura: Current Testable Design of Resistor String DACs. DELTA 2006: 197-200
2005
25	EE	Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada: Electric field for detecting open leads in CMOS logic circuits by supply current testing. ISCAS (3) 2005: 2995-2998
24	EE	Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita: Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees. J. Electronic Testing 21(6): 613-620 (2005)
2004
23	EE	Masaki Hashizume, Daisuke Yoneda, Hiroyuki Yotsuyanagi, Tetsuo Tada, Takeshi Koyama, Ikuro Morita, Takeomi Tamesada: I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment. Asian Test Symposium 2004: 112-117
22	EE	Masaki Hashizume, Tetsuo Akita, Hiroyuki Yotsuyanagi, Takeomi Tamesada: CMOS Open Fault Detection by Appearance Time of Switching Supply Current. DELTA 2004: 183-188
21	EE	Isao Tsukimoto, Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada: Practical Fault Coverage of Supply Current Tests for Bipolar ICs. DELTA 2004: 189-194
20	EE	Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita: On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure. DELTA 2004: 269-274
19	EE	Daisuke Ezaki, Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada: A Power Supply Circuit Recycling Charge in Adiabatic Dynamic CMOS Logic Circuits. DELTA 2004: 306-311
18	EE	Masahiro Ichimiya, Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada: A test circuit for pin shorts generating oscillation in CMOS logic circuits. Systems and Computers in Japan 35(13): 10-20 (2004)
2003
17	EE	Masaki Hashizume, Teppei Takeda, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura, Kozo Kinoshita: A BIST Circuit for IDDQ Tests. Asian Test Symposium 2003: 390-395
16	EE	Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita: Reducing Scan Shifts Using Folding Scan Trees. Asian Test Symposium 2003: 6-11
2002
15	EE	Hiroyuki Yotsuyanagi, Masaki Hashizume, Takeomi Tamesada: Test Time Reduction for I DDQ Testing by Arranging Test Vectors. Asian Test Symposium 2002: 423-428
14	EE	Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada: Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field. DELTA 2002: 387-391
13	EE	Masaki Hashizume, Masashi Sato, Hiroyuki Yotsuyanagi, Takeomi Tamesada: Power Supply Circuit for High Speed Operation of Adiabatic Dynamic CMOS Logic Circuits. DELTA 2002: 459-461
2001
12	EE	Teppei Takeda, Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Yukiya Miura, Kozo Kinoshita: IDDQ Sensing Technique for High Speed IDDQ Testing. Asian Test Symposium 2001: 111-116
11	EE	Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada: CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application. Asian Test Symposium 2001: 117-122
10	EE	Hiroyuki Yotsuyanagi, Shinsuke Hata, Masaki Hashizume, Takeomi Tamesada: Sequential Redundancy Removal Using Test Generation and Multiple Unreachable States. Asian Test Symposium 2001: 23-
9	EE	Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada: CMOS open defect detection by supply current test. DATE 2001: 509
8	EE	Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada: Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field. DFT 2001: 287-
2000
7	EE	Masaki Hashizume, Hiroyuki Yotsuyanagi, Masahiro Ichimiya, Takeomi Tamesada, Masashi Takeda: High speed IDDQ test and its testability for process variation. Asian Test Symposium 2000: 344-349
6	EE	Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Masashi Takeda: Testability Analysis of IDDQ Testing with Large Threshold Value. DFT 2000: 367-375
1999
5	EE	Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada: Identification of Feedback Bridging Faults with Oscillation. Asian Test Symposium 1999: 25-
1998
4	EE	Hiroyuki Yotsuyanagi, Kozo Kinoshita: Undetectable Fault Removal of Sequential Circuits Based on Unreachable States. VTS 1998: 176-183
1997
3	EE	Hiroyuki Yotsuyanagi, Seiji Kajihara, Kozo Kinoshita: Synthesis of Sequential Circuits by Redundancy Removal and Retiming. J. Electronic Testing 11(1): 81-92 (1997)
1995
2		Hiroyuki Yotsuyanagi, Seiji Kajihara, Kozo Kinoshita: Synthesis for Testability by Sequential Redundancy Removal Using Retiming. FTCS 1995: 33-40
1	EE	Hiroyuki Yotsuyanagi, Seiji Kajihara, Kozo Kinoshita: Resynthesis for sequential circuits designed with a specified initial state. VTS 1995: 152-157

Coauthor Index

1	Takashi Aikyo	[27] [28] [29]
2	Tetsuo Akita	[22]
3	Daisuke Ezaki	[19]
4	Masaki Hashizume	[5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29]
5	Shinsuke Hata	[10]
6	Yoshinobu Higami	[27] [28] [29]
7	Masahiro Ichimiya	[7] [8] [9] [11] [12] [14] [18] [25]
8	Taisuke Iwakiri	[8] [14]
9	Seiji Kajihara	[1] [2] [3]
10	Toru Kikkawa	[27]
11	Kozo Kinoshita	[1] [2] [3] [4] [12] [16] [17] [20] [24]
12	Takeshi Koyama	[23]
13	Toshimasa Kuchii	[16] [20] [24]
14	Yukiya Miura	[12] [17] [26]
15	Ikuro Morita	[23]
16	Tomomi Nishida	[26]
17	Shigeki Nishikawa	[16] [20] [24]
18	Masashi Sato	[13]
19	Tetsuo Tada	[23]
20	Hiroshi Takahashi	[27] [28] [29]
21	Yuzo Takamatsu	[27] [28] [29]
22	Masashi Takeda	[6] [7]
23	Teppei Takeda	[12] [17]
24	Takeomi Tamesada	[5] [6] [7] [8] [9] [10] [11] [13] [14] [15] [17] [18] [19] [21] [22] [23] [25] [26]
25	Isao Tsukimoto	[21]
26	Toshiyuki Tsutsumi	[28] [29]
27	Koji Yamazaki	[28] [29]
28	Daisuke Yoneda	[23]