| 2008 |
|---|
| 8 | EE | Jamiil Tourabaly,
Adam Osseiran:
A Jittered-Sampling Correction Technique for ADCs.
DELTA 2008: 249-252 |
| 2007 |
|---|
| 7 | | Ricardo Augusto da Luz Reis,
Adam Osseiran,
Hans-Jörg Pfleiderer:
VLSI-SoC: From Systems To Silicon, Proceedings of IFIP TC 10, WG 10.5, Thirteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2005), October 17-19, 2005, Perth, Australia
Springer 2007 |
| 2006 |
|---|
| 6 | EE | Muhsen Aljada,
Adam Osseiran,
Kamal Alameh:
Catastrophic and Parametric Fault Modelling for Photonic Systems.
DELTA 2006: 190-196 |
| 2005 |
|---|
| 5 | EE | Muhsen Aljada,
Kamal Alameh,
Adam Osseiran,
Khalid Al-Begain:
A Novel MicroPhotonic Structure for Optical Header Recognition.
VLSI-SoC 2005: 209-219 |
| 2004 |
|---|
| 4 | EE | Stephen K. Sunter,
Adam Osseiran,
Adam Cron,
Neil Jacobson,
Dave Bonnett,
Bill Eklow,
Carl Barnhart,
Ben Bennetts:
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6.
DATE 2004: 1184-1191 |
| 2002 |
|---|
| 3 | EE | Adam Osseiran,
William De Wilkins,
Barry Baril,
Sassan Tabatabaei,
Fidel Muradali,
Ken Posse,
Lee Song:
Analog and Mixed Signal BIST: Too Much, Too Little, Too Late?
VTS 2002: 175-176 |
| 2 | EE | Adam Osseiran:
Conference Reports.
IEEE Design & Test of Computers 19(3): 116- (2002) |
| 2000 |
|---|
| 1 | EE | Chin-Long Wey,
Adam Osseiran,
José Luis Huertas,
Yeon-Chen Nieu:
Mixed-Signal SoC Testing: Is Mixed-Signal Design-for-Test on Its Way.
Asian Test Symposium 2000: 15- |
