| 2002 |
|---|
| 4 | EE | Ashish Giani,
Shuo Sheng,
Michael S. Hsiao,
Vishwani D. Agrawal:
State and Fault Information for Compaction-Based Test Generation.
J. Electronic Testing 18(1): 63-72 (2002) |
| 2001 |
|---|
| 3 | EE | Ashish Giani,
Shuo Sheng,
Michael S. Hsiao,
Vishwani D. Agrawal:
Efficient spectral techniques for sequential ATPG.
DATE 2001: 204-208 |
| 2 | EE | Ashish Giani,
Shuo Sheng,
Michael S. Hsiao,
Vishwani D. Agrawal:
Novel Spectral Methods for Built-In Self-Test in a System-on-a-Chip Environment.
VTS 2001: 163-168 |
| 2000 |
|---|
| 1 | EE | Ashish Giani,
Shuo Sheng,
Michael S. Hsiao,
Vishwani D. Agrawal:
Compaction-based test generation using state and fault information.
Asian Test Symposium 2000: 159-164 |
