| |
| 2000 | ||
|---|---|---|
| 2 | EE | Ameet Bagwe, Rubin A. Parekhji: Functional testing and fault analysis based fault coverage enhancement techniques for embedded core based systems. Asian Test Symposium 2000: 260- |
| 1 | Jais Abraham, Narayan Prasad, Srinivasa Chakravarthy B. S., Ameet Bagwe, Rubin A. Parekhji: A framework to evaluate test tradeoffs in embedded core based systems-case study on TI's TMS320C27xx. ITC 2000: 417-425 | |
| 1 | Jais Abraham | [1] |
| 2 | Rubin A. Parekhji | [1] [2] |
| 3 | Narayan Prasad | [1] |
| 4 | Srinivasa Chakravarthy B. S. | [1] |