2007 |
10 | EE | Carlos Eduardo Savioli,
Claudio C. Czendrodi,
José Vicente Calvano,
Antonio Carneiro de Mesquita Filho:
Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits
CoRR abs/0710.4725: (2007) |
9 | EE | Tiago R. Balen,
José Vicente Calvano,
Marcelo Lubaszewski,
Michel Renovell:
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis.
J. Electronic Testing 23(6): 497-512 (2007) |
2006 |
8 | EE | Tiago R. Balen,
José Vicente Calvano,
Marcelo Lubaszewski,
Michel Renovell:
Functional Test of Field Programmable Analog Arrays.
VTS 2006: 326-333 |
2005 |
7 | EE | Carlos Eduardo Savioli,
Claudio C. Czendrodi,
José Vicente Calvano,
Antonio Carneiro de Mesquita Filho:
Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits.
DATE 2005: 174-175 |
2004 |
6 | EE | Carlos Eduardo Savioli,
Claudio C. Czendrodi,
José Vicente Calvano,
Antonio Carneiro de Mesquita Filho:
ATPG for fault diagnosis on analog electrical networks using evolutionary techniques.
SBCCI 2004: 100-104 |
2003 |
5 | EE | José Vicente Calvano,
Marcelo Lubaszewski:
Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors.
IWSOC 2003: 251-256 |
2002 |
4 | EE | José Vicente Calvano,
Vladimir Castro Alves,
Antônio C. Mesquita,
Marcelo Lubaszewski:
Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus.
VTS 2002: 201-206 |
2001 |
3 | EE | José Vicente Calvano,
Antonio Carneiro de Mesquita Filho,
Vladimir Castro Alves,
Marcelo Lubaszewski:
Fault Models and Test Generation for OpAmp Circuits - The FFM.
J. Electronic Testing 17(2): 121-138 (2001) |
2000 |
2 | EE | José Vicente Calvano,
Vladimir Castro Alves,
Marcelo Lubaszewski:
Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers.
Asian Test Symposium 2000: 96- |
1 | EE | José Vicente Calvano,
Vladimir Castro Alves,
Marcelo Lubaszewski:
Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations.
VTS 2000: 319-324 |