Chin-Te Kao
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2000
1
EE
Chin-Te Kao,
Sam Wu
,
Jwu E. Chen
: A case study of failure analysis and guardband determination for a 64M-bit DRAM.
Asian Test Symposium 2000
: 447-
Coauthor
Index
1
Jwu E. Chen
[
1
]
2
Sam Wu
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
