Jeh-Sheng Shih
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2000
1
EE
Shyue-Kung Lu
, Jeh-Sheng Shih,
Cheng-Wen Wu
: A Testable/Fault Tolerant FFT Processor Design.
Asian Test Symposium 2000
: 429-
Coauthor
Index
1
Shyue-Kung Lu
[
1
]
2
Cheng-Wen Wu
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)