| 2002 |
|---|
| 4 | EE | Matthew Worsman,
Mike W. T. Wong,
Y. S. Lee:
Enhancing The Static D. C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis.
DELTA 2002: 443-446 |
| 2000 |
|---|
| 3 | EE | Matthew Worsman,
Mike W. T. Wong,
Y. S. Lee:
Analog circuit equivalent faults in the D.C. domain.
Asian Test Symposium 2000: 84-89 |
| 2 | EE | Matthew Worsman,
Mike W. T. Wong,
Y. S. Lee:
A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality.
ISQED 2000: 361-368 |
| 1998 |
|---|
| 1 | EE | Mike W. T. Wong,
Matthew Worsman:
DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity.
Asian Test Symposium 1998: 366-371 |
