2002 | ||
---|---|---|
4 | EE | Matthew Worsman, Mike W. T. Wong, Y. S. Lee: Enhancing The Static D. C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis. DELTA 2002: 443-446 |
2000 | ||
3 | EE | Matthew Worsman, Mike W. T. Wong, Y. S. Lee: Analog circuit equivalent faults in the D.C. domain. Asian Test Symposium 2000: 84-89 |
2 | EE | Matthew Worsman, Mike W. T. Wong, Y. S. Lee: A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality. ISQED 2000: 361-368 |
1998 | ||
1 | EE | Mike W. T. Wong, Matthew Worsman: DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity. Asian Test Symposium 1998: 366-371 |
1 | Y. S. Lee | [2] [3] [4] |
2 | Mike W. T. Wong | [1] [2] [3] [4] |