2007 | ||
---|---|---|
39 | EE | Kun Xie, Yinghua Min, Dafang Zhang, Jigang Wen, Gaogang Xie: A Scalable Bloom Filter for Membership Queries. GLOBECOM 2007: 543-547 |
38 | EE | Gaogang Xie, Guangxing Zhang, Jianhua Yang, Yinghua Min, Valérie Issarny, Alberto Conte: Survey on Traffic of Metro Area Network with Measurement On-Line. International Teletraffic Congress 2007: 666-677 |
2005 | ||
37 | EE | Yuan-sheng Luo, Dafang Zhang, Yinghua Min: An Improved Scheme of Index-Based Checkpointing. PRDC 2005: 167-174 |
36 | EE | Jie Wu, Feng Gao, Zhongcheng Li, Yinghua Min: Optimal, and reliable communication in hypercubes using extended safety vectors. IEEE Transactions on Reliability 54(3): 402-411 (2005) |
2004 | ||
35 | Debesh K. Das, Hideo Fujiwara, Yungang Li, Yinghua Min, Shiyi Xu, Yervant Zorian: Design & Test Education in Asia. IEEE Design & Test of Computers 21(4): 331-338 (2004) | |
2003 | ||
34 | EE | Yinghua Min, Jishun Kuang, Xiaoyan Niu: At-Speed Current Testing. Asian Test Symposium 2003: 396-399 |
33 | EE | Ruilian Zhao, Michael R. Lyu, Yinghua Min: Domain Testing Based on Character String Predicate. Asian Test Symposium 2003: 96-101 |
32 | EE | Ruilian Zhao, Michael R. Lyu, Yinghua Min: A New Software Testing Approach Based on Domain Analysis of Specifications and Programs. ISSRE 2003: 60-70 |
31 | EE | Jianhui Jiang, Yinghua Min, Chenglian Peng: Fault-Tolerant Systems with Concurrent Error-Locating Capability. J. Comput. Sci. Technol. 18(2): 190-200 (2003) |
30 | EE | Jishun Kuang, Zhiqiang Yang, Qijian Zhu, Yinghua Min: IDDT: Fundamentals and Test Generation. J. Comput. Sci. Technol. 18(3): 299-307 (2003) |
29 | EE | Zhigang Yin, Yinghua Min, Xiaowei Li, Huawei Li: A Novel RT-Level Behavioral Description Based ATPG Method. J. Comput. Sci. Technol. 18(3): 308-317 (2003) |
2002 | ||
28 | EE | Zuying Luo, Xiaowei Li, Huawei Li, Shiyuan Yang, Yinghua Min: Test Power Optimization Techniques for CMOS Circuits. Asian Test Symposium 2002: 332-337 |
27 | EE | Yinghua Min: Why RTL ATPG? J. Comput. Sci. Technol. 17(2): 113-117 (2002) |
2001 | ||
26 | EE | Huawei Li, Yinghua Min, Zhongcheng Li: An RT-Level ATPG Based on Clustering of Circuit States. Asian Test Symposium 2001: 213-218 |
25 | EE | Zhigang Yin, Yinghua Min, Xiaowei Li: An Approach to RTL Fault Extraction and Test Generation. Asian Test Symposium 2001: 219-224 |
24 | EE | Xiaowei Li, Huawei Li, Yinghua Min: Reducing Power Dissipation during At-Speed Test Application. DFT 2001: 116- |
23 | EE | Dafang Zhang, Gaogang Xie, Yinghua Min: Node Grouping in System-Level Fault Diagnosis. J. Comput. Sci. Technol. 16(5): 474-479 (2001) |
2000 | ||
22 | EE | Lijian Li, Xiaoyang Yu, Cheng-Wen Wu, Yinghua Min: A waveform simulator based on Boolean process. Asian Test Symposium 2000: 145-150 |
21 | EE | Lijian Li, Yinghua Min: An efficient BIST design using LFSR-ROM architecture. Asian Test Symposium 2000: 386- |
20 | EE | Jie Wu, Feng Gao, Zhongcheng Li, Yinghua Min: Optimal Fault-Tolerant Routing in Hypercubes Using Extended Safety Vectors. ICPADS 2000: 264-271 |
19 | EE | Huawei Li, Zhongcheng Li, Yinghua Min: Reduction of Number of Paths to be Tested in Delay Testing. J. Electronic Testing 16(5): 477-485 (2000) |
1999 | ||
18 | EE | Jianhui Jiang, Hongbao Shi, Yinghua Min, Xiaodong Zhao: A Novel NMR Structure with Concurrent Error Location Capabilities. PRDC 1999: 32-39 |
1998 | ||
17 | EE | Zhongcheng Li, Yinghua Min, Robert K. Brayton: A New Low-Cost Method for Identifying Untestable Path Delay Faults. Asian Test Symposium 1998: 76-81 |
16 | EE | Huawei Li, Zhongcheng Li, Yinghua Min: Delay Testing with Double Observations. Asian Test Symposium 1998: 96- |
15 | EE | Yinghua Min, Zhongcheng Li: IDDT Testing versus IDDQ Testing. J. Electronic Testing 13(1): 51-55 (1998) |
1997 | ||
14 | EE | Wangning Long, Shiyuan Yang, Zhongcheng Li, Yinghua Min: Memory Efficient ATPG for Path Delay Faults. Asian Test Symposium 1997: 326-331 |
13 | EE | Xiaoming Yu, Yinghua Min: Design of delay-verifiable combinational logic by adding extra inputs. Asian Test Symposium 1997: 332- |
12 | EE | Yinghua Min, Zhuxing Zhao, Zhongcheng Li: IDDT Testing. Asian Test Symposium 1997: 378-383 |
11 | Zhongcheng Li, Yuhong Zhao, Yinghua Min, Robert K. Brayton: Timed Binary Decision Diagrams. ICCD 1997: 352-357 | |
10 | Zhongcheng Li, Robert K. Brayton, Yinghua Min: Efficient Identification of Non-Robustly Untestable Path Delay Faults. ITC 1997: 992-997 | |
1996 | ||
9 | EE | Zhuxing Zhao, Zhongcheng Li, Yinghua Min: Waveform Polynomial Manipulation Using Bdds. Asian Test Symposium 1996: 136-141 |
8 | EE | Yinghua Min, Zhuxing Zhao, Zhongcheng Li: An Analytical Delay Model Based on Boolean Process. VLSI Design 1996: 162-165 |
7 | EE | Yingquan Zhou, Mike W. T. Wong, Yinghua Min: Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis. J. Electronic Testing 9(1-2): 153-163 (1996) |
1995 | ||
6 | EE | Vishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, P. Pal Chaudhuri: Panel: New Research Problems in the Emerging Test Technology. Asian Test Symposium 1995: 189- |
5 | EE | Yinghua Min, Zhuxing Zhao, Zhongcheng Li: Boolean process-an analytical approach to circuit representation (II). Asian Test Symposium 1995: 26-32 |
4 | Yingquan Zhou, Mike W. T. Wong, Yinghua Min: Feasibility and Effectiveness of the Algorithm for Overhead Reduction in Analog Checkers. FTCS 1995: 238-247 | |
1994 | ||
3 | Yinghua Min, Yutang Zhou, Zhongcheng Li, Cheng Ye, Yuqi Pan: Behavioral Design and Prototyping of a Fail-Safe System. VLSI Design 1994: 159-162 | |
1991 | ||
2 | Yinghua Min, Yashwant K. Malaiya, Boping Jin: Analysis of Detection Capability of Parallel Signature Analyzers. IEEE Trans. Computers 40(9): 1075-1081 (1991) | |
1986 | ||
1 | Yinghua Min, Zhongcheng Li: Pseudo-Exhaustive Testing Strategy for Large Combinational Circuits. Comput. Syst. Sci. Eng. 1(4): 213-220 (1986) |