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Krishnendu Chakrabarty

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2009
207EELara D. Oliver, Krishnendu Chakrabarty, Hisham Z. Massoud: Dual-threshold pass-transistor logic design. ACM Great Lakes Symposium on VLSI 2009: 291-296
206EEQiang Xu, Yubin Zhang, Krishnendu Chakrabarty: SOC test-architecture optimization for the testing of embedded cores and signal-integrity faults on core-external interconnects. ACM Trans. Design Autom. Electr. Syst. 14(1): (2009)
205EESandeep Kumar Goel, Erik Jan Marinissen, Anuja Sehgal, Krishnendu Chakrabarty: Testing of SoCs with Hierarchical Cores: Common Fallacies, Test Access Optimization, and Test Scheduling. IEEE Trans. Computers 58(3): 409-423 (2009)
204EESudarshan Bahukudumbi, Krishnendu Chakrabarty: Test-Length and TAM Optimization for Wafer-Level Reduced Pin-Count Testing of Core-Based SoCs. IEEE Trans. on CAD of Integrated Circuits and Systems 28(1): 111-120 (2009)
203EEZhanglei Wang, Hongxia Fang, Krishnendu Chakrabarty, Michael Bienek: Deviation-Based LFSR Reseeding for Test-Data Compression. IEEE Trans. on CAD of Integrated Circuits and Systems 28(2): 259-271 (2009)
2008
202EETao Xu, Krishnendu Chakrabarty: Broadcast electrode-addressing for pin-constrained multi-functional digital microfluidic biochips. DAC 2008: 173-178
201EESudarshan Bahukudumbi, Krishnendu Chakrabarty, Richard Kacprowicz: Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs. DATE 2008: 1103-1106
200EEAnders Larsson, Erik Larsson, Krishnendu Chakrabarty, Petru Eles, Zebo Peng: Test-Architecture Optimization and Test Scheduling for SOCs with Core-Level Expansion of Compressed Test Patterns. DATE 2008: 188-193
199EETao Xu, Krishnendu Chakrabarty, Vamsee K. Pamula: Design and optimization of a digital microfluidic biochip for protein crystallization. ICCAD 2008: 297-301
198EEXiaoxia Wu, Yibo Chen, Krishnendu Chakrabarty, Yuan Xie: Test-access mechanism optimization for core-based three-dimensional SOCs. ICCD 2008: 212-218
197EETao Xu, Krishnendu Chakrabarty: Automated design of digital microfluidic lab-on-chip under pin-count constraints. ISPD 2008: 190-198
196EESudarshan Bahukudumbi, Krishnendu Chakrabarty: Test-Pattern Ordering for Wafer-Level Test-During-Burn-In. VTS 2008: 193-198
195EEMahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor: Test-Pattern Grading and Pattern Selection for Small-Delay Defects. VTS 2008: 233-239
194EER. Iris Bahar, Krishnendu Chakrabarty: Introduction to joint ACM JETC/TODAES special issue on new, emerging, and specialized technologies. ACM Trans. Design Autom. Electr. Syst. 13(2): (2008)
193EEAnuja Sehgal, Sudarshan Bahukudumbi, Krishnendu Chakrabarty: Power-aware SoC test planning for effective utilization of port-scalable testers. ACM Trans. Design Autom. Electr. Syst. 13(3): (2008)
192EEZhanglei Wang, Krishnendu Chakrabarty: Test Data Compression Using Selective Encoding of Scan Slices. IEEE Trans. VLSI Syst. 16(11): 1429-1440 (2008)
191EEP. Y. Paik, Vamsee K. Pamula, Krishnendu Chakrabarty: Adaptive Cooling of Integrated Circuits Using Digital Microfluidics. IEEE Trans. VLSI Syst. 16(4): 432-443 (2008)
190EETao Xu, Krishnendu Chakrabarty: A Droplet-Manipulation Method for Achieving High-Throughput in Cross-Referencing-Based Digital Microfluidic Biochips. IEEE Trans. on CAD of Integrated Circuits and Systems 27(11): 1905-1917 (2008)
189EEZhanglei Wang, Krishnendu Chakrabarty: Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns. IEEE Trans. on CAD of Integrated Circuits and Systems 27(2): 352-365 (2008)
188EESoheil Samii, Mikko Selkälä, Erik Larsson, Krishnendu Chakrabarty, Zebo Peng: Cycle-Accurate Test Power Modeling and Its Application to SoC Test Architecture Design and Scheduling. IEEE Trans. on CAD of Integrated Circuits and Systems 27(5): 973-977 (2008)
187EENabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault: A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. J. Electronic Testing 24(4): 353-364 (2008)
186EEFei Su, Krishnendu Chakrabarty: High-level synthesis of digital microfluidic biochips. JETC 3(4): (2008)
185EER. Iris Bahar, Krishnendu Chakrabarty: Introduction to joint ACM JETC/TODAES special issue on new, emerging, and specialized technologies. JETC 4(2): (2008)
184EETao Xu, Krishnendu Chakrabarty: Integrated droplet routing and defect tolerance in the synthesis of digital microfluidic biochips. JETC 4(3): (2008)
183EEAlvin R. Lebeck, Krishnendu Chakrabarty: Introduction to DAC 2007 special section. JETC 4(3): (2008)
2007
182EESudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar: AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs. ASP-DAC 2007: 823-828
181EEQiang Xu, Yubin Zhang, Krishnendu Chakrabarty: SOC Test Architecture Optimization for Signal Integrity Faults on Core-External Interconnects. DAC 2007: 676-681
180EETao Xu, Krishnendu Chakrabarty: Integrated Droplet Routing in the Synthesis of Microfluidic Biochips. DAC 2007: 948-953
179EEZhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang: SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. DATE 2007: 201-206
178EETao Xu, Krishnendu Chakrabarty: A cross-referencing-based droplet manipulation method for high-throughput and pin-constrained digital microfluidic arrays. DATE 2007: 552-557
177 Krishnendu Chakrabarty: Design and Test of Microfluidic Biochips. DDECS 2007: 17
176EEZhanglei Wang, Krishnendu Chakrabarty, Michael Bienek: A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. European Test Symposium 2007: 125-130
175EETao Xu, Krishnendu Chakrabarty: Parallel Scan-Like Testing and Fault Diagnosis Techniques for Digital Microfluidic Biochips. European Test Symposium 2007: 63-68
174EETong Zhou, Romit Roy Choudhury, Peng Ning, Krishnendu Chakrabarty: Privacy-Preserving Detection of Sybil Attacks in Vehicular Ad Hoc Networks. MobiQuitous 2007: 1-8
173EEAmit Kumar, Krishnendu Chakrabarty, Chunduri Rama Mohan: An ECO Technique for Removing Crosstalk Violations in Clock Networks. VLSI Design 2007: 283-288
172EESudarshan Bahukudumbi, Krishnendu Chakrabarty: Test-Length Selection and TAM Optimization for Wafer-Level, Reduced Pin-Count Testing of Core-Based Digital SoCs. VLSI Design 2007: 459-464
171EETao Xu, Krishnendu Chakrabarty, Fei Su: Defect-Aware Synthesis of Droplet-Based Microfluidic Biochips. VLSI Design 2007: 647-652
170EELei Li, Zhanglei Wang, Krishnendu Chakrabarty: Scan-BIST based on cluster analysis and the encoding of repeating sequences. ACM Trans. Design Autom. Electr. Syst. 12(1): (2007)
169EEFei Su, Krishnendu Chakrabarty, Vamsee K. Pamula: Yield Enhancement of Digital Microfluidics-Based Biochips Using Space Redundancy and Local Reconfiguration CoRR abs/0710.4672: (2007)
168EEFei Su, Krishnendu Chakrabarty: Design of Fault-Tolerant and Dynamically-Reconfigurable Microfluidic Biochips CoRR abs/0710.4673: (2007)
167EEAnuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty: Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores CoRR abs/0710.4686: (2007)
166EEPaul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu Chakrabarty: Rapid Generation of Thermal-Safe Test Schedules CoRR abs/0710.4797: (2007)
165EEKrishnendu Chakrabarty, Roland Thewes: Guest Editors' Introduction: Biochips and Integrated Biosensor Platforms. IEEE Design & Test of Computers 24(1): 8-9 (2007)
164EEAnuja Sehgal, Krishnendu Chakrabarty: Optimization of Dual-Speed TAM Architectures for Efficient Modular Testing of SOCs. IEEE Trans. Computers 56(1): 120-133 (2007)
163EEYi Zou, Krishnendu Chakrabarty: Distributed Mobility Management for Target Tracking in Mobile Sensor Networks. IEEE Trans. Mob. Comput. 6(8): 872-887 (2007)
162EESudarshan Bahukudumbi, Krishnendu Chakrabarty: Wafer-Level Modular Testing of Core-Based SoCs. IEEE Trans. VLSI Syst. 15(10): 1144-1154 (2007)
161EEQiang Xu, Nicola Nicolici, Krishnendu Chakrabarty: Test Wrapper Design and Optimization Under Power Constraints for Embedded Cores With Multiple Clock Domains. IEEE Trans. on CAD of Integrated Circuits and Systems 26(8): 1539-1547 (2007)
160EEYi Zou, Krishnendu Chakrabarty: Redundancy Analysis and a Distributed Self-Organization Protocol for Fault-Tolerant Wireless Sensor Networks. IJDSN 3(3): 243-272 (2007)
159EEZhanglei Wang, Krishnendu Chakrabarty: Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics. J. Electronic Testing 23(2-3): 145-161 (2007)
158EEFei Su, William L. Hwang, Arindam Mukherjee, Krishnendu Chakrabarty: Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips. J. Electronic Testing 23(2-3): 219-233 (2007)
157EETao Xu, William L. Hwang, Fei Su, Krishnendu Chakrabarty: Automated design of pin-constrained digital microfluidic biochips under droplet-interference constraints. JETC 3(3): (2007)
156EEKrishnendu Chakrabarty, Sachin S. Sapatnekar: Editorial to special issue DAC 2006. JETC 3(3): (2007)
2006
155EELara D. Oliver, Krishnendu Chakrabarty, Hisham Z. Massoud: An evaluation of the impact of gate oxide tunneling on dual-Vt-based leakage reduction techniques. ACM Great Lakes Symposium on VLSI 2006: 105-110
154EETao Xu, Krishnendu Chakrabarty: Droplet-trace-based array partitioning and a pin assignment algorithm for the automated design of digital microfluidic biochips. CODES+ISSS 2006: 112-117
153EEWilliam L. Hwang, Fei Su, Krishnendu Chakrabarty: Automated design of pin-constrained digital microfluidic arrays for lab-on-a-chip applications*. DAC 2006: 925-930
152EEZhanglei Wang, Krishnendu Chakrabarty, Michael Gössel: Test set enrichment using a probabilistic fault model and the theory of output deviations. DATE 2006: 1270-1275
151EEAnuja Sehgal, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty: Hierarchy-aware and area-efficient test infrastructure design for core-based system chips. DATE 2006: 285-290
150EEFei Su, William L. Hwang, Krishnendu Chakrabarty: Droplet routing in the synthesis of digital microfluidic biochips. DATE 2006: 323-328
149EEKrishnendu Chakrabarty: Reconfiguration-Based Defect Tolerance for Microfluidic Biochips. DFT 2006
148EEKrishnendu Chakrabarty: Automated Design of Microfluidics-Based Biochips: Connecting Biochemistry to Electronics CAD. ICCD 2006
147EEFei Su, Sule Ozev, Krishnendu Chakrabarty: Concurrent testing of digital microfluidics-based biochips. ACM Trans. Design Autom. Electr. Syst. 11(2): 442-464 (2006)
146EEFei Su, Krishnendu Chakrabarty: Module placement for fault-tolerant microfluidics-based biochips. ACM Trans. Design Autom. Electr. Syst. 11(3): 682-710 (2006)
145EEAnuja Sehgal, Sule Ozev, Krishnendu Chakrabarty: Test infrastructure design for mixed-signal SOCs with wrapped analog cores. IEEE Trans. VLSI Syst. 14(3): 292-304 (2006)
144EEYing Zhang, Krishnendu Chakrabarty: A unified approach for fault tolerance and dynamic power management in fixed-priority real-time embedded systems. IEEE Trans. on CAD of Integrated Circuits and Systems 25(1): 111-125 (2006)
143EEPaul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu Chakrabarty: Thermal-Safe Test Scheduling for Core-Based System-on-Chip Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2502-2512 (2006)
142EEFei Su, Krishnendu Chakrabarty: Defect Tolerance Based on Graceful Degradation and Dynamic Reconfiguration for Digital Microfluidics-Based Biochips. IEEE Trans. on CAD of Integrated Circuits and Systems 25(12): 2944-2953 (2006)
141EEFei Su, Krishnendu Chakrabarty, Richard B. Fair: Microfluidics-Based Biochips: Technology Issues, Implementation Platforms, and Design-Automation Challenges. IEEE Trans. on CAD of Integrated Circuits and Systems 25(2): 211-223 (2006)
140EEFei Su, Sule Ozev, Krishnendu Chakrabarty: Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems. J. Electronic Testing 22(2): 199-210 (2006)
139EEFei Su, Krishnendu Chakrabarty: Yield enhancement of reconfigurable microfluidics-based biochips using interstitial redundancy. JETC 2(2): 104-128 (2006)
2005
138EEYasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty: Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. ASP-DAC 2005: 59-64
137EEKrishnendu Chakrabarty, Fei Su: System-level design automation tools for digital microfluidic biochips. CODES+ISSS 2005: 201-206
136EEQiang Xu, Nicola Nicolici, Krishnendu Chakrabarty: Multi-frequency wrapper design and optimization for embedded cores under average power constraints. DAC 2005: 123-128
135EEFei Su, Krishnendu Chakrabarty: Unified high-level synthesis and module placement for defect-tolerant microfluidic biochips. DAC 2005: 825-830
134EELei Li, Krishnendu Chakrabarty: Hybrid BIST Based on Repeating Sequences and Cluster Analysis. DATE 2005: 1142-1147
133EEFei Su, Krishnendu Chakrabarty, Vamsee K. Pamula: Yield Enhancement of Digital Microfluidics-Based Biochips Using Space Redundancy and Local Reconfiguration. DATE 2005: 1196-1201
132EEFei Su, Krishnendu Chakrabarty: Design of Fault-Tolerant and Dynamically-Reconfigurable Microfluidic Biochips. DATE 2005: 1202-1207
131EEAnuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty: Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores. DATE 2005: 50-55
130EEPaul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu Chakrabarty: Rapid Generation of Thermal-Safe Test Schedules. DATE 2005: 840-845
129EEYi Zou, Krishnendu Chakrabarty: Fault-Tolerant Self-organization in Sensor Networks. DCOSS 2005: 191-205
128EEEnkelejda Tafaj, Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu Chakrabarty: Improving Thermal-Safe Test Scheduling for Core-Based Systems-on-Chip Using Shift Frequency Scaling. DFT 2005: 544-551
127 Anuja Sehgal, Krishnendu Chakrabarty: Test planning for the effective utilization of port-scalable testers for heterogeneous core-based SOCs. ICCAD 2005: 88-93
126 Krishnendu Chakrabarty, J. E. Chen: A cocktail approach on random access scan toward low power and high efficiency test. ICCAD 2005: 94-99
125EEAnuja Sehgal, Sule Ozev, Krishnendu Chakrabarty: A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs. ICCD 2005: 137-142
124EEKrishnendu Chakrabarty: Design, Testing, and Applications of Digital Microfluidics-Based Biochips. VLSI Design 2005: 221-226
123EELei Li, Krishnendu Chakrabarty, Seiji Kajihara, Shivakumar Swaminathan: Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores. VLSI Design 2005: 53-58
122EEFei Su, Krishnendu Chakrabarty: Defect Tolerance for Gracefully-Degradable Microfluidics-Based Biochips. VTS 2005: 321-326
121EEVishnu Swaminathan, Krishnendu Chakrabarty: Pruning-based, energy-optimal, deterministic I/O device scheduling for hard real-time systems. ACM Trans. Embedded Comput. Syst. 4(1): 141-167 (2005)
120EEHarshavardhan Sabbineni, Krishnendu Chakrabarty: Location-Aided Flooding: An Energy-Efficient Data Dissemination Protocol for Wireless Sensor Networks. IEEE Trans. Computers 54(1): 36-46 (2005)
119EEYi Zou, Krishnendu Chakrabarty: A Distributed Coverage- and Connectivity-Centric Technique for Selecting Active Nodes in Wireless Sensor Networks. IEEE Trans. Computers 54(8): 978-991 (2005)
118EEMohammad Tehranipoor, Mehrdad Nourani, Krishnendu Chakrabarty: Nine-coded compression technique for testing embedded cores in SoCs. IEEE Trans. VLSI Syst. 13(6): 719-731 (2005)
117EEChunsheng Liu, Krishnendu Chakrabarty: Design and analysis of compact dictionaries for diagnosis in scan-BIST. IEEE Trans. VLSI Syst. 13(8): 979-984 (2005)
116EEKrishnendu Chakrabarty, Vikram Iyengar, Mark D. Krasniewski: Test planning for modular testing of hierarchical SOCs. IEEE Trans. on CAD of Integrated Circuits and Systems 24(3): 435-448 (2005)
115EEKrishnendu Chakrabarty, Jun Zeng: Design automation for microfluidics-based biochips. JETC 1(3): 186-223 (2005)
2004
114EEYing Zhang, Robert P. Dick, Krishnendu Chakrabarty: Energy-aware deterministic fault tolerance in distributed real-time embedded systems. DAC 2004: 550-555
113EEYing Zhang, Krishnendu Chakrabarty: Task Feasibility Analysis and Dynamic Voltage Scaling in Fault-Tolerant Real-Time Embedded Systems. DATE 2004: 1170-1175
112EEMohammad H. Tehranipour, Mehrdad Nourani, Krishnendu Chakrabarty: Nine-Coded Compression Technique with Application to Reduced Pin-Count Testing and Flexible On-Chip Decompression. DATE 2004: 1284-1289
111EEAnuja Sehgal, Krishnendu Chakrabarty: Efficient Modular Testing of SOCs Using Dual-Speed TAM Architectures. DATE 2004: 422-427
110EEFei Su, Krishnendu Chakrabarty: Architectural-level synthesis of digital microfluidics-based biochips. ICCAD 2004: 223-228
109EEChunsheng Liu, Kumar N. Dwarakanath, Krishnendu Chakrabarty, Ronald D. Blanton: Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST. ISVLSI 2004: 173-178
108EEAnuja Sehgal, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty: IEEE P1500-Compliant Test Wrapper Design for Hierarchical Cores. ITC 2004: 1203-1212
107EEFei Su, Krishnendu Chakrabarty: Concurrent Testing of Droplet-Based Microfluidic Systems for Multiplexed Biomedical Assays. ITC 2004: 883-892
106EEYi Zou, Krishnendu Chakrabarty: Sensor deployment and target localization in distributed sensor networks. ACM Trans. Embedded Comput. Syst. 3(1): 61-91 (2004)
105EEYing Zhang, Krishnendu Chakrabarty: Dynamic adaptation for fault tolerance and power management in embedded real-time systems. ACM Trans. Embedded Comput. Syst. 3(2): 336-360 (2004)
104EEChunsheng Liu, Krishnendu Chakrabarty: Compact Dictionaries for Fault Diagnosis in Scan-BIST. IEEE Trans. Computers 53(6): 775-780 (2004)
103EEQishi Wu, Nageswara S. V. Rao, Jacob Barhen, S. Sitharama Iyengar, Vijay K. Vaishnavi, Hairong Qi, Krishnendu Chakrabarty: On Computing Mobile Agent Routes for Data Fusion in Distributed Sensor Networks. IEEE Trans. Knowl. Data Eng. 16(6): 740-753 (2004)
102EEAnuja Sehgal, Vikram Iyengar, Krishnendu Chakrabarty: SOC test planning using virtual test access architectures. IEEE Trans. VLSI Syst. 12(12): 1263-1276 (2004)
101EEVishnu Swaminathan, Krishnendu Chakrabarty: Network flow techniques for dynamic voltage scaling in hard real-time systems. IEEE Trans. on CAD of Integrated Circuits and Systems 23(10): 1385-1398 (2004)
100EEChunsheng Liu, Krishnendu Chakrabarty: Identification of error-capturing scan cells in scan-BIST with applications to system-on-chip. IEEE Trans. on CAD of Integrated Circuits and Systems 23(10): 1447-1459 (2004)
99EETianhao Zhang, Krishnendu Chakrabarty, Richard B. Fair: Behavioral modeling and performance evaluation of microelectrofluidics-based PCR systems using SystemC. IEEE Trans. on CAD of Integrated Circuits and Systems 23(6): 843-858 (2004)
98EELei Li, Krishnendu Chakrabarty: Test set embedding for deterministic BIST using a reconfigurable interconnection network. IEEE Trans. on CAD of Integrated Circuits and Systems 23(9): 1289-1305 (2004)
97EEAnshuman Chandra, Krishnendu Chakrabarty: Analysis of Test Application Time for Test Data Compression Methods Based on Compression Codes. J. Electronic Testing 20(2): 199-212 (2004)
96EEMichael Gössel, Krishnendu Chakrabarty, Vitalij Ocheretnij, Andreas Leininger: A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST. J. Electronic Testing 20(6): 611-622 (2004)
95EELei Li, Krishnendu Chakrabarty: On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data Compression. J. Electronic Testing 20(6): 667-670 (2004)
94EEYi Zou, Krishnendu Chakrabarty: Uncertainty-aware and coverage-oriented deployment for sensor networks. J. Parallel Distrib. Comput. 64(7): 788-798 (2004)
2003
93EEVamsee K. Pamula, Krishnendu Chakrabarty: Cooling of integrated circuits using droplet-based microfluidics. ACM Great Lakes Symposium on VLSI 2003: 84-87
92EEAnuja Sehgal, Vikram Iyengar, Mark D. Krasniewski, Krishnendu Chakrabarty: Test cost reduction for SOCs using virtual TAMs and lagrange multipliers. DAC 2003: 738-743
91EEDhiraj K. Pradhan, Chunsheng Liu, Krishnendu Chakrabarty: EBIST: A Novel Test Generator with Built-In Fault Detection Capability. DATE 2003: 10224-10229
90EEChunsheng Liu, Krishnendu Chakrabarty: A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis. DATE 2003: 10230-10237
89EEYing Zhang, Krishnendu Chakrabarty: Energy-Aware Adaptive Checkpointing in Embedded Real-Time Systems. DATE 2003: 10918-10925
88EEVikram Iyengar, Anshuman Chandra, Sharon Schweizer, Krishnendu Chakrabarty: A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization. DATE 2003: 11188-11190
87EEYing Zhang, Krishnendu Chakrabarty: Fault Recovery Based on Checkpointing for Hard Real-Time Embedded Systems. DFT 2003: 320-327
86EEYing Zhang, Krishnendu Chakrabarty, Vishnu Swaminathan: Energy-Aware Fault Tolerance in Fixed-Priority Real-Time Embedded Systems. ICCAD 2003: 209-214
85EEVishnu Swaminathan, Krishnendu Chakrabarty: Generalized Network Flow Techniques for Dynamic Voltage Scaling in Hard Real-Time Systems. ICCAD 2003: 21-25
84EEAnuja Sehgal, Sule Ozev, Krishnendu Chakrabarty: TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers. ICCAD 2003: 95-99
83EESeiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Chakrabarty: On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume. ICCD 2003: 387-396
82EEYi Zou, Krishnendu Chakrabarty: Sensor Deployment and Target Localization Based on Virtual Forces. INFOCOM 2003
81EEChunsheng Liu, Krishnendu Chakrabarty: Compact Dictionaries for Fault Diagnosis in BIST. ISQED 2003: 105-110
80EEFei Su, Sule Ozev, Krishnendu Chakrabarty: Testing of Droplet-Based Microelectrofluidic Systems. ITC 2003: 1192-1200
79EELei Li, Krishnendu Chakrabarty: Deterministic BIST Based on a Reconfigurable Interconnection Network. ITC 2003: 460-469
78EEYi Zou, Krishnendu Chakrabarty: Energy-Aware Target Localization in Wireless Sensor Networks. PerCom 2003: 60-
77EELei Li, Krishnendu Chakrabarty: Test Data Compression Using Dictionaries with Fixed-Length Indices. VTS 2003: 219-224
76EEVikram Iyengar, Krishnendu Chakrabarty, Mark D. Krasniewski, Gopind N. Kumar: Design and Optimization of Multi-level TAM Architectures for Hierarchical SOCs. VTS 2003: 299-312
75EELei Li, Krishnendu Chakrabarty, Nur A. Touba: Test data compression using dictionaries with selective entries and fixed-length indices. ACM Trans. Design Autom. Electr. Syst. 8(4): 470-490 (2003)
74EEYi Zou, Krishnendu Chakrabarty: Target localization based on energy considerations in distributed sensor networks. Ad Hoc Networks 1(2-3): 261-272 (2003)
73EEVikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: Test Access Mechanism Optimization, Test Scheduling, and Tester Data Volume Reduction for System-on-Chip. IEEE Trans. Computers 52(12): 1619-1632 (2003)
72EEAnshuman Chandra, Krishnendu Chakrabarty: Test Data Compression and Test Resource Partitioning for System-on-a-Chip Using Frequency-Directed Run-Length (FDR) Codes. IEEE Trans. Computers 52(8): 1076-1088 (2003)
71EEAnshuman Chandra, Krishnendu Chakrabarty: A unified approach to reduce SOC test data volume, scan power and testing time. IEEE Trans. on CAD of Integrated Circuits and Systems 22(3): 352-363 (2003)
70EEChunsheng Liu, Krishnendu Chakrabarty: Failing vector identification based on overlapping intervals of test vectors in a scan-BIST environment. IEEE Trans. on CAD of Integrated Circuits and Systems 22(5): 593-604 (2003)
69EEVikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: Efficient test access mechanism optimization for system-on-chip. IEEE Trans. on CAD of Integrated Circuits and Systems 22(5): 635-643 (2003)
68EEVishnu Swaminathan, Krishnendu Chakrabarty: Energy-conscious, deterministic I/O device scheduling in hard real-time systems. IEEE Trans. on CAD of Integrated Circuits and Systems 22(7): 847-858 (2003)
2002
67EEAlexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty: Robust Space Compaction of Test Responses. Asian Test Symposium 2002: 254-259
66EEVikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: Recent Advances in Test Planning for Modular Testing of Core-Based SOCs. Asian Test Symposium 2002: 320-
65EEVishnu Swaminathan, Krishnendu Chakrabarty: Pruning-based energy-optimal device scheduling for hard real-time systems. CODES 2002: 175-180
64EEAnshuman Chandra, Krishnendu Chakrabarty: Reduction of SOC test data volume, scan power and testing time using alternating run-length codes. DAC 2002: 673-678
63EEVikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: Wrapper/TAM co-optimization, constraint-driven test scheduling, and tester data volume reduction for SOCs. DAC 2002: 685-690
62EEChunsheng Liu, Krishnendu Chakrabarty, Michael Gössel: An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment. DATE 2002: 382-386
61EEVikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: Efficient Wrapper/TAM Co-Optimization for Large SOCs. DATE 2002: 491-498
60EEAnshuman Chandra, Krishnendu Chakrabarty: Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression. DATE 2002: 598-603
59EEVishnu Swaminathan, Charles B. Schweizer, Krishnendu Chakrabarty, Amil A. Patel: Experiences in Implementing an Energy-Driven Task Scheduler in RT-Linux. IEEE Real Time Technology and Applications Symposium 2002: 229-238
58EEVikram Iyengar, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty: Test Resource Optimization for Multi-Site Testing of SOCs Under ATE Memory Depth Constraints. ITC 2002: 1159-1168
57EEErik Jan Marinissen, Vikram Iyengar, Krishnendu Chakrabarty: A Set of Benchmarks fo Modular Testing of SOCs. ITC 2002: 519-528
56EEVikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: On Using Rectangle Packing for SOC Wrapper/TAM Co-Optimization. VTS 2002: 253-258
55EEAnshuman Chandra, Krishnendu Chakrabarty, Rafael A. Medina: How Effective are Compression Codes for Reducing Test Data Volume? VTS 2002: 91-96
54 Krishnendu Chakrabarty, Erik Jan Marinissen: How Useful are the ITC 02 SoC Test Benchmarks? IEEE Design & Test of Computers 19(5): 120, 119 (2002)
53EEKrishnendu Chakrabarty, S. Sitharama Iyengar, Hairong Qi, Eungchun Cho: Grid Coverage for Surveillance and Target Location in Distributed Sensor Networks. IEEE Trans. Computers 51(12): 1448-1453 (2002)
52EEVikram Iyengar, Krishnendu Chakrabarty: Test Bus Sizing for System-on-a-Chip. IEEE Trans. Computers 51(5): 449-459 (2002)
51EEBhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty: Synthesis of single-output space compactors for scan-based sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 21(10): 1171-1179 (2002)
50EEAnshuman Chandra, Krishnendu Chakrabarty: Low-power scan testing and test data compression forsystem-on-a-chip. IEEE Trans. on CAD of Integrated Circuits and Systems 21(5): 597-604 (2002)
49EEAnshuman Chandra, Krishnendu Chakrabarty: Test data compression and decompression based on internal scanchains and Golomb coding. IEEE Trans. on CAD of Integrated Circuits and Systems 21(6): 715-722 (2002)
48EETianhao Zhang, Krishnendu Chakrabarty, Richard B. Fair: Design of reconfigurable composite microsystems based on hardware/software codesign principles. IEEE Trans. on CAD of Integrated Circuits and Systems 21(8): 987-995 (2002)
47EEVikram Iyengar, Krishnendu Chakrabarty: System-on-a-chip test scheduling with precedence relationships, preemption, and power constraints. IEEE Trans. on CAD of Integrated Circuits and Systems 21(9): 1088-1094 (2002)
46EEVikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip. J. Electronic Testing 18(2): 213-230 (2002)
45EEKrishnendu Chakrabarty: Guest Editorial. J. Electronic Testing 18(4-5): 363 (2002)
2001
44EEVishnu Swaminathan, Krishnendu Chakrabarty: Investigating the effect of voltage-switching on low-energy task scheduling in hard real-time systems. ASP-DAC 2001: 251
43EEBhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty: Synthesis of single-output space compactors with application to scan-based IP cores. ASP-DAC 2001: 496-502
42EEVishnu Swaminathan, Krishnendu Chakrabarty, S. Sitharama Iyengar: Dynamic I/O power management for hard real-time systems. CODES 2001: 237-242
41EEAnshuman Chandra, Krishnendu Chakrabarty: Combining Low-Power Scan Testing and Test Data Compression for System-on-a-Chip. DAC 2001: 166-169
40EEAnshuman Chandra, Krishnendu Chakrabarty: Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding. DATE 2001: 145-149
39 Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: Test wrapper and test access mechanism co-optimization for system-on-chip. ITC 2001: 1023-1032
38EEKrishnendu Chakrabarty, S. Sitharama Iyengar, Hairong Qi, Eungchun Cho: Coding Theory Framework for Target Location in Distributed Sensor Networks. ITCC 2001: 130-
37EEKrishnendu Chakrabarty, Andrew Exnicios, Rajatish Mukherjee: Synthesis Of Transparent Circuits For Hierarchical An System-On-A-Chip Test. VLSI Design 2001: 431-
36EEVikram Iyengar, Krishnendu Chakrabarty: Precedence-Based, Preemptive, and Power-Constrained Test Scheduling for System-on-a-Chip. VTS 2001: 368-374
35EEAnshuman Chandra, Krishnendu Chakrabarty: Frequency-Directed Run-Length (FDR) Codes with Application to System-on-a-Chip Test Data Compression. VTS 2001: 42-47
34EEA. Morozov, Michael Gössel, Krishnendu Chakrabarty, Bhargab B. Bhattacharya: Design of Parameterizable Error-Propagating Space Compactors for Response Observation. VTS 2001: 48-53
33EEKrishnendu Chakrabarty: Optimal test access architectures for system-on-a-chip. ACM Trans. Design Autom. Electr. Syst. 6(1): 26-49 (2001)
32EEAnshuman Chandra, Krishnendu Chakrabarty: Test Resource Partitioning for SOCs. IEEE Design & Test of Computers 18(5): 80-91 (2001)
31EEJie Ding, Krishnendu Chakrabarty, Richard B. Fair: Scheduling of microfluidic operations for reconfigurabletwo-dimensional electrowetting arrays. IEEE Trans. on CAD of Integrated Circuits and Systems 20(12): 1463-1468 (2001)
30EEAnshuman Chandra, Krishnendu Chakrabarty: System-on-a-chip test-data compression and decompressionarchitectures based on Golomb codes. IEEE Trans. on CAD of Integrated Circuits and Systems 20(3): 355-368 (2001)
29 Hairong Qi, S. Sitharama Iyengar, Krishnendu Chakrabarty: Multiresolution data integration using mobile agents in distributed sensor networks. IEEE Transactions on Systems, Man, and Cybernetics, Part C 31(3): 383-391 (2001)
28EEShivakumar Swaminathan, Krishnendu Chakrabarty: On Using Twisted-Ring Counters for Test Set Embedding in BIST. J. Electronic Testing 17(6): 529-542 (2001)
2000
27EEKrishnendu Chakrabarty: Design of system-on-a-chip test access architectures under place-and-route and power constraints. DAC 2000: 432-437
26 Hiroshi Date, Vikram Iyengar, Krishnendu Chakrabarty, Makoto Sugihara: Mathematical Modeling of Intellectual Property Protection Using Partially-Mergeable Cores. PDPTA 2000
25EEAnshuman Chandra, Krishnendu Chakrabarty: Test Data Compression for System-on-a-Chip Using Golomb Codes. VTS 2000: 113-120
24EEKrishnendu Chakrabarty: Design of System-on-a-Chip Test Access Architectures using Integer Linear Programming. VTS 2000: 127-136
23EEMarkus Seuring, Krishnendu Chakrabarty: Space Compaction of Test Responses for IP Cores Using Orthogonal Transmission Functions. VTS 2000: 213-220
22EEKrishnendu Chakrabarty, Brian T. Murray, Vikram Iyengar: Deterministic built-in test pattern generation for high-performance circuits using twisted-ring counters. IEEE Trans. VLSI Syst. 8(5): 633-636 (2000)
21EEKrishnendu Chakrabarty: Test scheduling for core-based systems using mixed-integer linearprogramming. IEEE Trans. on CAD of Integrated Circuits and Systems 19(10): 1163-1174 (2000)
1999
20EEKrishnendu Chakrabarty: Test scheduling for core-based systems. ICCAD 1999: 391-394
19EEKrishnendu Chakrabarty, Brian T. Murray, Vikram Iyengar: Built-in Test Pattern Generation For High-Performance Cir cuits Using Twisted-Ring Counters. VTS 1999: 22-27
18EEMark G. Karpovsky, Krishnendu Chakrabarty, Lev B. Levitin, Dimiter R. Avresky: On the Covering of Vertices for Fault Diagnosis in Hypercubes. Inf. Process. Lett. 69(2): 99-103 (1999)
17EEVikram Iyengar, Krishnendu Chakrabarty, Brian T. Murray: Deterministic Built-in Pattern Generation for Sequential Circuits. J. Electronic Testing 15(1-2): 97-114 (1999)
1998
16EEVikram Iyengar, Krishnendu Chakrabarty, Brian T. Murray: Built-In Self Testing of Sequential Circuits Using Precomputed Test Sets. VTS 1998: 418-423
15 Krishnendu Chakrabarty, Brian T. Murray, John P. Hayes: Optimal Zero-Aliasing Space Compaction of Test Responses. IEEE Trans. Computers 47(11): 1171-1187 (1998)
14EEKrishnendu Chakrabarty, John P. Hayes: Zero-aliasing space compaction of test responses using multiple parity signatures. IEEE Trans. VLSI Syst. 6(2): 309-313 (1998)
13EEKrishnendu Chakrabarty, Brian T. Murray: Design of built-in test generator circuits using width compression. IEEE Trans. on CAD of Integrated Circuits and Systems 17(10): 1044-1051 (1998)
12EEKrishnendu Chakrabarty: Zero-aliasing space compaction using linear compactors with bounded overhead. IEEE Trans. on CAD of Integrated Circuits and Systems 17(5): 452-457 (1998)
11 Mark G. Karpovsky, Krishnendu Chakrabarty, Lev B. Levitin: On a New Class of Codes for Identifying Vertices in Graphs. IEEE Transactions on Information Theory 44(2): 599-611 (1998)
1997
10 Krishnendu Chakrabarty, Jian Liu, Minyao Zhu, Brian T. Murray: Test Width Compression for Built-In Self Testing. ITC 1997: 328-337
9EEKrishnendu Chakrabarty, John P. Hayes: On the quality of accumulator-based compaction of test responses. IEEE Trans. on CAD of Integrated Circuits and Systems 16(8): 916-922 (1997)
8EEVikram Iyengar, Krishnendu Chakrabarty: An Efficient Finite-State Machine Implementation of Huffman Decoders. Inf. Process. Lett. 64(6): 271-275 (1997)
1996
7EEKrishnendu Chakrabarty, John P. Hayes: Test response compaction using multiplexed parity trees. IEEE Trans. on CAD of Integrated Circuits and Systems 15(11): 1399-1408 (1996)
6EEKrishnendu Chakrabarty, John P. Hayes: Balance testing and balance-testable design of logic circuits. J. Electronic Testing 8(1): 71-86 (1996)
1995
5 Krishnendu Chakrabarty, Brian T. Murray, John P. Hayes: Optimal Space Compaction of Test Responses. ITC 1995: 834-843
4EEKrishnendu Chakrabarty, John P. Hayes: Cumulative balance testing of logic circuits. IEEE Trans. VLSI Syst. 3(1): 72-83 (1995)
1994
3EEKrishnendu Chakrabarty, John P. Hayes: DFBT: A Design-for-Testability Method Based on Balance Testing. DAC 1994: 351-357
2 Krishnendu Chakrabarty, John P. Hayes: Efficient Test-Response Compression for Multiple-Output Cicuits. ITC 1994: 501-510
1993
1 Krishnendu Chakrabarty, John P. Hayes: Balance Testing of Logic Circuits. FTCS 1993: 350-359

Coauthor Index

1Bashir M. Al-Hashimi [128] [130] [143] [166]
2Dimiter R. Avresky [18]
3Nabil Badereddine [187]
4R. Iris Bahar [185] [194]
5Sudarshan Bahukudumbi [162] [172] [182] [193] [196] [201] [204]
6Jacob Barhen [103]
7Bhargab B. Bhattacharya [34] [43] [51]
8Michael Bienek [176] [203]
9R. D. (Shawn) Blanton (Ronald D. Blanton) [109]
10Anshuman Chandra [25] [30] [32] [35] [40] [41] [49] [50] [55] [60] [64] [71] [72] [88] [97]
11J. E. Chen [126]
12Yibo Chen [198]
13Eungchun Cho [38] [53]
14Romit Roy Choudhury [174]
15Hiroshi Date [26]
16Robert P. Dick [114]
17Jie Ding [31]
18Alexej Dmitriev [43] [51] [67]
19Yasumi Doi [83] [138]
20Kumar N. Dwarakanath [109]
21Petru Eles [200]
22Andrew Exnicios [37]
23Richard B. Fair [31] [48] [99] [141]
24Hongxia Fang [203]
25Patrick Girard [187]
26Sandeep Kumar Goel [58] [108] [151] [205]
27Michael Gössel [34] [43] [51] [62] [67] [96] [152]
28John P. Hayes [1] [2] [3] [4] [5] [6] [7] [9] [14] [15]
29William L. Hwang [150] [153] [157] [158]
30S. Sitharama Iyengar [29] [38] [42] [53] [103]
31Vikram Iyengar [8] [16] [17] [19] [22] [26] [36] [39] [46] [47] [52] [56] [57] [58] [61] [63] [66] [69] [73] [76] [88] [92] [102] [116] [182]
32Richard Kacprowicz [201]
33Seiji Kajihara [83] [123] [138]
34Mark G. Karpovsky [11] [18]
35Mark D. Krasniewski [76] [92] [116]
36Amit Kumar [173]
37Gopind N. Kumar [76]
38Christian Landrault [187]
39Anders Larsson [200]
40Erik Larsson [188] [200]
41Alvin R. Lebeck [183]
42Andreas Leininger [96]
43Lev B. Levitin [11] [18]
44Lei Li [75] [77] [79] [83] [95] [98] [123] [134] [138] [170]
45Chunsheng Liu [62] [70] [81] [90] [91] [100] [104] [109] [117]
46Fang Liu [131] [167]
47Jian Liu [10]
48Erik Jan Marinissen [39] [46] [54] [56] [57] [58] [61] [63] [66] [69] [73] [108] [151] [205]
49Hisham Z. Massoud [155] [207]
50Rafael A. Medina [55]
51Chunduri Rama Mohan [173]
52A. Morozov [34]
53Arindam Mukherjee [158]
54Rajatish Mukherjee [37]
55Brian T. Murray [5] [10] [13] [15] [16] [17] [19] [22]
56Nicola Nicolici [136] [161]
57Peng Ning [174]
58Mehrdad Nourani [112] [118]
59Vitalij Ocheretnij [96]
60Lara D. Oliver [155] [207]
61Sule Ozev [80] [84] [125] [131] [140] [145] [147] [167] [182]
62P. Y. Paik [191]
63Vamsee K. Pamula [93] [133] [169] [191] [199]
64Amil A. Patel [59]
65Zebo Peng [188] [200]
66Dhiraj K. Pradhan [91]
67Serge Pravossoudovitch [187]
68Hairong Qi [29] [38] [53] [103]
69Nageswara S. V. Rao [103]
70Paul M. Rosinger [128] [130] [143] [166]
71Harshavardhan Sabbineni [120]
72Soheil Samii [188]
73Sachin S. Sapatnekar [156]
74Charles B. Schweizer [59]
75Sharon Schweizer [88]
76Anuja Sehgal [84] [92] [102] [108] [111] [125] [127] [131] [145] [151] [164] [167] [193] [205]
77Mikko Selkälä [188]
78Markus Seuring [23]
79Fei Su [80] [107] [110] [122] [132] [133] [135] [137] [139] [140] [141] [142] [146] [147] [150] [153] [157] [158] [168] [169] [171] [186]
80Makoto Sugihara [26]
81Shivakumar Swaminathan [28] [123]
82Vishnu Swaminathan [42] [44] [59] [65] [68] [85] [86] [101] [121]
83Enkelejda Tafaj [128]
84Mohammad Tehranipoor [118] [195]
85Mohammad H. Tehranipour [112]
86Roland Thewes [165]
87Nur A. Touba [75]
88Vijay K. Vaishnavi [103]
89Arnaud Virazel [187]
90Seongmoon Wang [179]
91Zhanglei Wang [152] [159] [170] [176] [179] [187] [189] [192] [203]
92Xiaoqing Wen [138]
93Qishi Wu [103]
94Xiaoxia Wu [198]
95Yuan Xie [198]
96Qiang Xu [136] [161] [181] [206]
97Tao Xu [154] [157] [171] [175] [178] [180] [184] [190] [197] [199] [202]
98Mahmut Yilmaz [195]
99Jun Zeng [115]
100Tianhao Zhang [48] [99]
101Ying Zhang [86] [87] [89] [105] [113] [114] [144]
102Yubin Zhang [181] [206]
103Tong Zhou [174]
104Minyao Zhu [10]
105Yi Zou [74] [78] [82] [94] [106] [119] [129] [160] [163]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)