| 2008 |
|---|
| 4 | EE | Nabil Badereddine,
Zhanglei Wang,
Patrick Girard,
Krishnendu Chakrabarty,
Arnaud Virazel,
Serge Pravossoudovitch,
Christian Landrault:
A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction.
J. Electronic Testing 24(4): 353-364 (2008) |
| 2006 |
|---|
| 3 | EE | Nabil Badereddine,
Patrick Girard,
Serge Pravossoudovitch,
Christian Landrault,
Arnaud Virazel,
Hans-Joachim Wunderlich:
Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing.
VLSI-SoC 2006: 403-408 |
| 2005 |
|---|
| 2 | EE | Nabil Badereddine,
Patrick Girard,
Arnaud Virazel,
Serge Pravossoudovitch,
Christian Landrault:
Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives.
PATMOS 2005: 540-549 |
| 1 | EE | Nabil Badereddine,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Christian Landrault:
Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles.
VLSI-SoC 2005: 267-281 |
