| 2008 |
|---|
| 86 | EE | Michael Gössel,
Egor S. Sogomonyan:
A Non-linear Split Error Detection Code.
Fundam. Inform. 83(1-2): 109-115 (2008) |
| 2006 |
|---|
| 85 | EE | Zhanglei Wang,
Krishnendu Chakrabarty,
Michael Gössel:
Test set enrichment using a probabilistic fault model and the theory of output deviations.
DATE 2006: 1270-1275 |
| 84 | EE | Frank Poehl,
Jan Rzeha,
Matthias Beck,
Michael Gössel,
Ralf Arnold,
Peter Ossimitz:
On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture.
European Test Symposium 2006: 239-246 |
| 83 | EE | Daniel Marienfeld,
Egor S. Sogomonyan,
Vitalij Ocheretnij,
Michael Gössel:
A New Self-Checking and Code-Disjoint Non-Restoring Array Divider.
IOLTS 2006: 23-30 |
| 82 | EE | Vitalij Ocheretnij,
Michael Gössel,
Egor S. Sogomonyan,
Daniel Marienfeld:
Modulo p=3 Checking for a Carry Select Adder.
J. Electronic Testing 22(1): 101-107 (2006) |
| 2005 |
|---|
| 81 | EE | Daniel Marienfeld,
Egor S. Sogomonyan,
Vitalij Ocheretnij,
Michael Gössel:
New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors.
Asian Test Symposium 2005: 76-81 |
| 80 | EE | Vitalij Ocheretnij,
G. Kouznetsov,
Ramesh Karri,
Michael Gössel:
On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations.
IOLTS 2005: 141-146 |
| 2004 |
|---|
| 79 | | A. Morozov,
Michael Gössel,
V. V. Saposhnikov,
Vl. V. Saposhnikov:
Complementary Circuits for On-Line Detection for 1-out-of-3 Codes.
ARCS Workshops 2004: 76-83 |
| 78 | | Egor S. Sogomonyan,
Daniel Marienfeld,
Vitalij Ocheretnij,
Michael Gössel:
Self-checking Carry-selectAdder with Sum-bit Duplication.
ARCS Workshops 2004: 84-91 |
| 77 | EE | Andreas Leininger,
Michael Gössel,
Peter Muhmenthaler:
Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code.
DATE 2004: 1302-1309 |
| 76 | EE | Egor S. Sogomonyan,
Daniel Marienfeld,
Vitalij Ocheretnij,
Michael Gössel:
A New Self-Checking Sum-Bit Duplicated Carry-Select Adder.
DATE 2004: 1360-1361 |
| 75 | EE | V. V. Saposhnikov,
Vl. V. Saposhnikov,
A. Morozov,
Michael Gössel:
Necessary and Sufficient Conditions for the Existence of Totally Self-Checking Circuits.
IOLTS 2004: 25-30 |
| 74 | EE | Vitalij Ocheretnij,
Daniel Marienfeld,
Egor S. Sogomonyan,
Michael Gössel:
Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits.
IOLTS 2004: 31-36 |
| 73 | EE | Kaijie Wu,
Ramesh Karri,
Grigori Kuznetsov,
Michael Gössel:
Low Cost Concurrent Error Detection for the Advanced Encryption Standard.
ITC 2004: 1242-1248 |
| 72 | EE | Michael Gössel,
Krishnendu Chakrabarty,
Vitalij Ocheretnij,
Andreas Leininger:
A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST.
J. Electronic Testing 20(6): 611-622 (2004) |
| 2003 |
|---|
| 71 | EE | Ramesh Karri,
Grigori Kuznetsov,
Michael Gössel:
Parity-Based Concurrent Error Detection of Substitution-Permutation Network Block Ciphers.
CHES 2003: 113-124 |
| 70 | EE | Vitalij Ocheretnij,
Michael Gössel,
Egor S. Sogomonyan,
Daniel Marienfeld:
A Modulo p Checked Self-Checking Carry Select Adder.
IOLTS 2003: 25-29 |
| 69 | EE | Kartik Mohanram,
Egor S. Sogomonyan,
Michael Gössel,
Nur A. Touba:
Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits.
IOLTS 2003: 35- |
| 68 | EE | Ramesh Karri,
Grigori Kuznetsov,
Michael Gössel:
Parity-Based Concurrent Error Detection in Symmetric Block Ciphers.
ITC 2003: 919-926 |
| 67 | EE | Adit D. Singh,
Markus Seuring,
Michael Gössel,
Egor S. Sogomonyan:
Multimode scan: Test per clock BIST for IP cores.
ACM Trans. Design Autom. Electr. Syst. 8(4): 491-505 (2003) |
| 66 | EE | Bhargab B. Bhattacharya,
Alexej Dmitriev,
Michael Gössel:
Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output.
IEEE Trans. Computers 52(12): 1646-1651 (2003) |
| 2002 |
|---|
| 65 | EE | Alexej Dmitriev,
Michael Gössel,
Krishnendu Chakrabarty:
Robust Space Compaction of Test Responses.
Asian Test Symposium 2002: 254-259 |
| 64 | EE | Chunsheng Liu,
Krishnendu Chakrabarty,
Michael Gössel:
An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment.
DATE 2002: 382-386 |
| 63 | EE | Daniel Marienfeld,
Vitalij Ocheretnij,
Michael Gössel,
Egor S. Sogomonyan:
Partially Duplicated Code-Disjoint Carry-Skip Adder.
DFT 2002: 78-86 |
| 62 | EE | Daniel Marienfeld,
Egor S. Sogomonyan,
Vitalij Ocheretnij,
Michael Gössel:
A New Self-Checking Code-Disjoint Carry-Skip Adder.
IOLTW 2002: 39-43 |
| 61 | EE | Michael Gössel,
Egor S. Sogomonyan,
Adit D. Singh:
Scan-Path with Directly Duplicated and Inverted Duplicated Registers.
VTS 2002: 47-52 |
| 60 | EE | Bhargab B. Bhattacharya,
Alexej Dmitriev,
Michael Gössel,
Krishnendu Chakrabarty:
Synthesis of single-output space compactors for scan-based sequential circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(10): 1171-1179 (2002) |
| 2001 |
|---|
| 59 | EE | Bhargab B. Bhattacharya,
Alexej Dmitriev,
Michael Gössel,
Krishnendu Chakrabarty:
Synthesis of single-output space compactors with application to scan-based IP cores.
ASP-DAC 2001: 496-502 |
| 58 | EE | Vitalij Ocheretnij,
Egor S. Sogomonyan,
Michael Gössel:
A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes.
Asian Test Symposium 2001: 365- |
| 57 | EE | Michael Gössel,
Vitalij Ocheretnij,
S. Chakrabarty:
Diagnosis by Repeated Application of Specific Test Inputs and by Output Monitoring of the MISA.
Asian Test Symposium 2001: 57-62 |
| 56 | EE | Vitalij Ocheretnij,
Michael Gössel,
Egor S. Sogomonyan:
Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead.
IOLTW 2001: 147-152 |
| 55 | EE | Egor S. Sogomonyan,
A. A. Morosov,
Jan Rzeha,
Michael Gössel,
Adit D. Singh:
Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging.
VTS 2001: 184-189 |
| 54 | EE | A. Morozov,
Michael Gössel,
Krishnendu Chakrabarty,
Bhargab B. Bhattacharya:
Design of Parameterizable Error-Propagating Space Compactors for Response Observation.
VTS 2001: 48-53 |
| 2000 |
|---|
| 53 | EE | Vitalij Ocheretnij,
Michael Gössel,
Vl. V. Saposhnikov,
V. V. Saposhnikov:
A New Method of Redundancy Addition for Circuit Optimization.
EUROMICRO 2000: 1172- |
| 52 | EE | A. Morozov,
V. V. Saposhnikov,
Vl. V. Saposhnikov,
Michael Gössel:
New Self-Checking Circuits by Use of Berger-Codes.
IOLTW 2000: 141-146 |
| 51 | EE | Michael Gössel,
Alexej Dmitriev,
Vl. V. Saposhnikov,
V. V. Saposhnikov:
A New Method for Concurrent Checking by Use of a 1-out-of-4 Code.
IOLTW 2000: 147-152 |
| 50 | EE | Debaleena Das,
Nur A. Touba,
Markus Seuring,
Michael Gössel:
Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes.
IOLTW 2000: 171- |
| 49 | EE | Bhargab B. Bhattacharya,
Alexej Dmitriev,
Michael Gössel:
Zero-Aliasing Space Compression using a Single Periodic Output and its Application to Testing of Embedded Cores.
VLSI Design 2000: 382-391 |
| 1999 |
|---|
| 48 | EE | Markus Seuring,
Michael Gössel:
A Structural Approach for Space Compaction for Sequential Circuits.
DFT 1999: 227- |
| 47 | | Adit D. Singh,
Egor S. Sogomonyan,
Michael Gössel,
Markus Seuring:
Testability evaluation of sequential designs incorporating the multi-mode scannable memory element.
ITC 1999: 286-293 |
| 46 | EE | Michael Gössel,
A. A. Morosov,
Egor S. Sogomonyan:
A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces.
VTS 1999: 49-57 |
| 45 | EE | Markus Seuring,
Michael Gössel:
A Structural Method for Output Compaction of Sequential Automata Implemented as Circuits.
WIA 1999: 158-163 |
| 44 | EE | Vl. V. Saposhnikov,
V. Moshanin,
V. V. Saposhnikov,
Michael Gössel:
Experimental Results for Self-Dual Multi-Output Combinational Circuits.
J. Electronic Testing 14(3): 295-300 (1999) |
| 43 | EE | Egor S. Sogomonyan,
Adit D. Singh,
Michael Gössel:
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing.
J. Electronic Testing 15(1-2): 87-96 (1999) |
| 1998 |
|---|
| 42 | EE | Vl. V. Saposhnikov,
V. V. Saposhnikov,
Alexej Dmitriev,
Michael Gössel:
Self-Dual Duplication for Error Detection.
Asian Test Symposium 1998: 296-300 |
| 41 | EE | T. Bogue,
Michael Gössel,
Helmut Jürgensen,
Yervant Zorian:
Built-In Self-Test with an Alternating Output.
DATE 1998: 180- |
| 40 | EE | Egor S. Sogomonyan,
Adit D. Singh,
Michael Gössel:
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing.
VTS 1998: 324-331 |
| 39 | EE | Markus Seuring,
Michael Gössel,
Egor S. Sogomonyan:
A Structural Approach for Space Compaction for Concurrent Checking and BIST.
VTS 1998: 354-361 |
| 38 | EE | V. V. Saposhnikov,
A. A. Morosov,
Vl. V. Saposhnikov,
Michael Gössel:
A New Design Method for Self-Checking Unidirectional Combinational Circuits.
J. Electronic Testing 12(1-2): 41-53 (1998) |
| 37 | EE | Sebastian T. J. Fenn,
Michael Gössel,
Mohammed Benaissa,
David Taylor:
On-Line Error Detection for Bit-Serial Multipliers in GF(2m).
J. Electronic Testing 13(1): 29-40 (1998) |
| 1997 |
|---|
| 36 | EE | Hendrik Hartje,
Michael Gössel,
Egor S. Sogomonyan:
Code-Disjoint Circuits for Parity Circuits.
Asian Test Symposium 1997: 100- |
| 35 | EE | Michael Gössel,
Sebastian T. J. Fenn,
David Taylor:
On-line error detection for finite field multipliers.
DFT 1997: 307-312 |
| 34 | EE | Andrzej Hlawiczka,
Michael Gössel,
Egor S. Sogomonyan:
A linear code-preserving signature analyzer COPMISR.
VTS 1997: 350-355 |
| 1996 |
|---|
| 33 | EE | Egor S. Sogomonyan,
Michael Gössel:
Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems.
VTS 1996: 138-144 |
| 32 | EE | Vl. V. Saposhnikov,
Alexej Dmitriev,
Michael Gössel,
V. V. Saposhnikov:
Self-dual parity checking-A new method for on-line testing.
VTS 1996: 162-168 |
| 31 | | S. Kundu,
Egor S. Sogomonyan,
Michael Gössel,
Steffen Tarnick:
Self-Checking Comparator with One Periodic Output.
IEEE Trans. Computers 45(3): 379-380 (1996) |
| 30 | EE | Michael Gössel,
Egor S. Sogomonyan:
A parity-preserving multi-input signature analyzer and its application for concurrent checking and BIST.
J. Electronic Testing 8(2): 165-177 (1996) |
| 1995 |
|---|
| 29 | EE | T. Bogue,
Helmut Jürgensen,
Michael Gössel:
BIST with negligible aliasing through random cover circuits.
ASP-DAC 1995 |
| 1994 |
|---|
| 28 | | T. Bogue,
Helmut Jürgensen,
Michael Gössel:
Design of Cover Circuits for Monitoring the Output of a MISA.
DFT 1994: 124-132 |
| 27 | | Stefan Gerber,
Michael Gössel:
Detection of Permanent Hardware Faults of a Floating Point Adder by Pseudoduplication.
EDCC 1994: 327-335 |
| 1993 |
|---|
| 26 | | Egor S. Sogomonyan,
Michael Gössel:
Design of Self-Parity Combinational Circuits for Self-testing and On-line Detection.
DFT 1993: 239-246 |
| 25 | | Michael Gössel,
Egor S. Sogomonyan:
Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design.
VLSI 1993: 103-111 |
| 24 | EE | Egor S. Sogomonyan,
Michael Gössel:
Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs.
J. Electronic Testing 4(3): 267-281 (1993) |
| 1991 |
|---|
| 23 | | Michael Gössel:
Optimal Error Detection Circuits for Sequential Circuits with Observable States.
Fault-Tolerant Computing Systems 1991: 171-180 |
| 1989 |
|---|
| 22 | | Wolfgang Luth,
Michael Gössel:
Linear image operations on the A6472 image processing system by use of the residue arithmetics.
Recent Issues in Pattern Analysis and Recognition 1989: 162-168 |
| 21 | | Michael Gössel,
Burghard Rebel:
Parallel Access, to rectangles.
Recent Issues in Pattern Analysis and Recognition 1989: 201-213 |
| 20 | | Michael Gössel,
J. Saedler:
Parallel computing of line-codings by use of a display processor system and the parallel determination of a discrete curvature.
Recent Issues in Pattern Analysis and Recognition 1989: 29-41 |
| 19 | | Rolf-Jürgen Vilser,
Reiner Creutzburg,
Hans-Jörg Grundmann,
Michael Gössel:
Parallel matrix multiplication on an array-logical processor.
Recent Issues in Pattern Analysis and Recognition 1989: 72-78 |
| 1988 |
|---|
| 18 | | Michael Gössel,
V. V. Kaversnev,
Burghard Rebel:
Parallel memories for straight line and rectangle access.
Parcella 1988: 89-109 |
| 17 | | Wolfgang Luth,
Rolf-Jürgen Vilser,
Norbert Eichhorn,
Michael Gössel:
Bitgenaue schnelle Arithmethik mit dem Bildverarbeitunssystem BVS A 6472.
Angewandte Informatik 30(3): 110-115 (1988) |
| 1987 |
|---|
| 16 | | Michael Gössel,
R. Rebel:
Memories for Parallel Subtree-Access.
Parallel Algorithms and Architectures 1987: 122-130 |
| 1985 |
|---|
| 15 | | Ferdinand Börner,
Reinhard Pöschel,
Michael Gössel:
Sets of Permutations and Their Realization by Permutation Networks.
Elektronische Informationsverarbeitung und Kybernetik 21(7/8): 331-342 (1985) |
| 1983 |
|---|
| 14 | | Michael Gössel:
Bemerkung über die Existenz von Signaturregistern zur Erkennung geradzahliger Fehler.
Elektronische Rechenanlagen 25(5): 233 (1983) |
| 1980 |
|---|
| 13 | | Michael Gössel,
Reinhard Pöschel:
Invariant Relations for Automata - A Proposal.
Elektronische Informationsverarbeitung und Kybernetik 16(4): 147-169 (1980) |
| 1977 |
|---|
| 12 | | Michael Gössel,
Heinz D. Modrow:
Verallgemeinerte Superposition bei binären Automaten.
Acta Cybern. 3: 163-171 (1977) |
| 11 | | Michael Gössel,
Reinhard Pöschel:
On the Characterization of Linear and Linearizable Automata by a Superposition Principle.
Mathematical Systems Theory 11: 61-76 (1977) |
| 1973 |
|---|
| 10 | | Michael Gössel:
Über stabile Umkehrautomaten linearer Automaten.
Elektronische Informationsverarbeitung und Kybernetik 9(1/2): 49-60 (1973) |
| 9 | | Heinz D. Modrow,
Michael Gössel:
Zur Verarbeitung von Zufallsfolgen durch abstrakte Automaten I.
Elektronische Informationsverarbeitung und Kybernetik 9(7/8): 433-454 (1973) |
| 8 | | Heinz D. Modrow,
Michael Gössel:
Zur Verarbeitung von Zufallsfolgen durch abstrakte Automaten II.
Elektronische Informationsverarbeitung und Kybernetik 9(9): 549-567 (1973) |
| 1972 |
|---|
| 7 | | K. Bellmann,
Michael Gössel:
Versuch einer automatentheoretischen Beschreibung von Selektionsprozess.
Acta Cybern. 1: 93-96 (1972) |
| 6 | | Michael Gössel,
Hans-Volker Pürschel:
Über Momente der Autokorrelationsfunktion eines Zeichens.
Elektronische Informationsverarbeitung und Kybernetik 8(1): 49-53 (1972) |
| 5 | | Michael Gössel,
Heinz D. Modrow:
Zur Realisierung stochastischer Automaten aus Zufallsgeneratoren und determinierten Automaten.
Elektronische Informationsverarbeitung und Kybernetik 8(6/7): 325-333 (1972) |
| 1971 |
|---|
| 4 | | Michael Gössel:
Über die Reduktion eines erweiterten linearen Automaten.
Elektronische Informationsverarbeitung und Kybernetik 7(1): 49-52 (1971) |
| 3 | | Michael Gössel:
Zur minimalen Modellbildung bei linearen diskreten Systemen.
Elektronische Informationsverarbeitung und Kybernetik 7(5/6): 355-369 (1971) |
| 1970 |
|---|
| 2 | | Michael Gössel:
Abstandsmatrix eines Zeichens.
Elektronische Informationsverarbeitung und Kybernetik 6(3): 145-153 (1970) |
| 1969 |
|---|
| 1 | | Michael Gössel:
Ein Algorithmus für die Diagrammtechnik der Greenschen Funktion.
Elektronische Informationsverarbeitung und Kybernetik 5(2): 127-137 (1969) |
