IEEE Design & Test of Computers, Volume 18

Volume 18, Number 1, January/February 2001

• D&T and the Future. 1- BibTeX

• News. 5-7 BibTeX

• Fabrizio Lombardi, Cecilia Metra: Guest Editors' Introduction: Defect-Oriented Diagnosis for Very Deep-Submicron Systems. 8-9 BibTeX
• Jien-Chung Lo, William D. Armitage, Corbet S. Johnson:
  Using Atomic Force Microscopy for Deep-Submicron Failure Analysis. 10-18
  Electronic Edition (link) BibTeX
• Srikanth Venkataraman, Scott Brady Drummonds:
  Poirot: Applications of a Logic Fault Diagnosis Tool. 19-30
  Electronic Edition (link) BibTeX
• Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang:
  Defect-Oriented Testing and Defective-Part-Level Prediction. 31-41
  Electronic Edition (link) BibTeX
• Khurram Muhammad, Kaushik Roy:
  Fault Detection and Location Using IDD Waveform Analysis. 42-49
  Electronic Edition (link) BibTeX
• Jim Plusquellic:
  IC Diagnosis Using Multiple Supply Pad IDDQs. 50-61
  Electronic Edition (link) BibTeX

• David San Segundo Bello, Ronald J. W. T. Tangelder, Hans G. Kerkhoff:
  Modeling a Verification Test System for Mixed-Signal Circuits. 63-71
  Electronic Edition (link) BibTeX
• Mani Soma, Sam D. Huynh, Jinyan Zhang, Seongwon Kim, Giri Devarayanadurg:
  Hierarchical ATPG for Analog Circuits and Systems. 72-81
  Electronic Edition (link) BibTeX
• A D&T Roundtable: Are Single-Chip Multiprocessors in Reach? 82-89 BibTeX

• Panel Summaries. 90-92 BibTeX

• Conference Reports. 93- BibTeX

• DATC Newsletter. 94- BibTeX

• TTTC Newsletter. 95- BibTeX

• Danger! Submicron Defects! 96- BibTeX

Volume 18, Number 2, March/April 2001

• Managing Power. 1- BibTeX

• Enrico Macii: Guest Editor's Introduction: Dynamic Power Management of Electronic Systems. 6-9 BibTeX
• Yung-Hsiang Lu, Giovanni De Micheli:
  Comparing System-Level Power Management Policies. 10-19
  Electronic Edition (link) BibTeX
• Dongkun Shin, Jihong Kim, Seongsoo Lee:
  Intra-Task Voltage Scheduling for Low-Energy, Hard Real-Time Applications. 20-30
  Electronic Edition (link) BibTeX
• Takanori Okuma, Hiroto Yasuura, Tohru Ishihara:
  Software Energy Reduction Techniques for Variable-Voltage Processors. 31-41
  Electronic Edition (link) BibTeX
• Stephen B. Furber, Aristides Efthymiou, Jim D. Garside, David W. Lloyd, Mike J. G. Lewis, Steve Temple:
  Power Management in the Amulet Microprocessors. 42-52
  Electronic Edition (link) BibTeX
• Luca Benini, Giuliano Castelli, Alberto Macii, Riccardo Scarsi:
  Battery-Driven Dynamic Power Management. 53-60
  Electronic Edition (link) BibTeX
• Amit Sinha, Anantha Chandrakasan:
  Dynamic Power Management in Wireless Sensor Networks. 62-74
  Electronic Edition (link) BibTeX

• Manoj Sachdev:
  Current-Based Testing for Deep-Submicron VLSIs. 76-84
  Electronic Edition (link) BibTeX

• Panel Summaries. 86-91 BibTeX

• Conference Reports. 92-94 BibTeX

• Standards. 95- BibTeX

• A D&T Roundtable: Industrial and University Test Research Collaboration. 98-105 BibTeX

• TTTC Newsletter. 109-110 BibTeX

• DATC Newsletter. 111- BibTeX

• Scott Davidson: Welcome to 2001. 112- BibTeX

Volume 18, Number 3, May/June 2001

• Yervant Zorian: Huge Storage Capacity. 1- BibTeX

• Rochit Rajsuman, Francky Catthoor: Guest Editors' Intoduction: The New World of Large Embedded Memories. 3-4 BibTeX

• Alex Shubat: Moving the Market to Embedded Memory. 5-6 BibTeX

• Doris Keitel-Schulz, Norbert Wehn:
  Embedded DRAM Development: Technology, Physical Design, and Application Issues. 7-15
  Electronic Edition (link) BibTeX
• Rochit Rajsuman:
  Design and Test of Large Embedded Memories: An Overview. 16-27
  Electronic Edition (link) BibTeX
• Julie Segal, Alvin Jee, David Y. Lepejian, Ben Chu:
  Using Electrical Bitmap Results from Embedded Memory to Enhance Yield. 28-39
  Electronic Edition (link) BibTeX
• Lode Nachtergaele, Francky Catthoor, Chidamber Kulkarni:
  Random-Access Data Storage Components in Customized Architectures. 40-54
  Electronic Edition (link) BibTeX
• Preeti Ranjan Panda, Nikil D. Dutt, Alexandru Nicolau, Francky Catthoor, Arnout Vandecappelle, Erik Brockmeyer, Chidamber Kulkarni, Eddy de Greef:
  Data Memory Organization and Optimizations in Application-Specific Systems. 56-68
  Electronic Edition (link) BibTeX
• Francky Catthoor, Koen Danckaert, Sven Wuytack, Nikil D. Dutt:
  Code Transformations for Data Transfer and Storage Exploration Preprocessing in Multimedia Processors. 70-82
  Electronic Edition (link) BibTeX

• Kamran Zarrineh, Shambhu J. Upadhyaya, Vivek Chickermane:
  System-on-Chip Testability Using LSSD Scan Structures. 83-97
  Electronic Edition (link) BibTeX
• Margarida F. Jacome, Helvio P. Peixoto:
  A Survey of Digital Design Reuse. 98-107
  Electronic Edition (link) BibTeX
• Michael Sprachmann:
  Automatic Generation of Parallel CRC Circuits. 108-114
  Electronic Edition (link) BibTeX

• A D&T Roundtable: System-on-Chip Specification and Modeling Using C++: Challenges and Opportunities. 115-123 BibTeX

• Conference Reports. 124-126 BibTeX

• DATC Newsletter. 127- BibTeX

• Ahmed Amine Jerraya: Two Enduring Questions for Computer Design. 128- BibTeX

Volume 18, Number 4, July/August 2001

• Yervant Zorian: Error-Free Products. 2- BibTeX

• Carl Pixley: Guest Editor's Introduction: Formal Verification of Commercial Integrated Circuits. 4-5 BibTeX
• Harry Foster:
  Applied Boolean Equivalence Verification and RTL Static Sign-Off. 6-15
  Electronic Edition (link) BibTeX
• Robert B. Jones, John W. O'Leary, Carl-Johan H. Seger, Mark Aagaard, Thomas F. Melham:
  Practical Formal Verification in Microprocessor Design. 16-25
  Electronic Edition (link) BibTeX
• Narayanan Krishnamurthy, Magdy S. Abadir, Andrew K. Martin, Jacob A. Abraham:
  Design and Development Paradigm for Industrial Formal Verification CAD Tools. 26-35
  Electronic Edition (link) BibTeX
• Serdar Tasiran, Kurt Keutzer:
  Coverage Metrics for Functional Validation of Hardware Designs. 36-45
  Electronic Edition (link) BibTeX

• Lionel Bening, Harry Foster:
  Optimizing Multiple EDA Tools within the ASIC Design Flow. 46-55
  Electronic Edition (link) BibTeX
• Roberto d'Amore, Osamu Saotome, Karl Heinz Kienitz:
  A Two-Input, One-Output Bit-Scalable Architecture for Fuzzy Processors. 56-64
  Electronic Edition (link) BibTeX

• Roundtable: Adding Reconfigurable Logic to SOC Designs. 65-71 BibTeX

• Conference Reports. 72- BibTeX

• Panel Summaries. 73-76 BibTeX

• DATC Newsletter. 77- BibTeX

• TTCC Newsletter. 78-79 BibTeX

• Todd M. Austin: Design for Verification? 80, 77 BibTeX

Volume 18, Number 5, September/October 2001

• Yervant Zorian: EIC Message. 1- BibTeX

• News. 5-6 BibTeX

• Wayne Wolf, Ahmed Amine Jerraya: Application-Specific System-on-a-Chip Multiprocessors. 7- BibTeX
• Wander O. Cesário, Gabriela Nicolescu, Lovic Gauthier, Damien Lyonnard, Ahmed Amine Jerraya:
  Colif: A Design Representation for Application-Specific Multiprocessor SOCs. 8-20
  Electronic Edition (link) BibTeX
• Santanu Dutta, Rune Jensen, Alf Rieckmann:
  Viper: A Multiprocessor SOC for Advanced Set-Top Box and Digital TV Systems. 21-31
  Electronic Edition (link) BibTeX
• Reinaldo A. Bergamaschi, Subhrajit Bhattacharya, Ronoldo Wagner, Colleen Fellenz, Michael Muhlada, William R. Lee, Foster White, Jean-Marc Daveau:
  Automating the Design of SOCs Using Cores. 32-45
  Electronic Edition (link) BibTeX
• Peng Yang, Chun Wong, Paul Marchal, Francky Catthoor, Dirk Desmet, Diederik Verkest, Rudy Lauwereins:
  Energy-Aware Runtime Scheduling for Embedded-Multiprocessor SOCs. 46-58
  Electronic Edition (link) BibTeX
• Tony Ambler, Donald L. Wheater: Test Trade-Offs Take Center Stage at ITC. 59- BibTeX
• Jay Bedsole, Rajesh Raina, Al Crouch, Magdy S. Abadir:
  Very Low Cost Testers: Opportunities and Challenges. 60-69
  Electronic Edition (link) BibTeX
• Louis Y. Ungar, Tony Ambler:
  Economics of Built-in Self-Test. 70-79
  Electronic Edition (link) BibTeX
• Anshuman Chandra, Krishnendu Chakrabarty:
  Test Resource Partitioning for SOCs. 80-91
  Electronic Edition (link) BibTeX
• Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
  Online and Offline BIST in IP-Core Design. 92-99
  Electronic Edition (link) BibTeX

• Sérgio Akira Ito, Luigi Carro, Ricardo Pezzuol Jacobi:
  Making Java Work for Microcontroller Applications. 100-110
  Electronic Edition (link) BibTeX

• Design Closure with Cell-Based Synthesis. 112-119 BibTeX

• Technology Continuous Education. 120- BibTeX

• Tom Anderson: Your Core-My Problem? Integration and Verification of IP. 121, 123 BibTeX

• Peter J. Ashenden: VHDL Standards. 122-123 BibTeX

• New Products. 124- BibTeX

• DATC Newsletter. 125- BibTeX

• TTTC Newsletter. 126-127 BibTeX

• Tony Ambler: Test Strategies and Marriage Partners. 128- BibTeX

Volume 18, Number 6, November/December 2001

• EIC Message. 3- BibTeX

• William H. Joyner Jr., Andrew B. Kahng: Guest Editor's Introduction: Roadmaps and Visions for Design and Test. 4-5 BibTeX
• Dennis Sylvester, Himanshu Kaul:
  Power-Driven Challenges in Nanometer Design. 12-22
  Electronic Edition (link) BibTeX
• Alberto L. Sangiovanni-Vincentelli, Grant Martin:
  Platform-Based Design and Software Design Methodology for Embedded Systems. 23-33
  Electronic Edition (link) BibTeX
• Ralf Brederlow, Werner Weber, Joseph Sauerer, Stéphane Donnay, Piet Wambacq, Maarten Vertregt:
  A Mixed-Signal Design Roadmap. 34-46
  Electronic Edition (link) BibTeX
• Rohit Kapur, R. Chandramouli, Thomas W. Williams:
  Strategies for Low-Cost Test. 47-54
  Electronic Edition (link) BibTeX

• Kevin Stanley:
  High-Accuracy Flush-and-Scan Software Diagnostic. 56-62
  Electronic Edition (link) BibTeX

• Perspectives. 6-11 BibTeX

• Conference Reports. 64-65 BibTeX

• Panel Summaries. 66-67 BibTeX

• TTTC Newsletter. 68- BibTeX

• DATC Newsletter. 69- BibTeX

• Annual Index. 70-79 BibTeX

• The Last Byte. 80- BibTeX