| 2003 |
|---|
| 8 | EE | Bhargab B. Bhattacharya,
Alexej Dmitriev,
Michael Gössel:
Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output.
IEEE Trans. Computers 52(12): 1646-1651 (2003) |
| 2002 |
|---|
| 7 | EE | Alexej Dmitriev,
Michael Gössel,
Krishnendu Chakrabarty:
Robust Space Compaction of Test Responses.
Asian Test Symposium 2002: 254-259 |
| 6 | EE | Bhargab B. Bhattacharya,
Alexej Dmitriev,
Michael Gössel,
Krishnendu Chakrabarty:
Synthesis of single-output space compactors for scan-based sequential circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(10): 1171-1179 (2002) |
| 2001 |
|---|
| 5 | EE | Bhargab B. Bhattacharya,
Alexej Dmitriev,
Michael Gössel,
Krishnendu Chakrabarty:
Synthesis of single-output space compactors with application to scan-based IP cores.
ASP-DAC 2001: 496-502 |
| 2000 |
|---|
| 4 | EE | Michael Gössel,
Alexej Dmitriev,
Vl. V. Saposhnikov,
V. V. Saposhnikov:
A New Method for Concurrent Checking by Use of a 1-out-of-4 Code.
IOLTW 2000: 147-152 |
| 3 | EE | Bhargab B. Bhattacharya,
Alexej Dmitriev,
Michael Gössel:
Zero-Aliasing Space Compression using a Single Periodic Output and its Application to Testing of Embedded Cores.
VLSI Design 2000: 382-391 |
| 1998 |
|---|
| 2 | EE | Vl. V. Saposhnikov,
V. V. Saposhnikov,
Alexej Dmitriev,
Michael Gössel:
Self-Dual Duplication for Error Detection.
Asian Test Symposium 1998: 296-300 |
| 1996 |
|---|
| 1 | EE | Vl. V. Saposhnikov,
Alexej Dmitriev,
Michael Gössel,
V. V. Saposhnikov:
Self-dual parity checking-A new method for on-line testing.
VTS 1996: 162-168 |
