| 2008 |
|---|
| 4 | EE | Mahmut Yilmaz,
Krishnendu Chakrabarty,
Mohammad Tehranipoor:
Test-Pattern Grading and Pattern Selection for Small-Delay Defects.
VTS 2008: 233-239 |
| 2007 |
|---|
| 3 | EE | Mahmut Yilmaz,
Albert Meixner,
Sule Ozev,
Daniel J. Sorin:
Lazy Error Detection for Microprocessor Functional Units.
DFT 2007: 361-369 |
| 2 | EE | Sule Ozev,
Daniel J. Sorin,
Mahmut Yilmaz:
Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor.
ICCD 2007: 317-324 |
| 2006 |
|---|
| 1 | EE | Fred A. Bower,
Derek Hower,
Mahmut Yilmaz,
Daniel J. Sorin,
Sule Ozev:
Applying architectural vulnerability Analysis to hard faults in the microprocessor.
SIGMETRICS/Performance 2006: 375-376 |
