ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 8

Volume 8, Number 1, January 2003

• Spyros Tragoudas, N. Denny:
  Path delay fault testing using test points. 1-10
  Electronic Edition (ACM DL) BibTeX
• Yao-Wen Chang, Kai Zhu, Guang-Ming Wu, D. F. Wong, C. K. Wong:
  Analysis of FPGA/FPIC switch modules. 11-37
  Electronic Edition (ACM DL) BibTeX
• Wen-Ben Jone, Jinn-Shyan Wang, Hsueh-I Lu, I. P. Hsu, J.-Y. Chen:
  Design theory and implementation for low-power segmented bus systems. 38-54
  Electronic Edition (ACM DL) BibTeX
• Bo Yao, Hongyu Chen, Chung-Kuan Cheng, Ronald L. Graham:
  Floorplan representations: Complexity and connections. 55-80
  Electronic Edition (ACM DL) BibTeX
• Michael A. Riepe, Karem A. Sakallah:
  Transistor placement for noncomplementary digital VLSI cell synthesis. 81-107
  Electronic Edition (ACM DL) BibTeX
• Ronald D. Blanton, John P. Hayes:
  On the properties of the input pattern fault model. 108-124
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• Tanja Van Achteren, Francky Catthoor, Rudy Lauwereins, Geert Deconinck:
  Search space definition and exploration for nonuniform data reuse opportunities in data-dominant applications. 125-139
  Electronic Edition (ACM DL) BibTeX

Volume 8, Number 2, April 2003

• Stephen A. Edwards:
  Tutorial: Compiling concurrent languages for sequential processors. 141-187
  Electronic Edition (ACM DL) BibTeX
• Guang-Ming Wu, Yun-Chih Chang, Yao-Wen Chang:
  Rectilinear block placement using B^*-trees. 188-202
  Electronic Edition (ACM DL) BibTeX
• Ki-Wook Kim, Seong-Ook Jung, Taewhan Kim, Sung-Mo Kang:
  Minimum delay optimization for domino circuits - a coupling-aware approach. 202-213
  Electronic Edition (ACM DL) BibTeX
• Ali Pinar, C. L. Liu:
  Compacting sequences with invariant transition frequencies. 214-221
  Electronic Edition (ACM DL) BibTeX
• Vigyan Singhal, Carl Pixley, Adnan Aziz, Shaz Qadeer, Robert K. Brayton:
  Sequential optimization in the absence of global reset. 222-251
  Electronic Edition (ACM DL) BibTeX
• Chingren Lee, Jenq Kuen Lee, TingTing Hwang, Shi-Chun Tsai:
  Compiler optimization on VLIW instruction scheduling for low power. 252-268
  Electronic Edition (ACM DL) BibTeX

Volume 8, Number 3, July 2003

• Marisa Luisa López-Vallejo, Juan Carlos López:
  On the hardware-software partitioning problem: System modeling and partitioning techniques. 269-297
  Electronic Edition (ACM DL) BibTeX
• Stefan Thomas Obenaus, Ted H. Szymanski:
  Gravity: Fast placement for 3-D VLSI. 298-315
  Electronic Edition (ACM DL) BibTeX
• Xiaojian Yang, Maogang Wang, Ryan Kastner, Soheil Ghiasi, Majid Sarrafzadeh:
  Congestion reduction during placement with provably good approximation bound. 316-333
  Electronic Edition (ACM DL) BibTeX
• George A. Constantinides, Peter Y. K. Cheung, Wayne Luk:
  Synthesis of saturation arithmetic architectures. 334-354
  Electronic Edition (ACM DL) BibTeX
• Krzysztof Kuchcinski:
  Constraints-driven scheduling and resource assignment. 355-383
  Electronic Edition (ACM DL) BibTeX
• J.-Y. Lee, I.-C. Park:
  Address code generation for DSP instruction-set architectures. 384-395
  Electronic Edition (ACM DL) BibTeX

Volume 8, Number 4, October 2003

• Shishpal Rawat, Hans-Joachim Wunderlich:
  Introduction. 397-398
  Electronic Edition (ACM DL) BibTeX
• Sandeep Kumar Goel, Erik Jan Marinissen:
  SOC test architecture design for efficient utilization of test bandwidth. 399-429
  Electronic Edition (ACM DL) BibTeX
• Aiman H. El-Maleh, Yahya E. Osais:
  Test vector decomposition-based static compaction algorithms for combinational circuits. 430-459
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• Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz:
  On test data volume reduction for multiple scan chain designs. 460-469
  Electronic Edition (ACM DL) BibTeX
• Lei Li, Krishnendu Chakrabarty, Nur A. Touba:
  Test data compression using dictionaries with selective entries and fixed-length indices. 470-490
  Electronic Edition (ACM DL) BibTeX
• Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan:
  Multimode scan: Test per clock BIST for IP cores. 491-505
  Electronic Edition (ACM DL) BibTeX
• Muhammad Nummer, Manoj Sachdev:
  Testing high-performance pipelined circuits with slow-speed testers. 506-521
  Electronic Edition (ACM DL) BibTeX
• Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger:
  BIST and production testing of ADCs using imprecise stimulus. 522-545
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• Zhuo Li, Xiang Lu, Wangqi Qiu, Weiping Shi, D. M. H. Walker:
  A circuit level fault model for resistive bridges. 546-559
  Electronic Edition (ACM DL) BibTeX
• Dirk Niggemeyer, Elizabeth M. Rudnick:
  A data acquisition methodology for on-chip repair of embedded memories. 560-576
  Electronic Edition (ACM DL) BibTeX
• Gustavo Neuberger, Fernanda Gusmão de Lima Kastensmidt, Luigi Carro, Ricardo Augusto da Luz Reis:
  A multiple bit upset tolerant SRAM memory. 577-590
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