| 2008 |
|---|
| 55 | EE | Bogdan F. Romanescu,
Michael E. Bauer,
Sule Ozev,
Daniel J. Sorin:
Reducing the impact of intra-core process variability with criticality-based resource allocation and prefetching.
Conf. Computing Frontiers 2008: 129-138 |
| 54 | EE | Ender Yilmaz,
Sule Ozev:
Dynamic test scheduling for analog circuits for improved test quality.
ICCD 2008: 227-233 |
| 53 | EE | Erdem Serkan Erdogan,
Sule Ozev,
Philippe Cauvet:
Diagnosis of assembly failures for System-in-Package RF tuners.
ISCAS 2008: 2286-2289 |
| 52 | EE | Erdem Serkan Erdogan,
Sule Ozev:
Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers.
VTS 2008: 209-214 |
| 51 | EE | Fang Liu,
Sule Ozev,
Plamen K. Nikolov:
Parametric variability analysis for multistage analog circuits using analytical sensitivity modeling.
ACM Trans. Design Autom. Electr. Syst. 13(2): (2008) |
| 50 | EE | Erkan Acar,
Sule Ozev:
Defect-Oriented Testing of RF Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(5): 920-931 (2008) |
| 2007 |
|---|
| 49 | EE | Sudarshan Bahukudumbi,
Sule Ozev,
Krishnendu Chakrabarty,
Vikram Iyengar:
AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs.
ASP-DAC 2007: 823-828 |
| 48 | EE | Erdem Serkan Erdogan,
Sule Ozev:
An ADC-BiST scheme using sequential code analysis.
DATE 2007: 713-718 |
| 47 | EE | Mahmut Yilmaz,
Albert Meixner,
Sule Ozev,
Daniel J. Sorin:
Lazy Error Detection for Microprocessor Functional Units.
DFT 2007: 361-369 |
| 46 | EE | Sule Ozev,
Daniel J. Sorin,
Mahmut Yilmaz:
Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor.
ICCD 2007: 317-324 |
| 45 | EE | Erkan Acar,
Sule Ozev:
Digital calibration of RF transceivers for I-Q imbalances and nonlinearity.
ICCD 2007: 512-517 |
| 44 | EE | Bogdan F. Romanescu,
Michael E. Bauer,
Daniel J. Sorin,
Sule Ozev:
Reducing the Impact of Process Variability with Prefetching and Criticality-Based Resource Allocation.
PACT 2007: 424 |
| 43 | EE | Erkan Acar,
Sule Ozev,
Kevin B. Redmond:
A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up.
VTS 2007: 3-8 |
| 42 | EE | Anuja Sehgal,
Fang Liu,
Sule Ozev,
Krishnendu Chakrabarty:
Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores
CoRR abs/0710.4686: (2007) |
| 41 | EE | Jonathan R. Carter,
Sule Ozev,
Daniel J. Sorin:
Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown
CoRR abs/0710.4715: (2007) |
| 40 | EE | Erkan Acar,
Sule Ozev:
Go/No-Go Testing of VCO Modulation RF Transceivers Through the Delayed-RF Setup.
IEEE Trans. VLSI Syst. 15(1): 37-47 (2007) |
| 39 | EE | Fang Liu,
Sule Ozev:
Statistical Test Development for Analog Circuits Under High Process Variations.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(8): 1465-1477 (2007) |
| 38 | EE | Fred A. Bower,
Daniel J. Sorin,
Sule Ozev:
Online diagnosis of hard faults in microprocessors.
TACO 4(2): (2007) |
| 2006 |
|---|
| 37 | EE | Erkan Acar,
Sule Ozev,
Kevin B. Redmond:
Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers.
ICCAD 2006: 210-216 |
| 36 | EE | Erkan Acar,
Sule Ozev:
Efficient Testing of RF MIMO Transceivers Used in WLAN Applications.
ICCD 2006 |
| 35 | EE | Fred A. Bower,
Derek Hower,
Mahmut Yilmaz,
Daniel J. Sorin,
Sule Ozev:
Applying architectural vulnerability Analysis to hard faults in the microprocessor.
SIGMETRICS/Performance 2006: 375-376 |
| 34 | EE | Fang Liu,
Plamen K. Nikolov,
Sule Ozev:
Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework.
VTS 2006: 272-277 |
| 33 | EE | Fei Su,
Sule Ozev,
Krishnendu Chakrabarty:
Concurrent testing of digital microfluidics-based biochips.
ACM Trans. Design Autom. Electr. Syst. 11(2): 442-464 (2006) |
| 32 | EE | Anuja Sehgal,
Sule Ozev,
Krishnendu Chakrabarty:
Test infrastructure design for mixed-signal SOCs with wrapped analog cores.
IEEE Trans. VLSI Syst. 14(3): 292-304 (2006) |
| 31 | EE | Fang Liu,
Sule Ozev,
Martin A. Brooke:
Identifying the Source of BW Failures in High-Frequency Linear Analog Circuits Based on S-Parameter Measurements.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2594-2605 (2006) |
| 30 | EE | Fei Su,
Sule Ozev,
Krishnendu Chakrabarty:
Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems.
J. Electronic Testing 22(2): 199-210 (2006) |
| 2005 |
|---|
| 29 | EE | Fang Liu,
Sule Ozev:
Hierarchical analysis of process variation for mixed-signal systems.
ASP-DAC 2005: 465-470 |
| 28 | EE | Fang Liu,
Jacob J. Flomenberg,
Devaka V. Yasaratne,
Sule Ozev:
Hierarchical Variance Analysis for Analog Circuits Based on Graph Modelling and Correlation Loop Tracing.
DATE 2005: 126-131 |
| 27 | EE | Jonathan R. Carter,
Sule Ozev,
Daniel J. Sorin:
Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown.
DATE 2005: 300-305 |
| 26 | EE | Anuja Sehgal,
Fang Liu,
Sule Ozev,
Krishnendu Chakrabarty:
Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores.
DATE 2005: 50-55 |
| 25 | | Erkan Acar,
Sule Ozev:
Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions.
ICCAD 2005: 73-79 |
| 24 | EE | Anuja Sehgal,
Sule Ozev,
Krishnendu Chakrabarty:
A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs.
ICCD 2005: 137-142 |
| 23 | EE | Fang Liu,
Sule Ozev:
Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits.
ICCD 2005: 161-170 |
| 22 | EE | Fred A. Bower,
Daniel J. Sorin,
Sule Ozev:
A Mechanism for Online Diagnosis of Hard Faults in Microprocessors.
MICRO 2005: 197-208 |
| 21 | EE | Erkan Acar,
Sule Ozev:
Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements.
VTS 2005: 374-379 |
| 20 | EE | Fred A. Bower,
Sule Ozev,
Daniel J. Sorin:
Autonomic Microprocessor Execution via Self-Repairing Arrays.
IEEE Trans. Dependable Sec. Comput. 2(4): 297-310 (2005) |
| 2004 |
|---|
| 19 | EE | Fred A. Bower,
Paul G. Shealy,
Sule Ozev,
Daniel J. Sorin:
Tolerating Hard Faults in Microprocessor Array Structures.
DSN 2004: 51-60 |
| 18 | EE | Fang Liu,
Sule Ozev,
Martin A. Brooke:
Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search.
ICCAD 2004: 641-647 |
| 17 | EE | Sule Ozev,
Alex Orailoglu:
End-to-End Testability Analysis and DfT Insertion for Mixed-Signal Paths.
ICCD 2004: 72-77 |
| 16 | EE | Erkan Acar,
Sule Ozev:
Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis.
ITC 2004: 783-792 |
| 15 | EE | Sule Ozev,
Christian Olgaard:
Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures.
VTS 2004: 217-222 |
| 14 | EE | Sule Ozev,
Ismet Bayraktaroglu,
Alex Orailoglu:
Seamless Test of Digital Components in Mixed-Signal Paths.
IEEE Design & Test of Computers 21(1): 44-55 (2004) |
| 13 | EE | Sule Ozev,
Alex Orailoglu:
Design of concurrent test Hardware for Linear analog circuits with constrained hardware overhead.
IEEE Trans. VLSI Syst. 12(7): 756-765 (2004) |
| 2003 |
|---|
| 12 | EE | Anuja Sehgal,
Sule Ozev,
Krishnendu Chakrabarty:
TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers.
ICCAD 2003: 95-99 |
| 11 | EE | Fei Su,
Sule Ozev,
Krishnendu Chakrabarty:
Testing of Droplet-Based Microelectrofluidic Systems.
ITC 2003: 1192-1200 |
| 10 | EE | Sule Ozev,
Alex Orailoglu:
Statistical Tolerance Analysis for Assured Analog Test Coverage.
J. Electronic Testing 19(2): 173-182 (2003) |
| 2002 |
|---|
| 9 | EE | Sule Ozev,
Alex Orailoglu:
Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits.
ICCD 2002: 258-264 |
| 8 | EE | Sule Ozev,
Alex Orailoglu,
Hosam Haggag:
Automated test development and test time reduction for RF subsystems.
ISCAS (1) 2002: 581-584 |
| 7 | EE | Sule Ozev,
Alex Orailoglu:
An Integrated Tool for Analog Test Generation and Fault Simulation.
ISQED 2002: 267-272 |
| 6 | EE | Sule Ozev,
Alex Orailoglu:
Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis.
VTS 2002: 213-222 |
| 5 | EE | Sule Ozev,
Christian Olgaard,
Alex Orailoglu:
Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers.
IEEE Design & Test of Computers 19(5): 82-91 (2002) |
| 2001 |
|---|
| 4 | | Christian Olgaard,
Sule Ozev,
Alex Orailoglu:
Testability implications in low-cost integrated radio transceivers: a Bluetooth case study.
ITC 2001: 965-974 |
| 2000 |
|---|
| 3 | EE | Sule Ozev,
Ismet Bayraktaroglu,
Alex Orailoglu:
Test Synthesis for Mixed-Signal SOC Paths.
DATE 2000: 128-133 |
| 2 | EE | Sule Ozev,
Alex Orailoglu:
Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems.
VTS 2000: 149-156 |
| 1999 |
|---|
| 1 | EE | Sule Ozev,
Alex Orailoglu:
Low-Cost Test for Large Analog IC's.
DFT 1999: 101- |
