2009 |
14 | EE | Sandeep Kumar Goel,
Erik Jan Marinissen,
Anuja Sehgal,
Krishnendu Chakrabarty:
Testing of SoCs with Hierarchical Cores: Common Fallacies, Test Access Optimization, and Test Scheduling.
IEEE Trans. Computers 58(3): 409-423 (2009) |
2008 |
13 | EE | Anuja Sehgal,
Sudarshan Bahukudumbi,
Krishnendu Chakrabarty:
Power-aware SoC test planning for effective utilization of port-scalable testers.
ACM Trans. Design Autom. Electr. Syst. 13(3): (2008) |
2007 |
12 | EE | Anuja Sehgal,
Fang Liu,
Sule Ozev,
Krishnendu Chakrabarty:
Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores
CoRR abs/0710.4686: (2007) |
11 | EE | Anuja Sehgal,
Krishnendu Chakrabarty:
Optimization of Dual-Speed TAM Architectures for Efficient Modular Testing of SOCs.
IEEE Trans. Computers 56(1): 120-133 (2007) |
2006 |
10 | EE | Anuja Sehgal,
Sandeep Kumar Goel,
Erik Jan Marinissen,
Krishnendu Chakrabarty:
Hierarchy-aware and area-efficient test infrastructure design for core-based system chips.
DATE 2006: 285-290 |
9 | EE | Anuja Sehgal,
Sule Ozev,
Krishnendu Chakrabarty:
Test infrastructure design for mixed-signal SOCs with wrapped analog cores.
IEEE Trans. VLSI Syst. 14(3): 292-304 (2006) |
2005 |
8 | EE | Anuja Sehgal,
Fang Liu,
Sule Ozev,
Krishnendu Chakrabarty:
Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores.
DATE 2005: 50-55 |
7 | | Anuja Sehgal,
Krishnendu Chakrabarty:
Test planning for the effective utilization of port-scalable testers for heterogeneous core-based SOCs.
ICCAD 2005: 88-93 |
6 | EE | Anuja Sehgal,
Sule Ozev,
Krishnendu Chakrabarty:
A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs.
ICCD 2005: 137-142 |
2004 |
5 | EE | Anuja Sehgal,
Krishnendu Chakrabarty:
Efficient Modular Testing of SOCs Using Dual-Speed TAM Architectures.
DATE 2004: 422-427 |
4 | EE | Anuja Sehgal,
Sandeep Kumar Goel,
Erik Jan Marinissen,
Krishnendu Chakrabarty:
IEEE P1500-Compliant Test Wrapper Design for Hierarchical Cores.
ITC 2004: 1203-1212 |
3 | EE | Anuja Sehgal,
Vikram Iyengar,
Krishnendu Chakrabarty:
SOC test planning using virtual test access architectures.
IEEE Trans. VLSI Syst. 12(12): 1263-1276 (2004) |
2003 |
2 | EE | Anuja Sehgal,
Vikram Iyengar,
Mark D. Krasniewski,
Krishnendu Chakrabarty:
Test cost reduction for SOCs using virtual TAMs and lagrange multipliers.
DAC 2003: 738-743 |
1 | EE | Anuja Sehgal,
Sule Ozev,
Krishnendu Chakrabarty:
TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers.
ICCAD 2003: 95-99 |