2008 |
11 | EE | Hiroshi Date,
Tokuro Matsuo:
Effects of At-Home Nursing Service Scheduling in Multiagent Systems.
New Challenges in Applied Intelligence Technologies 2008: 245-254 |
2003 |
10 | EE | Toshinori Hosokawa,
Hiroshi Date,
Masahide Miyazaki,
Michiaki Muraoka,
Hideo Fujiwara:
A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint.
Asian Test Symposium 2003: 130-135 |
9 | EE | Masahide Miyazaki,
Toshinori Hosokawa,
Hiroshi Date,
Michiaki Muraoka,
Hideo Fujiwara:
A DFT Selection Method for Reducing Test Application Time of System-on-Chips.
Asian Test Symposium 2003: 412-417 |
2002 |
8 | EE | Hiroshi Date,
Toshinori Hosokawa,
Michiaki Muraoka:
A SoC Test Strategy Based on a Non-Scan DFT Method.
Asian Test Symposium 2002: 305-310 |
7 | EE | Toshinori Hosokawa,
Hiroshi Date,
Michiaki Muraoka:
A State Reduction Method for Non-Scan Based FSM Testing with Don't Care Inputs Identification Technique.
Asian Test Symposium 2002: 55-60 |
6 | EE | Toshinori Hosokawa,
Hiroshi Date,
Michiaki Muraoka:
A Test Generation Method Using a Compacted Test Table and a Test Generation Method Using a Compacted Test Plan Table for RTL Data Path Circuits.
VTS 2002: 328-335 |
2000 |
5 | EE | Makoto Sugihara,
Hiroto Yasuura,
Hiroshi Date:
Analysis and Minimization of Test Time in a Combined BIST and External Test Approach.
DATE 2000: 134-140 |
4 | | Hiroshi Date,
Vikram Iyengar,
Krishnendu Chakrabarty,
Makoto Sugihara:
Mathematical Modeling of Intellectual Property Protection Using Partially-Mergeable Cores.
PDPTA 2000 |
1998 |
3 | EE | Makoto Sugihara,
Hiroshi Date,
Hiroto Yasuura:
A novel test methodology for core-based system LSIs and a testing time minimization problem.
ITC 1998: 465- |
1995 |
2 | EE | Hiroshi Date,
Michinobu Nakao,
Kazumi Hatayama:
A parallel sequential test generation system DESCARTES based on real-valued logic simulation.
Asian Test Symposium 1995: 252-258 |
1992 |
1 | | Hiroshi Date,
Yukinori Matsumoto,
Kouichi Kimura,
Kazuo Taki,
Hiroo Kato,
Masahiro Hoshi:
LSI-CAD Programs on Parallel Inference Machine.
FGCS 1992: 237-247 |