Richard Kacprowicz
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2008
1
EE
Sudarshan Bahukudumbi
,
Krishnendu Chakrabarty
, Richard Kacprowicz: Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs.
DATE 2008
: 1103-1106
Coauthor
Index
1
Sudarshan Bahukudumbi
[
1
]
2
Krishnendu Chakrabarty
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)