Seongmoon Wang

2008
28	EE	Seongmoon Wang, Kedarnath J. Balakrishnan, Wenlong Wei: X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors. IEEE Trans. Computers 57(7): 978-989 (2008)
27	EE	Seongmoon Wang, Wenlong Wei: An Efficient Unknown BlockingScheme for Low Control Data Volume and High Observability. IEEE Trans. on CAD of Integrated Circuits and Systems 27(11): 2039-2052 (2008)
2007
26	EE	Seongmoon Wang, Wenlong Wei: A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limited Capture. ASP-DAC 2007: 810-816
25	EE	Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang: SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. DATE 2007: 201-206
24	EE	Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar: Unknown blocking scheme for low control data volume and high observability. DATE 2007: 33-38
23	EE	Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei: A hybrid scheme for compacting test responses with unknown values. ICCAD 2007: 513-519
22	EE	Rajamani Sethuram, Seongmoon Wang, Srimat T. Chakradhar, Michael L. Bushnell: Zero Cost Test Point Insertion Technique for Structured ASICs. VLSI Design 2007: 357-363
21	EE	Seongmoon Wang: A BIST TPG for Low Power Dissipation and High Fault Coverage. IEEE Trans. VLSI Syst. 15(7): 777-789 (2007)
2006
20	EE	Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei: Unknown-tolerance analysis and test-quality control for test response compaction using space compactors. DAC 2006: 1083-1088
19	EE	Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar: Efficient unknown blocking using LFSR reseeding. DATE 2006: 1051-1052
18	EE	Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei, Kwang-Ting Cheng: Coverage loss by using space compactors in presence of unknown values. DATE 2006: 1053-1054
17	EE	Kedarnath J. Balakrishnan, Seongmoon Wang, Srimat T. Chakradhar: PIDISC: Pattern Independent Design Independent Seed Compression Technique. VLSI Design 2006: 811-817
16	EE	Seongmoon Wang, Srimat T. Chakradhar: A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs. IEEE Trans. on CAD of Integrated Circuits and Systems 25(8): 1555-1564 (2006)
15	EE	Seongmoon Wang, Sandeep K. Gupta: LT-RTPG: a new test-per-scan BIST TPG for low switching activity. IEEE Trans. on CAD of Integrated Circuits and Systems 25(8): 1565-1574 (2006)
2005
14		Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng: Response shaper: a novel technique to enhance unknown tolerance for output response compaction. ICCAD 2005: 80-87
13	EE	Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng: ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values. ICCD 2005: 147-152
12	EE	Wei Li, Seongmoon Wang, Srimat T. Chakradhar, Sudhakar M. Reddy: Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage. VLSI Design 2005: 471-478
2004
11	EE	Seongmoon Wang, Srimat T. Chakradhar, Kedarnath J. Balakrishnan: Re-configurable embedded core test protocol. ASP-DAC 2004: 234-237
10	EE	Seongmoon Wang, Xiao Liu, Srimat T. Chakradhar: Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets. DATE 2004: 1296-1301
2003
9	EE	Seongmoon Wang, Srimat T. Chakradhar: A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay Fault Coverage for Standard Scan Designs. ITC 2003: 574-583
2002
8	EE	Seongmoon Wang: Generation of Low Power Dissipation and High Fault Coverage Patterns for Scan-Based BIST. ITC 2002: 834-843
7	EE	Seongmoon Wang, Sandeep K. Gupta: DS-LFSR: a BIST TPG for low switching activity. IEEE Trans. on CAD of Integrated Circuits and Systems 21(7): 842-851 (2002)
6	EE	Seongmoon Wang, Sandeep K. Gupta: An automatic test pattern generator for minimizing switching activity during scan testing activity. IEEE Trans. on CAD of Integrated Circuits and Systems 21(8): 954-968 (2002)
1999
5		Seongmoon Wang, Sandeep K. Gupta: LT-RTPG: a new test-per-scan BIST TPG for low heat dissipation. ITC 1999: 85-94
1998
4		Seongmoon Wang, Sandeep K. Gupta: ATPG for Heat Dissipation Minimization During Test Application. IEEE Trans. Computers 47(2): 256-262 (1998)
1997
3	EE	Seongmoon Wang, Sandeep K. Gupta: ATPG for Heat Dissipation Minimization During Scan Testing. DAC 1997: 614-619
2		Seongmoon Wang, Sandeep K. Gupta: DS-LFSR: A New BIST TPG for Low Heat Dissipation. ITC 1997: 848-857
1994
1		Seongmoon Wang, Sandeep K. Gupta: ATPG for Heat Dissipation Minimization During Test Application. ITC 1994: 250-258

Coauthor Index

1	Kedarnath J. Balakrishnan	[11] [17] [19] [28]
2	Michael L. Bushnell	[22]
3	Krishnendu Chakrabarty	[25]
4	Srimat T. Chakradhar	[9] [10] [11] [12] [13] [14] [16] [17] [18] [19] [20] [22] [23] [24]
5	Mango Chia-Tso Chao	[13] [14] [18] [20] [23]
6	Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng)	[13] [14] [18] [20] [23]
7	Sandeep K. Gupta	[1] [2] [3] [4] [5] [6] [7] [15]
8	Wei Li	[12]
9	Xiao Liu	[10]
10	Sudhakar M. Reddy	[12]
11	Rajamani Sethuram	[22]
12	Zhanglei Wang	[25]
13	Wenlong Wei	[18] [20] [23] [24] [26] [27] [28]

Colors in the list of coauthors