2009 |
34 | EE | Qiang Xu,
Yubin Zhang,
Krishnendu Chakrabarty:
SOC test-architecture optimization for the testing of embedded cores and signal-integrity faults on core-external interconnects.
ACM Trans. Design Autom. Electr. Syst. 14(1): (2009) |
2008 |
33 | EE | Shan Tang,
Qiang Xu:
A debug probe for concurrently debugging multiple embedded cores and inter-core transactions in NoC-based systems.
ASP-DAC 2008: 416-421 |
32 | EE | Jia Li,
Qiang Xu,
Yu Hu,
Xiaowei Li:
On reducing both shift and capture power for scan-based testing.
ASP-DAC 2008: 653-658 |
31 | EE | Lin Huang,
Feng Yuan,
Qiang Xu:
On reliable modular testing with vulnerable test access mechanisms.
DAC 2008: 834-839 |
30 | EE | Jia Li,
Qiang Xu,
Yu Hu,
Xiaowei Li:
iFill: An Impact-Oriented X-Filling Method for Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing.
DATE 2008: 1184-1189 |
29 | EE | Shan Tang,
Qiang Xu:
In-band Cross-Trigger Event Transmission for Transaction-Based Debug.
DATE 2008: 414-419 |
28 | EE | Feng Yuan,
Lin Huang,
Qiang Xu:
Re-Examining the Use of Network-on-Chip as Test Access Mechanism.
DATE 2008: 808-811 |
27 | EE | Lei Zhang,
Yinhe Han,
Qiang Xu,
Xiaowei Li:
Defect Tolerance in Homogeneous Manycore Processors Using Core-Level Redundancy with Unified Topology.
DATE 2008: 891-896 |
26 | EE | Jia Li,
Qiang Xu,
Yu Hu,
Xiaowei Li:
Channel Width Utilization Improvement in Testing NoC-Based Systems for Test Time Reduction.
DELTA 2008: 26-31 |
25 | EE | Qiang Xu,
Jaspal Subhlok:
Construction and Evaluation of Coordinated Performance Skeletons.
HiPC 2008: 73-86 |
24 | EE | Jia Li,
Xiao Liu,
Yubin Zhang,
Yu Hu,
Xiaowei Li,
Qiang Xu:
On capture power-aware test data compression for scan-based testing.
ICCAD 2008: 67-72 |
23 | | Jaspal Subhlok,
Qiang Xu:
Automatic construction of coordinated performance skeletons.
IPDPS 2008: 1-5 |
22 | EE | Sukhdeep Sodhi,
Jaspal Subhlok,
Qiang Xu:
Performance prediction with skeletons.
Cluster Computing 11(2): 151-165 (2008) |
21 | EE | Jing-Ling Yang,
Qiang Xu:
State-Sensitive X-Filling Scheme for Scan Capture Power Reduction.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(7): 1338-1343 (2008) |
2007 |
20 | EE | Qiang Xu,
Yubin Zhang,
Krishnendu Chakrabarty:
SOC Test Architecture Optimization for Signal Integrity Faults on Core-External Interconnects.
DAC 2007: 676-681 |
19 | EE | Shan Tang,
Qiang Xu:
A multi-core debug platform for NoC-based systems.
DATE 2007: 870-875 |
18 | EE | Xiucheng Dong,
Haibin Wang,
Qiang Xu,
Xiaoxiao Zhao:
Research on Applications of a New-Type Fuzzy-Neural Network Controller.
LSMS (1) 2007: 679-687 |
17 | EE | Qiang Xu,
Nicola Nicolici,
Krishnendu Chakrabarty:
Test Wrapper Design and Optimization Under Power Constraints for Embedded Cores With Multiple Clock Domains.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(8): 1539-1547 (2007) |
2006 |
16 | EE | Qiang Xu,
Baosheng Wang,
F. Y. Young:
Retention-Aware Test Scheduling for BISTed Embedded SRAMs.
European Test Symposium 2006: 83-88 |
15 | EE | Qiang Xu,
Nicola Nicolici:
DFT Infrastructure for Broadside Two-Pattern Test of Core-Based SOCs.
IEEE Trans. Computers 55(4): 470-485 (2006) |
14 | EE | Qiang Xu,
Nicola Nicolici:
Multifrequency TAM design for hierarchical SOCs.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(1): 181-196 (2006) |
2005 |
13 | EE | Ho Fai Ko,
Qiang Xu,
Nicola Nicolici:
Register-transfer level functional scan for hierarchical designs.
ASP-DAC 2005: 1172-1175 |
12 | EE | Qiang Xu,
Nicola Nicolici,
Krishnendu Chakrabarty:
Multi-frequency wrapper design and optimization for embedded cores under average power constraints.
DAC 2005: 123-128 |
11 | EE | Qiang Xu,
Jaspal Subhlok:
Automatic clustering of grid nodes.
GRID 2005: 227-233 |
10 | EE | Qiang Xu,
Nicola Nicolici:
Modular and rapid testing of SOCs with unwrapped logic blocks.
IEEE Trans. VLSI Syst. 13(11): 1275-1285 (2005) |
9 | EE | Qiang Xu,
Nicola Nicolici:
Wrapper design for multifrequency IP cores.
IEEE Trans. VLSI Syst. 13(6): 678-685 (2005) |
8 | EE | Qiang Xu,
Nicola Nicolici:
Modular SOC testing with reduced wrapper count.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(12): 1894-1908 (2005) |
2004 |
7 | EE | Qiang Xu,
Nicola Nicolici:
Multi-Frequency Test Access Mechanism Design for Modular SOC Testing.
Asian Test Symposium 2004: 2-7 |
6 | EE | Qiang Xu,
Nicola Nicolici:
Wrapper Design for Testing IP Cores with Multiple Clock Domains.
DATE 2004: 416-421 |
5 | EE | Qiang Xu:
Content Management and Resources Integration: A Practice in Shanghai Digital Library.
ICADL 2004: 25-34 |
4 | EE | Qiang Xu,
Nicola Nicolici:
Time/Area Tradeoffs in Testing Hierarchical SOCs With Hard Mega-Cores.
ITC 2004: 1196-1202 |
2003 |
3 | EE | Qiang Xu,
Nicola Nicolici:
Delay Fault Testing of Core-Based Systems-on-a-Chi.
DATE 2003: 10744-10752 |
2 | EE | Bai Hong Fang,
Qiang Xu,
Nicola Nicolici:
Hardware/Software Co-testing of Embedded Memories in Complex SOCs.
ICCAD 2003: 599-606 |
1 | EE | Qiang Xu,
Nicola Nicolici:
On Reducing Wrapper Boundary Register Cells in Modular SOC Testing.
ITC 2003: 622-631 |