| 2009 |
|---|
| 9 | EE | Zhanglei Wang,
Hongxia Fang,
Krishnendu Chakrabarty,
Michael Bienek:
Deviation-Based LFSR Reseeding for Test-Data Compression.
IEEE Trans. on CAD of Integrated Circuits and Systems 28(2): 259-271 (2009) |
| 2008 |
|---|
| 8 | EE | Zhanglei Wang,
Krishnendu Chakrabarty:
Test Data Compression Using Selective Encoding of Scan Slices.
IEEE Trans. VLSI Syst. 16(11): 1429-1440 (2008) |
| 7 | EE | Zhanglei Wang,
Krishnendu Chakrabarty:
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(2): 352-365 (2008) |
| 6 | EE | Nabil Badereddine,
Zhanglei Wang,
Patrick Girard,
Krishnendu Chakrabarty,
Arnaud Virazel,
Serge Pravossoudovitch,
Christian Landrault:
A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction.
J. Electronic Testing 24(4): 353-364 (2008) |
| 2007 |
|---|
| 5 | EE | Zhanglei Wang,
Krishnendu Chakrabarty,
Seongmoon Wang:
SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling.
DATE 2007: 201-206 |
| 4 | EE | Zhanglei Wang,
Krishnendu Chakrabarty,
Michael Bienek:
A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression.
European Test Symposium 2007: 125-130 |
| 3 | EE | Lei Li,
Zhanglei Wang,
Krishnendu Chakrabarty:
Scan-BIST based on cluster analysis and the encoding of repeating sequences.
ACM Trans. Design Autom. Electr. Syst. 12(1): (2007) |
| 2 | EE | Zhanglei Wang,
Krishnendu Chakrabarty:
Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics.
J. Electronic Testing 23(2-3): 145-161 (2007) |
| 2006 |
|---|
| 1 | EE | Zhanglei Wang,
Krishnendu Chakrabarty,
Michael Gössel:
Test set enrichment using a probabilistic fault model and the theory of output deviations.
DATE 2006: 1270-1275 |
