Arnaud Virazel

2009
38	EE	Youssef Benabboud, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Laroussi Bouzaida, Isabelle Izaute: A case study on logic diagnosis for System-on-Chip. ISQED 2009: 253-259
2008
37	EE	A. Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, V. Gouin: A Design-for-Diagnosis Technique for SRAM Write Drivers. DATE 2008: 1480-1485
36	EE	Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Improving Diagnosis Resolution without Physical Information. DELTA 2008: 210-215
35	EE	Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Using TMR Architectures for Yield Improvement. DFT 2008: 7-15
34	EE	A. Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, V. Gouin: An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. VTS 2008: 89-94
33	EE	Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault: A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. J. Electronic Testing 24(4): 353-364 (2008)
2007
32	EE	A. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Slow write driver faults in 65nm SRAM technology: analysis and March test solution. DATE 2007: 528-533
31		Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: A Mixed Approach for Unified Logic Diagnosis. DDECS 2007: 239-242
30	EE	Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: DERRIC: A Tool for Unified Logic Diagnosis. European Test Symposium 2007: 13-20
29	EE	O. Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories. European Test Symposium 2007: 77-84
28	EE	A. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. European Test Symposium 2007: 97-104
27	EE	A. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. VTS 2007: 361-368
26	EE	O. Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window. VTS 2007: 47-52
25	EE	Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. J. Electronic Testing 23(5): 435-444 (2007)
2006
24		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS 2006: 256-261
23	EE	Nabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Christian Landrault, Arnaud Virazel, Hans-Joachim Wunderlich: Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing. VLSI-SoC 2006: 403-408
22	EE	O. Ginez, Jean Michel Daga, Marylene Combe, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: An Overview of Failure Mechanisms in Embedded Flash Memories. VTS 2006: 108-113
21	EE	Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: A Gated Clock Scheme for Low Power Testing of Logic Cores. J. Electronic Testing 22(1): 89-99 (2006)
20	EE	Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. J. Electronic Testing 22(3): 287-296 (2006)
2005
19	EE	Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. DAC 2005: 857-862
18	EE	Nabil Badereddine, Patrick Girard, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault: Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives. PATMOS 2005: 540-549
17	EE	Nabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Christian Landrault: Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles. VLSI-SoC 2005: 267-281
16	EE	Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan: Data Retention Fault in SRAM Memories: Analysis and Detection Procedures. VTS 2005: 183-188
15	EE	Simone Borri, Magali Bastian Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. J. Electronic Testing 21(2): 169-179 (2005)
14	EE	Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. J. Electronic Testing 21(5): 551-561 (2005)
2004
13	EE	Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. Asian Test Symposium 2004: 266-271
12	EE	Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Design of Routing-Constrained Low Power Scan Chains. DATE 2004: 62-67
11	EE	Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Design of Routing-Constrained Low Power Scan Chains. DELTA 2004: 287-294
10	EE	Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri: March iC-: An Improved Version of March C- for ADOFs Detection. VTS 2004: 129-138
2003
9	EE	Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri: Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders. Asian Test Symposium 2003: 250-255
2002
8	EE	René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: On Using Efficient Test Sequences for BIST. VTS 2002: 145-152
7	EE	Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Hans-Joachim Wunderlich: High Defect Coverage with Low-Power Test Sequences in a BIST Environment. IEEE Design & Test of Computers 19(5): 44-52 (2002)
6	EE	René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Hardware Generation of Random Single Input Change Test Sequences. J. Electronic Testing 18(2): 145-157 (2002)
2001
5		René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Random Adjacent Sequences: An Efficient Solution for Logic BIST. VLSI-SOC 2001: 413-424
4	EE	Arnaud Virazel, René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Delay Fault Testing: Choosing Between Random SIC and Random MIC Test Sequences. J. Electronic Testing 17(3-4): 233-241 (2001)
2000
3	EE	Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults. IOLTW 2000: 121-126
1999
2	EE	Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel: A Scan-BIST Structure to Test Delay Faults in Sequential Circuits. J. Electronic Testing 14(1-2): 95-102 (1999)
1998
1	EE	Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel: A BIST Structure to Test Delay Faults in a Scan Environment. Asian Test Symposium 1998: 435-439

Coauthor Index

1	Nabil Badereddine	[17] [18] [23] [33]
2	Magali Bastian	[19] [24] [25] [27] [28] [32] [34] [37]
3	Youssef Benabboud	[38]
4	Yannick Bonhomme	[11] [12] [21]
5	Simone Borri	[9] [10] [13] [14] [15] [20]
6	Alberto Bosio	[30] [31] [35] [36] [38]
7	Laroussi Bouzaida	[38]
8	Krishnendu Chakrabarty	[33]
9	Marylene Combe	[22]
10	Jean Michel Daga	[22] [26] [29]
11	René David	[4] [5] [6] [8]
12	Luigi Dilillo	[9] [10] [13] [14] [15] [16] [19] [20] [24] [25]
13	O. Ginez	[22] [26] [29]
14	Patrick Girard	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [37] [38]
15	V. Gouin	[34] [37]
16	Loïs Guiller	[11] [12] [21]
17	Magali Bastian Hage-Hassan	[13] [14] [15] [16] [20]
18	Isabelle Izaute	[38]
19	Christian Landrault	[1] [2] [3] [4] [5] [6] [7] [8] [11] [12] [17] [18] [21] [22] [23] [26] [27] [28] [29] [30] [31] [32] [33] [35] [36]
20	V. Moreda	[1] [2]
21	A. Ney	[27] [28] [32] [34] [37]
22	Serge Pravossoudovitch	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [37] [38]
23	Alexandre Rousset	[30] [31] [36]
24	Julien Vial	[35]
25	Zhanglei Wang	[33]
26	Hans-Joachim Wunderlich	[7] [23]