Yasumi Doi

2005
2	EE	Yasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty: Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. ASP-DAC 2005: 59-64
2003
1	EE	Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Chakrabarty: On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume. ICCD 2003: 387-396

Coauthor Index

1	Krishnendu Chakrabarty	[1] [2]
2	Seiji Kajihara	[1] [2]
3	Lei Li	[1] [2]
4	Xiaoqing Wen	[2]