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Yasumi Doi

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2005
2EEYasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty: Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. ASP-DAC 2005: 59-64
2003
1EESeiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Chakrabarty: On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume. ICCD 2003: 387-396

Coauthor Index

1Krishnendu Chakrabarty [1] [2]
2Seiji Kajihara [1] [2]
3Lei Li [1] [2]
4Xiaoqing Wen [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)