| 2007 |
|---|
| 31 | EE | Hong Chen,
Chen Jia,
Chun Zhang,
Zhihua Wang,
Chunsheng Liu:
Power Harvesting With PZT Ceramics.
ISCAS 2007: 557-560 |
| 30 | EE | Chunsheng Liu,
Yu Huang:
Effects of Embedded Decompression and Compaction Architectures on Side-Channel Attack Resistance.
VTS 2007: 461-468 |
| 29 | EE | Chunsheng Liu,
Dominic Grenier,
Anne-Laure Jousselme,
Éloi Bossé:
Reducing Algorithm Complexity for Computing an Aggregate Uncertainty Measure.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 37(5): 669-679 (2007) |
| 28 | EE | Chunsheng Liu,
Tianxu Zhang,
Biyin Zhang:
Turbulence Degraded Images Restoration Based on Improved multiframe Iterative Loops and Data Mining.
Int. J. Image Graphics 7(3): 515-527 (2007) |
| 27 | EE | Chunsheng Liu:
Improve the Quality of Per-Test Fault Diagnosis Using Output Information.
J. Electronic Testing 23(1): 11-24 (2007) |
| 2006 |
|---|
| 26 | EE | Chunsheng Liu,
Zach Link,
Dhiraj K. Pradhan:
Reuse-based test access and integrated test scheduling for network-on-chip.
DATE 2006: 303-308 |
| 25 | EE | Chunsheng Liu,
Vikram Iyengar:
Test scheduling with thermal optimization for network-on-chip systems using variable-rate on-chip clocking.
DATE 2006: 652-657 |
| 24 | EE | Chunsheng Liu,
Tianxu Zhang:
Distributed Data Visualization Tools for Multidisciplinary Design Optimization of Aero-crafts.
PCM 2006: 953-960 |
| 23 | EE | Chunsheng Liu,
Vikram Iyengar,
Dhiraj K. Pradhan:
Thermal-Aware Testing of Network-on-Chip Using Multiple-Frequency Clocking.
VTS 2006: 46-51 |
| 22 | EE | Érika F. Cota,
Chunsheng Liu:
Constraint-Driven Test Scheduling for NoC-Based Systems.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2465-2478 (2006) |
| 21 | EE | Anne-Laure Jousselme,
Chunsheng Liu,
Dominic Grenier,
Éloi Bossé:
Measuring ambiguity in the evidence theory.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 36(5): 890-903 (2006) |
| 20 | EE | Hong-Zhong Huang,
Ping Wang,
Ming J. Zuo,
Weidong Wu,
Chunsheng Liu:
A fuzzy set based solution method for multiobjective optimal design problem of mechanical and structural systems using functional-link net.
Neural Computing and Applications 15(3-4): 239-244 (2006) |
| 2005 |
|---|
| 19 | EE | Chunsheng Liu,
Kugesh Veeraraghavant,
Vikram Iyengar:
Thermal-Aware Test Scheduling and Hot Spot Temperature Minimization for Core-Based Systems.
DFT 2005: 552-562 |
| 18 | EE | Ying-Kui Gu,
Hong-Zhong Huang,
Weidong Wu,
Chunsheng Liu:
The Fuzzy-Logic-Based Reasoning Mechanism for Product Development Process.
FSKD (2) 2005: 897-906 |
| 17 | EE | Ping Wang,
Hongzhong Huang,
Ming J. Zuo,
Weidong Wu,
Chunsheng Liu:
Functional-Link Net Based Multiobjective Fuzzy Optimization.
ISNN (1) 2005: 800-804 |
| 16 | EE | Chunsheng Liu,
Vikram Iyengar,
Jiangfan Shi,
Érika F. Cota:
Power-Aware Test Scheduling in Network-on-Chip Using Variable-Rate On-Chip Clocking.
VTS 2005: 349-354 |
| 15 | EE | Chunsheng Liu,
Krishnendu Chakrabarty:
Design and analysis of compact dictionaries for diagnosis in scan-BIST.
IEEE Trans. VLSI Syst. 13(8): 979-984 (2005) |
| 14 | EE | Dhiraj K. Pradhan,
Chunsheng Liu:
EBIST: a novel test generator with built-in fault detection capability.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(9): 1457-1466 (2005) |
| 13 | EE | Hong-Zhong Huang,
Weidong Wu,
Chunsheng Liu:
A coordination method for fuzzy multi-objective optimization of system reliability.
Journal of Intelligent and Fuzzy Systems 16(3): 213-220 (2005) |
| 2004 |
|---|
| 12 | EE | Chunsheng Liu:
An efficient method for improving the quality of per-test fault diagnosis.
ICCAD 2004: 648-651 |
| 11 | EE | Chunsheng Liu,
Weidong Wu,
Daoheng Sun:
Neural Network Based Fatigue Cracks Evolution.
ISNN (2) 2004: 826-831 |
| 10 | EE | Chunsheng Liu,
Kumar N. Dwarakanath,
Krishnendu Chakrabarty,
Ronald D. Blanton:
Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST.
ISVLSI 2004: 173-178 |
| 9 | EE | Chunsheng Liu,
Hamid Sharif,
Érika F. Cota,
Dhiraj K. Pradhan:
Test Scheduling for Network-on-Chip with BIST and Precedence Constraints.
ITC 2004: 1369-1378 |
| 8 | EE | Hong-Zhong Huang,
Xu Zhang,
Zhigang Tian,
Chunsheng Liu,
Ying-Kui Gu:
Optimal Design of Conic-Cylindrical Gear Reduction Unit Using Fuzzy Physical Programming.
Intelligent Information Processing 2004: 191-200 |
| 7 | EE | Chunsheng Liu,
Krishnendu Chakrabarty:
Compact Dictionaries for Fault Diagnosis in Scan-BIST.
IEEE Trans. Computers 53(6): 775-780 (2004) |
| 6 | EE | Chunsheng Liu,
Krishnendu Chakrabarty:
Identification of error-capturing scan cells in scan-BIST with applications to system-on-chip.
IEEE Trans. on CAD of Integrated Circuits and Systems 23(10): 1447-1459 (2004) |
| 2003 |
|---|
| 5 | EE | Dhiraj K. Pradhan,
Chunsheng Liu,
Krishnendu Chakrabarty:
EBIST: A Novel Test Generator with Built-In Fault Detection Capability.
DATE 2003: 10224-10229 |
| 4 | EE | Chunsheng Liu,
Krishnendu Chakrabarty:
A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis.
DATE 2003: 10230-10237 |
| 3 | EE | Chunsheng Liu,
Krishnendu Chakrabarty:
Compact Dictionaries for Fault Diagnosis in BIST.
ISQED 2003: 105-110 |
| 2 | EE | Chunsheng Liu,
Krishnendu Chakrabarty:
Failing vector identification based on overlapping intervals of test vectors in a scan-BIST environment.
IEEE Trans. on CAD of Integrated Circuits and Systems 22(5): 593-604 (2003) |
| 2002 |
|---|
| 1 | EE | Chunsheng Liu,
Krishnendu Chakrabarty,
Michael Gössel:
An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment.
DATE 2002: 382-386 |
