| 2009 |
|---|
| 4 | EE | Qiang Xu,
Yubin Zhang,
Krishnendu Chakrabarty:
SOC test-architecture optimization for the testing of embedded cores and signal-integrity faults on core-external interconnects.
ACM Trans. Design Autom. Electr. Syst. 14(1): (2009) |
| 2008 |
|---|
| 3 | EE | Jia Li,
Xiao Liu,
Yubin Zhang,
Yu Hu,
Xiaowei Li,
Qiang Xu:
On capture power-aware test data compression for scan-based testing.
ICCAD 2008: 67-72 |
| 2007 |
|---|
| 2 | EE | Qiang Xu,
Yubin Zhang,
Krishnendu Chakrabarty:
SOC Test Architecture Optimization for Signal Integrity Faults on Core-External Interconnects.
DAC 2007: 676-681 |
| 2004 |
|---|
| 1 | EE | Mike W. T. Wong,
Yubin Zhang:
Design and Implementation of Self-Testable Full Range Window Comparator.
Asian Test Symposium 2004: 314-318 |
