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Yubin Zhang

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2009
4EEQiang Xu, Yubin Zhang, Krishnendu Chakrabarty: SOC test-architecture optimization for the testing of embedded cores and signal-integrity faults on core-external interconnects. ACM Trans. Design Autom. Electr. Syst. 14(1): (2009)
2008
3EEJia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, Qiang Xu: On capture power-aware test data compression for scan-based testing. ICCAD 2008: 67-72
2007
2EEQiang Xu, Yubin Zhang, Krishnendu Chakrabarty: SOC Test Architecture Optimization for Signal Integrity Faults on Core-External Interconnects. DAC 2007: 676-681
2004
1EEMike W. T. Wong, Yubin Zhang: Design and Implementation of Self-Testable Full Range Window Comparator. Asian Test Symposium 2004: 314-318

Coauthor Index

1Krishnendu Chakrabarty [2] [4]
2Yu Hu [3]
3Jia Li [3]
4Xiaowei Li [3]
5Xiao Liu [3]
6Mike W. T. Wong [1]
7Qiang Xu [2] [3] [4]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)