dblp.uni-trier.de www.uni-trier.de

13. Asian Test Symposium 2004: Kenting, Taiwan

13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. IEEE Computer Society 2004, ISBN 0-7695-2235-1 BibTeX

Session A1: SOC Testing

Session B1: Low-Power Testing

Session C1: Analog BIST

Session A2: Advanced DFT

Session B2: Fault Analysis

Session C2: Cross-Talk Testing

Session A3: Functional Testing

Session B3: Logic BIST

Session C3: Fault Diagnosis

Session A4: SOC Test Scheduling

Session B4: Memory Testing

Session C4: Analog Testing

Session A5: Testable Design

Session B5: Testability Analysis

Session C5: Yield and Reliability

Session A6: Fault Tolerance

Session B6: FPGA Testing and Test Reduction

Session C6: Delay Testing

Copyright © Sat May 16 22:59:04 2009 by Michael Ley (ley@uni-trier.de)