| 2004 |
|---|
| 7 | EE | Jochen Rivoir:
Low-Cost Analog Signal Generation Using a Pulse-Density Modulated Digital ATE Channel.
Asian Test Symposium 2004: 290-295 |
| 2003 |
|---|
| 6 | EE | Jochen Rivoir:
Lowering Cost of Test: Parallel Test or Low-Cost ATE?
Asian Test Symposium 2003: 360-365 |
| 5 | EE | Erik H. Volkerink,
Ajay Khoche,
Jochen Rivoir,
Klaus D. Hilliges:
Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits.
J. Electronic Testing 19(2): 125-135 (2003) |
| 2002 |
|---|
| 4 | EE | Erik H. Volkerink,
Ajay Khoche,
Jochen Rivoir,
Klaus D. Hilliges:
Test Economics for Multi-site Test with Modern Cost Reduction Techniques.
VTS 2002: 411-416 |
| 3 | EE | Ajay Khoche,
Erik H. Volkerink,
Jochen Rivoir,
Subhasish Mitra:
Test Vector Compression Using EDA-ATE Synergies.
VTS 2002: 97-102 |
| 2001 |
|---|
| 2 | | Erik H. Volkerink,
Ajay Khoche,
Linda A. Kamas,
Jochen Rivoir,
Hans G. Kerkhoff:
Tackling test trade-offs from design, manufacturing to market using economic modeling.
ITC 2001: 1098-1107 |
| 1 | | Ajay Khoche,
Rohit Kapur,
David Armstrong,
Thomas W. Williams,
Mick Tegethoff,
Jochen Rivoir:
A new methodology for improved tester utilization.
ITC 2001: 916-923 |
