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Chin-Lung Su

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2008
5EEChin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Chien-Chung Hung, Young-Shying Chen, Ding-Yeong Wang, Yuan-Jen Lee, Ming-Jer Kao: Write Disturbance Modeling and Testing for MRAM. IEEE Trans. VLSI Syst. 16(3): 277-288 (2008)
2005
4EEChin-Lung Su, Yi-Ting Yeh, Cheng-Wen Wu: An Integrated ECC and Redundancy Repair Scheme for Memory Reliability Enhancement. DFT 2005: 81-92
2004
3EERei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang: Fail Pattern Identification for Memory Built-In Self-Repair. Asian Test Symposium 2004: 366-371
2EEChin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu: MRAM Defect Analysis and Fault Modeli. ITC 2004: 124-133
2003
1EEChin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu: A Processor-Based Built-In Self-Repair Design for Embedded Memories. Asian Test Symposium 2003: 366-371

Coauthor Index

1Yeong-Jar Chang [2] [3]
2Young-Shying Chen [5]
3Rei-Fu Huang [1] [2] [3]
4Chien-Chung Hung [2] [5]
5Ming-Jer Kao [2] [5]
6Yuan-Jen Lee [5]
7Shen-Tien Lin [3]
8Kun-Lun Luo [3]
9Chih-Wea Tsai [5]
10Ding-Yeong Wang [5]
11Cheng-Wen Wu [1] [2] [3] [4] [5]
12Wen Ching Wu [2]
13Yi-Ting Yeh [4]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)