| 2008 |
|---|
| 8 | EE | Amitava Banerjee,
Subho Chatterjee,
Amit Patra,
Siddhartha Mukhopadhyay:
An efficient approach to model distortion in weakly nonlinear Gm - C filters.
ISCAS 2008: 1312-1315 |
| 7 | EE | Jyotirmoy Ghosh,
Siddhartha Mukhopadhyay,
Amit Patra,
Barry Culpepper,
Tawen Mei:
A New Approach for Estimation of On-Resistance and Current Distribution in Power Array Layouts.
VLSI Design 2008: 331-336 |
| 2007 |
|---|
| 6 | EE | Prodip Bhowal,
Dipankar Sarkar,
Siddhartha Mukhopadhyay,
Anupam Basu:
Fault diagnosis in discrete time hybrid systems - A case study.
Inf. Sci. 177(5): 1290-1308 (2007) |
| 2005 |
|---|
| 5 | EE | Abhijit Chatterjee,
Ali Keshavarzi,
Amit Patra,
Siddhartha Mukhopadhyay:
Test Methodologies in the Deep Submicron Era -- Analog, Mixed-Signal, and RF.
VLSI Design 2005: 12-13 |
| 4 | EE | Santosh Biswas,
Siddhartha Mukhopadhyay,
Amit Patra:
A Formal Approach to On-Line Monitoring of Digital VLSI Circuits: Theory, Design and Implementation.
J. Electronic Testing 21(5): 503-537 (2005) |
| 2004 |
|---|
| 3 | EE | Santosh Biswas,
Siddhartha Mukhopadhyay,
Amit Patra:
A BIST Approach to On-Line Monitoring of Digital VLSI Circuits: A CAD Tool.
Asian Test Symposium 2004: 184-189 |
| 2 | EE | Santosh Biswas,
Siddhartha Mukhopadhyay,
Amit Patra:
Optimization of the Theory of FDD of DES for Alleviation of the State Explosion Problem and Development of CAD Tools for On-line Testing of Digital VLSI Circuits.
IOLTS 2004: 184- |
| 1 | EE | Santosh Biswas,
Siddhartha Mukhopadhyay,
Amit Patra:
A discrete event systems approach to online testing of digital VLSI circuits.
SMC (2) 2004: 1699-1704 |
