| 2008 |
|---|
| 6 | EE | Shalabh Goyal,
Abhijit Chatterjee:
Linearity Testing of A/D Converters Using Selective Code Measurement.
J. Electronic Testing 24(6): 567-576 (2008) |
| 2007 |
|---|
| 5 | EE | Shalabh Goyal,
Abhijit Chatterjee,
Michael Purtell:
A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters.
J. Electronic Testing 23(1): 95-106 (2007) |
| 2006 |
|---|
| 4 | EE | Shalabh Goyal,
Abhijit Chatterjee,
Mike Atia:
Reducing Sampling Clock Jitter to Improve SNR Measurement of A/D Converters in Production Test.
European Test Symposium 2006: 165-172 |
| 3 | EE | Donghoon Han,
Shalabh Goyal,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Low Cost Parametric Failure Diagnosis of RF Transceivers.
European Test Symposium 2006: 205-212 |
| 2005 |
|---|
| 2 | EE | Shalabh Goyal,
Michael Purtell:
Alternate Test Methodology for High Speed A/D Converter Testing on Low Cost Tester.
Asian Test Symposium 2005: 14-17 |
| 2004 |
|---|
| 1 | EE | Ganesh Srinivasan,
Shalabh Goyal,
Abhijit Chatterjee:
Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits.
Asian Test Symposium 2004: 302-307 |
