Hideyuki Ichihara

2008
23	EE	Hideyuki Ichihara, Tomoyuki Saiki, Tomoo Inoue: An Architecture of Embedded Decompressor with Reconfigurability for Test Compression. IEICE Transactions 91-D(3): 713-719 (2008)
22	EE	Tomoo Inoue, Takashi Fujii, Hideyuki Ichihara: A Self-Test of Dynamically Reconfigurable Processors with Test Frames. IEICE Transactions 91-D(3): 756-762 (2008)
2007
21	EE	Tomoo Inoue, Takashi Fujii, Hideyuki Ichihara: Optimal Contexts for the Self-Test of Coarse Grain Dynamically Reconfigurable Processors. European Test Symposium 2007: 117-124
20	EE	Tomokazu Yoneda, Akiko Shuto, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara: TAM Design and Optimization for Transparency-Based SoC Test. VTS 2007: 381-388
19	EE	Hideyuki Ichihara, Toshihiro Ohara, Michihiro Shintani, Tomoo Inoue: A Variable-Length Coding Adjustable for Compressed Test Application. IEICE Transactions 90-D(8): 1235-1242 (2007)
18	EE	Hideyuki Ichihara, Toshimasa Kuchii, Masaaki Yamadate, Hideaki Sakaguchi, Hiroshi Uemura, Kozo Kinoshita: A statistical error model for image sensors and its testing. Systems and Computers in Japan 38(11): 1-11 (2007)
2006
17	EE	Tomoyuki Saiki, Hideyuki Ichihara, Tomoo Inoue: A Reconfigurable Embedded Decompressor for Test Compression. DELTA 2006: 301-308
2005
16	EE	Michihiro Shintani, Toshihiro Ohara, Hideyuki Ichihara, Tomoo Inoue: A Huffman-based coding with efficient test application. ASP-DAC 2005: 75-78
15	EE	Hideyuki Ichihara, Tomoo Inoue, Naoki Okamoto, Toshinori Hosokawa, Hideo Fujiwara: An Effective Design for Hierarchical Test Generation Based on Strong Testability. Asian Test Symposium 2005: 288-293
14	EE	Hideyuki Ichihara, Michihiro Shintani, Tomoo Inoue: Huffman-Based Test Response Coding. IEICE Transactions 88-D(1): 158-161 (2005)
13	EE	Yoshinobu Higami, Seiji Kajihara, Hideyuki Ichihara, Yuzo Takamatsu: Test cost reduction for logic circuits: Reduction of test data volume and test application time. Systems and Computers in Japan 36(6): 69-83 (2005)
2004
12	EE	Hideyuki Ichihara, Masakuni Ochi, Michihiro Shintani, Tomoo Inoue: A Test Decompression Scheme for Variable-Length Coding. Asian Test Symposium 2004: 426-431
2003
11	EE	Hideyuki Ichihara, Michihiro Shintani, Toshihiro Ohara, Tomoo Inoue: Test Response Compression Based on Huffman Coding. Asian Test Symposium 2003: 446-451
10	EE	Hideyuki Ichihara, Tomoo Inoue: Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG. DATE 2003: 11180-11181
9	EE	Hideyuki Ichihara, Kozo Kinoshita, Koji Isodono, Shigeki Nishikawa: Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs. VLSI Design 2003: 329-334
2002
8	EE	Hideyuki Ichihara, Tomoo Inoue: Generating Small Test Sets for Test Compression/Decompression Scheme Using Statistical Coding. DELTA 2002: 396-402
2001
7	EE	Hideyuki Ichihara, Atsuhiro Ogawa, Tomoo Inoue, Akio Tamura: Dynamic Test Compression Using Statistical Coding. Asian Test Symposium 2001: 143-
2000
6	EE	Hideyuki Ichihara, Kozo Kinoshita, Irith Pomeranz, Sudhakar M. Reddy: Test Transformation to Improve Compaction by Statistical Encoding. VLSI Design 2000: 294-299
1999
5	EE	Hideyuki Ichihara, Kozo Kinoshita, Seiji Kajihara: On an Effective Selection of IDDQ Measurement Vectors for Sequential Circuits. Asian Test Symposium 1999: 147-152
4	EE	Hideyuki Ichihara, Kozo Kinoshita, Seiji Kajihara: On Test Generation with A Limited Number of Tests. Great Lakes Symposium on VLSI 1999: 12-15
1998
3	EE	Hideyuki Ichihara, Seiji Kajihara, Kozo Kinoshita: An Efficient Procedure for Obtaining Implication Relations and Its Application to Redundancy Identification. Asian Test Symposium 1998: 58-63
1997
2	EE	Hideyuki Ichihara, Kozo Kinoshita: On Acceleration of Logic Circuits Optimization Using Implication Relations. Asian Test Symposium 1997: 222-227
1	EE	Hideyuki Ichihara, Kozo Kinoshita, Seiji Kajihara: On invariant implication relations for removing partial circuits. Systems and Computers in Japan 28(7): 39-47 (1997)

Coauthor Index

1	Takashi Fujii	[21] [22]
2	Hideo Fujiwara	[15] [20]
3	Yoshinobu Higami	[13]
4	Toshinori Hosokawa	[15]
5	Tomoo Inoue	[7] [8] [10] [11] [12] [14] [15] [16] [17] [19] [20] [21] [22] [23]
6	Koji Isodono	[9]
7	Seiji Kajihara	[1] [3] [4] [5] [13]
8	Kozo Kinoshita	[1] [2] [3] [4] [5] [6] [9] [18]
9	Toshimasa Kuchii	[18]
10	Shigeki Nishikawa	[9]
11	Masakuni Ochi	[12]
12	Atsuhiro Ogawa	[7]
13	Toshihiro Ohara	[11] [16] [19]
14	Naoki Okamoto	[15]
15	Irith Pomeranz	[6]
16	Sudhakar M. Reddy	[6]
17	Tomoyuki Saiki	[17] [23]
18	Hideaki Sakaguchi	[18]
19	Michihiro Shintani	[11] [12] [14] [16] [19]
20	Akiko Shuto	[20]
21	Yuzo Takamatsu	[13]
22	Akio Tamura	[7]
23	Hiroshi Uemura	[18]
24	Masaaki Yamadate	[18]
25	Tomokazu Yoneda	[20]