Soumendu Bhattacharya

2008
23	EE	Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee: Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. VTS 2008: 175-180
22	EE	Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee: System-Level Specification Testing Of Wireless Transceivers. IEEE Trans. VLSI Syst. 16(3): 263-276 (2008)
2007
21	EE	Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee: Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors. VTS 2007: 125-130
2006
20	EE	Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee: Low Cost Parametric Failure Diagnosis of RF Transceivers. European Test Symposium 2006: 205-212
19	EE	Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee: Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. European Test Symposium 2006: 35-42
18	EE	Soumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair: Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms. VLSI Design 2006: 729-733
17	EE	Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee: Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. VTS 2006: 192-199
16	EE	Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee: Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction. VTS 2006: 208-213
15	EE	Soumendu Bhattacharya, Abhijit Chatterjee: A DFT Approach for Testing Embedded Systems Using DC Sensors. IEEE Design & Test of Computers 23(6): 464-475 (2006)
2005
14	EE	Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt: On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). IOLTS 2005: 106-111
13	EE	Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee: A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. VLSI Design 2005: 289-294
12	EE	Soumendu Bhattacharya, Abhijit Chatterjee: Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices. VTS 2005: 137-142
11	EE	Soumendu Bhattacharya, Abhijit Chatterjee: Optimized wafer-probe and assembled package test design for analog circuits. ACM Trans. Design Autom. Electr. Syst. 10(2): 303-329 (2005)
10	EE	Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee: Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. J. Electronic Testing 21(3): 323-339 (2005)
2004
9	EE	Soumendu Bhattacharya, Abhijit Chatterjee: A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits. Asian Test Symposium 2004: 68-73
8	EE	Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee: Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. DATE 2004: 280-285
7	EE	Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee: Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. DELTA 2004: 372-377
6	EE	Soumendu Bhattacharya, Abhijit Chatterjee: Use of Embedded Sensors for Built-In-Test of RF Circuits. ITC 2004: 801-809
5	EE	Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee: System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. VTS 2004: 229-236
2003
4	EE	Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee: Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. ITC 2003: 665-673
3	EE	Soumendu Bhattacharya, Abhijit Chatterjee: High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost. VTS 2003: 89-100
2002
2	EE	Soumendu Bhattacharya, Abhijit Chatterjee: Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models. DELTA 2002: 25-32
1993
1	EE	Abhijit Chatterjee, P. P. Das, Soumendu Bhattacharya: Visualization in linear programming using parallel coordinates. Pattern Recognition 26(11): 1725-1736 (1993)

Coauthor Index

1	Selim Sermet Akbay	[14]
2	Maryam Ashouei	[16] [19] [21]
3	Abhijit Chatterjee	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23]
4	Sasikumar Cherubal	[5] [7] [8]
5	P. P. Das	[1]
6	William R. Eisenstadt	[14]
7	Shalabh Goyal	[20]
8	Achintya Halder	[4] [5] [10] [13] [22]
9	Donghoon Han	[14] [20]
10	Sankar Nair	[18]
11	Vishwanath Natarajan	[17] [18]
12	Rajarajan Senguttuvan	[23]
13	Ganesh Srinivasan	[5] [7] [8] [10] [13]