Soumendu Bhattacharya

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23EERajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee: Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. VTS 2008: 175-180
22EEAchintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee: System-Level Specification Testing Of Wireless Transceivers. IEEE Trans. VLSI Syst. 16(3): 263-276 (2008)
21EEMaryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee: Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors. VTS 2007: 125-130
20EEDonghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee: Low Cost Parametric Failure Diagnosis of RF Transceivers. European Test Symposium 2006: 205-212
19EEMaryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee: Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. European Test Symposium 2006: 35-42
18EESoumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair: Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms. VLSI Design 2006: 729-733
17EEVishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee: Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. VTS 2006: 192-199
16EEMaryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee: Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction. VTS 2006: 208-213
15EESoumendu Bhattacharya, Abhijit Chatterjee: A DFT Approach for Testing Embedded Systems Using DC Sensors. IEEE Design & Test of Computers 23(6): 464-475 (2006)
14EEDonghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt: On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). IOLTS 2005: 106-111
13EEAchintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee: A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. VLSI Design 2005: 289-294
12EESoumendu Bhattacharya, Abhijit Chatterjee: Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices. VTS 2005: 137-142
11EESoumendu Bhattacharya, Abhijit Chatterjee: Optimized wafer-probe and assembled package test design for analog circuits. ACM Trans. Design Autom. Electr. Syst. 10(2): 303-329 (2005)
10EESoumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee: Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. J. Electronic Testing 21(3): 323-339 (2005)
9EESoumendu Bhattacharya, Abhijit Chatterjee: A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits. Asian Test Symposium 2004: 68-73
8EEGanesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee: Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. DATE 2004: 280-285
7EESoumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee: Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. DELTA 2004: 372-377
6EESoumendu Bhattacharya, Abhijit Chatterjee: Use of Embedded Sensors for Built-In-Test of RF Circuits. ITC 2004: 801-809
5EESoumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee: System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. VTS 2004: 229-236
4EEAchintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee: Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. ITC 2003: 665-673
3EESoumendu Bhattacharya, Abhijit Chatterjee: High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost. VTS 2003: 89-100
2EESoumendu Bhattacharya, Abhijit Chatterjee: Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models. DELTA 2002: 25-32
1EEAbhijit Chatterjee, P. P. Das, Soumendu Bhattacharya: Visualization in linear programming using parallel coordinates. Pattern Recognition 26(11): 1725-1736 (1993)

Coauthor Index

1Selim Sermet Akbay [14]
2Maryam Ashouei [16] [19] [21]
3Abhijit Chatterjee [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23]
4Sasikumar Cherubal [5] [7] [8]
5P. P. Das [1]
6William R. Eisenstadt [14]
7Shalabh Goyal [20]
8Achintya Halder [4] [5] [10] [13] [22]
9Donghoon Han [14] [20]
10Sankar Nair [18]
11Vishwanath Natarajan [17] [18]
12Rajarajan Senguttuvan [23]
13Ganesh Srinivasan [5] [7] [8] [10] [13]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)