Ilia Polian

2009
48	EE	Kunal P. Ganeshpure, Ilia Polian, Sandip Kundu, Bernd Becker: Reducing temperature variability by routing heat pipes. ACM Great Lakes Symposium on VLSI 2009: 63-68
47	EE	Alejandro Czutro, Ilia Polian, Matthew Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker: TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis. VLSI Design 2009: 227-232
2008
46	EE	Piet Engelke, Ilia Polian, Jürgen Schlöffel, Bernd Becker: Resistive Bridging Fault Simulation of Industrial Circuits. DATE 2008: 628-633
45	EE	Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen: Diagnosis of Realistic Defects Based on the X-Fault Model. DDECS 2008: 263-266
44	EE	Ilia Polian, Sudhakar M. Reddy, Irith Pomeranz, Xun Tang, Bernd Becker: On Reducing Circuit Malfunctions Caused by Soft Errors. DFT 2008: 245-253
43	EE	Ilia Polian, Wenjing Rao: Selective Hardening of NanoPLA Circuits. DFT 2008: 263-271
42	EE	Damian Nowroth, Ilia Polian, Bernd Becker: A study of cognitive resilience in a JPEG compressor. DSN 2008: 32-41
41	EE	Ilia Polian, Sudhakar M. Reddy, Bernd Becker: Scalable Calculation of Logical Masking Effects for Selective Hardening Against Soft Errors. ISVLSI 2008: 257-262
40	EE	Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng: Automatic Test Pattern Generation for Interconnect Open Defects. VTS 2008: 181-186
39	EE	Piet Engelke, Ilia Polian, Michel Renovell, Sandip Kundu, Bharath Seshadri, Bernd Becker: On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. IEEE Trans. on CAD of Integrated Circuits and Systems 27(2): 327-338 (2008)
2007
38	EE	Ilia Polian, Damian Nowroth, Bernd Becker: Identification of Critical Errors in Imaging Applications. IOLTS 2007: 201-202
37	EE	John P. Hayes, Ilia Polian, Bernd Becker: An Analysis Framework for Transient-Error Tolerance. VTS 2007: 249-255
36	EE	Ilia Polian, Alejandro Czutro, Bernd Becker: Evolutionary Optimization in Code-Based Test Compression CoRR abs/0710.4670: (2007)
35	EE	Stefan Spinner, J. Bartholomeyczik, Bernd Becker, M. Doelle, O. Paul, Ilia Polian, R. Roth, K. Seitz, P. Ruther: Electromechanical Reliability Testing of Three-Axial Silicon Force Sensors CoRR abs/0711.3289: (2007)
34	EE	Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd Becker: Power Droop Testing. IEEE Design & Test of Computers 24(3): 276-284 (2007)
33	EE	Ilia Polian, Hideo Fujiwara: Functional Constraints vs. Test Compression in Scan-Based Delay Testing. J. Electronic Testing 23(5): 445-455 (2007)
2006
32	EE	Ilia Polian, Hideo Fujiwara: Functional constraints vs. test compression in scan-based delay testing. DATE 2006: 1039-1044
31		Jochen Eisinger, Ilia Polian, Bernd Becker, Alexander Metzner, Stephan Thesing, Reinhard Wilhelm: Automatic Identification of Timing Anomalies for Cycle-Accurate Worst-Case Execution Time Analysis. DDECS 2006: 15-20
30	EE	Ilia Polian, Bernd Becker, Masato Nakasato, Satoshi Ohtake, Hideo Fujiwara: Low-Cost Hardening of Image Processing Applications Against Soft Errors. DFT 2006: 274-279
29	EE	Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd Becker: Power Droop Testing. ICCD 2006
28	EE	Sandip Kundu, Ilia Polian: An Improved Technique for Reducing False Alarms Due to Soft Errors. IOLTS 2006: 105-110
27	EE	Jan Reineke, Björn Wachter, Stephan Thesing, Reinhard Wilhelm, Ilia Polian, Jochen Eisinger, Bernd Becker: A Definition and Classification of Timing Anomalies. WCET 2006
26	EE	Yuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker, Jürgen Schlöffel, Friedrich Hapke, Michael Wittke: X-masking during logic BIST and its impact on defect coverage. IEEE Trans. VLSI Syst. 14(2): 193-202 (2006)
25	EE	Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker: Simulating Resistive-Bridging and Stuck-At Faults. IEEE Trans. on CAD of Integrated Circuits and Systems 25(10): 2181-2192 (2006)
24	EE	Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker: Automatic Test Pattern Generation for Resistive Bridging Faults. J. Electronic Testing 22(1): 61-69 (2006)
23	EE	Bernd Becker, Ilia Polian, Sybille Hellebrand, Bernd Straube, Hans-Joachim Wunderlich: DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems). it - Information Technology 48(5): 304- (2006)
2005
22	EE	Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Becker: On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. Asian Test Symposium 2005: 266-271
21	EE	Ilia Polian, Thomas Fiehn, Bernd Becker, John P. Hayes: A Family of Logical Fault Models for Reversible Circuits. Asian Test Symposium 2005: 422-427
20	EE	Ilia Polian, Alejandro Czutro, Bernd Becker: Evolutionary Optimization in Code-Based Test Compression. DATE 2005: 1124-1129
19	EE	Ilia Polian, Sandip Kundu, Jean Marc Gallière, Piet Engelke, Michel Renovell, Bernd Becker: Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies. VTS 2005: 343-348
18	EE	Ilia Polian, Piet Engelke, Michel Renovell, Bernd Becker: Modeling Feedback Bridging Faults with Non-Zero Resistance. J. Electronic Testing 21(1): 57-69 (2005)
17	EE	Ilia Polian: Nichtstandardfehlermodelle für digitale Logikschaltkreise: Simulation, prüfgerechter Entwurf, industrielle Anwendungen (On Non-standard Fault Models for Logic Digital Circuits: Simulation, Design for Testability, Industrial Applications). it - Information Technology 47(3): 172-174 (2005)
2004
16	EE	John P. Hayes, Ilia Polian, Bernd Becker: Testing for Missing-Gate Faults in Reversible Circuits. Asian Test Symposium 2004: 100-105
15	EE	Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker: X-Masking During Logic BIST and Its Impact on Defect Coverage. ITC 2004: 442-451
14	EE	Piet Engelke, Ilia Polian, Michel Renovell, Bharath Seshadri, Bernd Becker: The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults. VTS 2004: 171-178
13	EE	Ilia Polian, Bernd Becker: Scalable Delay Fault BIST for Use with Low-Cost ATE. J. Electronic Testing 20(2): 181-197 (2004)
2003
12	EE	Ilia Polian, Bernd Becker, Sudhakar M. Reddy: Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST. DATE 2003: 11184-11185
11	EE	Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker: Simulating Resistive Bridging and Stuck-At Faults. ITC 2003: 1051-1059
10		Ilia Polian, Bernd Becker: Reducing ATE Cost in System-on-Chip Test. VLSI-SOC 2003: 337-342
9	EE	Ilia Polian, Wolfgang Günther, Bernd Becker: Pattern-based verification of connections to intellectual property cores. Integration 35(1): 25-44 (2003)
8	EE	Ilia Polian, Bernd Becker: Multiple Scan Chain Design for Two-Pattern Testing. J. Electronic Testing 19(1): 37-48 (2003)
7	EE	Jonathan Bradford, Hartmut Delong, Ilia Polian, Bernd Becker: Simulating Realistic Bridging and Crosstalk Faults in an Industrial Setting. J. Electronic Testing 19(4): 387-395 (2003)
2002
6	EE	Ilia Polian, Irith Pomeranz, Bernd Becker: Exact Computation of Maximally Dominating Faults and Its Application to n-Detection Tests. Asian Test Symposium 2002: 2-14
5	EE	Ilia Polian, Bernd Becker: Stop & Go BIST. IOLTW 2002: 147-151
4	EE	Ilia Polian, Martin Keim, Nicolai Mallig, Bernd Becker: Sequential n -Detection Criteria: Keep It Simple. IOLTW 2002: 189
3	EE	Ilia Polian, Piet Engelke, Bernd Becker: Efficient Bridging Fault Simulation of Sequential Circuits Based on Multi-Valued Logics. ISMVL 2002: 216-
2001
2	EE	Ilia Polian, Wolfgang Günther, Bernd Becker: Efficient Pattern-Based Verification of Connections to IP Cores . Asian Test Symposium 2001: 443-448
1	EE	Ilia Polian, Bernd Becker: Multiple Scan Chain Design for Two-Pattern Testing. VTS 2001: 88-93

Coauthor Index

1	J. Bartholomeyczik	[35]
2	Bernd Becker	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [29] [30] [31] [34] [35] [36] [37] [38] [39] [40] [41] [42] [44] [45] [46] [47] [48]
3	Jonathan Bradford	[7]
4	Wu-Tung Cheng	[40]
5	Alejandro Czutro	[20] [29] [34] [36] [47]
6	Hartmut Delong	[7]
7	M. Doelle	[35]
8	Jochen Eisinger	[27] [31]
9	Piet Engelke	[3] [11] [14] [15] [18] [19] [22] [24] [25] [26] [39] [40] [45] [46] [47]
10	Thomas Fiehn	[21]
11	Hideo Fujiwara	[30] [32] [33]
12	Jean Marc Gallière	[19]
13	Kunal P. Ganeshpure	[48]
14	Wolfgang Günther	[2] [9]
15	Friedrich Hapke	[15] [26]
16	John P. Hayes	[16] [21] [37]
17	Sybille Hellebrand	[23]
18	Seiji Kajihara	[45]
19	Martin Keim	[4] [40]
20	Sandip Kundu	[19] [22] [28] [29] [34] [39] [48]
21	Matthew Lewis	[47]
22	Nicolai Mallig	[4]
23	Alexander Metzner	[31]
24	Kohei Miyase	[45]
25	Yusuke Nakamura	[45]
26	Masato Nakasato	[30]
27	Damian Nowroth	[38] [42]
28	Satoshi Ohtake	[30]
29	O. Paul	[35]
30	Irith Pomeranz	[6] [44]
31	Wenjing Rao	[43]
32	Sudhakar M. Reddy	[12] [41] [44] [47]
33	Jan Reineke	[27]
34	Michel Renovell	[11] [14] [18] [19] [24] [25] [39]
35	R. Roth	[35]
36	P. Ruther	[35]
37	Jürgen Schlöffel	[26] [46]
38	K. Seitz	[35]
39	Bharath Seshadri	[14] [39]
40	Stefan Spinner	[35] [40] [45]
41	Bernd Straube	[23]
42	Xun Tang	[44]
43	Yuyi Tang	[15] [26]
44	Stephan Thesing	[27] [31]
45	Harald P. E. Vranken	[15]
46	Björn Wachter	[27]
47	Xiaoqing Wen	[45]
48	Reinhard Wilhelm	[27] [31]
49	Michael Wittke	[15] [26]
50	Hans-Joachim Wunderlich	[15] [23] [26]

Colors in the list of coauthors