| |
| 2006 | ||
|---|---|---|
| 2 | EE | Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang: MICRO: a new hybrid test data compression/decompression scheme. IEEE Trans. VLSI Syst. 14(6): 649-654 (2006) |
| 2004 | ||
| 1 | EE | Jung-Been Im, Sunghoon Chun, Geunbae Kim, Jin-Ho Ahn, Sungho Kang: RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test. Asian Test Symposium 2004: 242-247 |
| 1 | Jin-Ho Ahn | [1] |
| 2 | Sunghoon Chun | [1] [2] |
| 3 | Sungho Kang | [1] [2] |
| 4 | Geunbae Kim | [1] |
| 5 | YongJoon Kim | [2] |