2008 |
43 | | Parag K. Lala:
On FPGA Design with Self-checking and Fault Tolerance Capability.
ERSA 2008: 29-34 |
2007 |
42 | EE | Jia Di,
Parag K. Lala:
Cellular Array-based Delay-insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems.
J. Electronic Testing 23(2-3): 175-192 (2007) |
2006 |
41 | EE | Parag K. Lala,
B. Kiran Kumar,
James Patrick Parkerson:
On self-healing digital system design.
Microelectronics Journal 37(4): 353-362 (2006) |
2005 |
40 | EE | D. P. Vasudevan,
Parag K. Lala:
A Technique for Modular Design of Self-Checking Carry-Select Adder.
DFT 2005: 325-333 |
39 | EE | Jia Di,
Parag K. Lala,
D. P. Vasudevan:
On the Effect of Stuck-at Faults on Delay-insensitive Nanoscale Circuits.
DFT 2005: 371-379 |
38 | EE | C. K. Tang,
Parag K. Lala,
James Patrick Parkerson:
A Technique for Designing Totally Self-Checking Domino Logic Circuits.
ISQED 2005: 128-132 |
37 | EE | D. P. Vasudevan,
Parag K. Lala,
James Patrick Parkerson:
CMOS Realization of Online Testable Reversible Logic Gates.
ISVLSI 2005: 309-310 |
2004 |
36 | EE | D. P. Vasudevan,
Parag K. Lala,
James Patrick Parkerson:
A Novel Approach for On-line Testable Reversible Logic Circuit Desig.
Asian Test Symposium 2004: 325-330 |
35 | | D. P. Vasudevan,
James Patrick Parkerson,
Parag K. Lala:
Logic implementation using a reversible gate.
Circuits, Signals, and Systems 2004: 452-456 |
34 | EE | D. P. Vasudevan,
Parag K. Lala,
James Patrick Parkerson:
Online Testable Reversible Logic Circuit Design using NAND Blocks.
DFT 2004: 324-331 |
33 | | D. P. Vasudevan,
Parag K. Lala:
A New Reversible Logic Gate and its Applications.
ESA/VLSI 2004: 480-484 |
2003 |
32 | EE | Parag K. Lala:
A Single Error Correcting and Double Error Detecting Coding Scheme for Computer Memory Systems.
DFT 2003: 235-241 |
31 | EE | Parag K. Lala,
B. Kiran Kumar:
An FPGA architecture with built-in error correction capability.
FPGA 2003: 245 |
30 | EE | S. R. Seward,
Parag K. Lala:
Fault Injection in Digital Logic Circuits at the VHDL Level.
IOLTS 2003: 161 |
29 | EE | Whitney J. Townsend,
Jacob A. Abraham,
Parag K. Lala:
On-Line Error Detecting Constant Delay Adder.
IOLTS 2003: 17- |
28 | EE | S. R. Seward,
Parag K. Lala:
Fault Injection for Verifying Testability at the VHDL Level.
ITC 2003: 131-137 |
27 | EE | B. Kiran Kumar,
Parag K. Lala:
On-line Detection of Faults in Carry-Select Adders.
ITC 2003: 912-918 |
26 | EE | Parag K. Lala,
B. Kiran Kumar:
An Architecture for Self-Healing Digital Systems.
J. Electronic Testing 19(5): 523-535 (2003) |
2002 |
25 | EE | Parag K. Lala,
K. K. Bondali:
On Biologically-Inspired Design of Fault-Tolerant Digital Systems.
DELTA 2002: 287-290 |
24 | EE | Parag K. Lala,
B. Kiran Kumar:
An Architecture for Self-Healing Digital Systems.
IOLTW 2002: 3-7 |
23 | EE | Parag K. Lala,
B. Kiran Kumar:
Human Immune System Inspired Architecture for Self-Healing Digital Systems.
ISQED 2002: 292-297 |
22 | | Whitney J. Townsend,
Mitchell A. Thornton,
Parag K. Lala:
On-line Error Detection in a Carry-free Adder.
IWLS 2002: 251-254 |
2001 |
21 | EE | Parag K. Lala,
Alvernon Walker:
A Unified Scheme for Designing Testable State Machines.
Asian Test Symposium 2001: 273-278 |
20 | EE | Parag K. Lala,
Alvernon Walker:
On-Line Error Detectable Carry-Free Adder Design.
DFT 2001: 66-71 |
19 | EE | Parag K. Lala,
Mark G. Karpovsky:
An Approach for Designing On-Line Testable State Machines.
IOLTW 2001: 135 |
2000 |
18 | EE | Parag K. Lala,
Alvernon Walker:
An On-Line Reconfigurable FPGA Architecture.
DFT 2000: 275- |
17 | EE | Jong O. Kim,
Parag K. Lala,
Young Gun Kim,
Heung-Soo Kim:
Fault Analysis of the Multiple Valued Logic Using Spectral Method.
ISMVL 2000: 59- |
16 | EE | Alvernon Walker,
Parag K. Lala:
A Transition Based BIST Approach for Passive Analog Circuits.
ISQED 2000: 347-354 |
1999 |
15 | EE | Parag K. Lala,
Anup Singh,
Alvernon Walker:
A CMOS-Based Logic Cell for the Implementation of Self-Checking FPGAs.
DFT 1999: 238-246 |
14 | EE | Parag K. Lala,
A. L. Burress:
Self-Checking Logic Design for LUT-Based FPGAs.
FPGA 1999: 253 |
13 | EE | Parag K. Lala,
A. L. Burress:
A technique for designing self-checking logic for FPGAs.
ISCAS (1) 1999: 94-96 |
1997 |
12 | EE | Alvernon Walker,
Algernon P. Henry,
Parag K. Lala:
An approach for detecting bridging faults in CMOS domino logic circuits using dynamic power supply current monitoring.
DFT 1997: 272-280 |
11 | | A. L. Burress,
Parag K. Lala:
On-Line Testable Logic Desgin for FPGA Implementation.
ITC 1997: 471-478 |
1996 |
10 | | K. Lai,
Parag K. Lala:
Multiple Fault Detection in Fan-Out Free Circuits Using Minimal Single Fault Test Set.
IEEE Trans. Computers 45(6): 763-765 (1996) |
9 | EE | D. A. Pierce,
Parag K. Lala:
Modular implementation of efficient self-checking checkers for the Berger code.
J. Electronic Testing 9(3): 279-294 (1996) |
1995 |
8 | EE | Fadi Y. Busaba,
Parag K. Lala:
A graph coloring based approach for self-checking logic circuit design.
Asian Test Symposium 1995: 327- |
1994 |
7 | | J. Q. Wang,
Parag K. Lala:
Partially Strongly Fault Secure and Partially Strongly Code Disjoint I-out-of-3 Code Checker.
IEEE Trans. Computers 43(10): 1238-1240 (1994) |
6 | EE | Fadi Y. Busaba,
Parag K. Lala:
Self-checking combinational circuit design for single and unidirectional multibit error.
J. Electronic Testing 5(1): 19-28 (1994) |
1992 |
5 | EE | Alvernon Walker,
Winser E. Alexander,
Parag K. Lala:
Fault Diagnosis in Analog Circuits Using Element Modulation.
IEEE Design & Test of Computers 9(1): 19-29 (1992) |
4 | | D. L. Tao,
Carlos R. P. Hartmann,
Parag K. Lala:
A General Technique for Designing Totally Self-Checking Checker for 1-out-of-N Code with Minimum Gate Delay.
IEEE Trans. Computers 41(7): 881-886 (1992) |
1991 |
3 | | D. L. Tao,
Carlos R. P. Hartmann,
Parag K. Lala:
A Note on t-EC/d-UED Codes.
IEEE Trans. Computers 40(5): 660-663 (1991) |
1986 |
2 | | D. L. Tao,
Carlos R. P. Hartmann,
Parag K. Lala:
A Concurrent Testing Strategy for PLAs.
ITC 1986: 705-709 |
1 | | Parag K. Lala:
On Built-In Testing of VLSI Chips.
ITC 1986: 719-721 |