Tetsuo Tada

2004
4	EE	Tetsuo Tada: Opportunities with the open architecture test system. ASP-DAC 2004: 343
3	EE	Masaki Hashizume, Daisuke Yoneda, Hiroyuki Yotsuyanagi, Tetsuo Tada, Takeshi Koyama, Ikuro Morita, Takeomi Tamesada: I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment. Asian Test Symposium 2004: 112-117
2001
2		Yoshihiro Nagura, Michael Mullins, Anthony Sauvageau, Yoshinoro Fujiwara, Katsuya Furue, Ryuji Ohmura, Tatsunori Komoike, Takenori Okitaka, Tetsushi Tanizaki, Katsumi Dosaka, Kazutami Arimoto, Yukiyoshi Koda, Tetsuo Tada: Test cost reduction by at-speed BISR for embedded DRAMs. ITC 2001: 182-187
1996
1		Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe: A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM. ITC 1996: 319-324

Coauthor Index

1	Haruhiko Abe	[1]
2	Kazutami Arimoto	[2]
3	Katsumi Dosaka	[2]
4	Yoshinoro Fujiwara	[2]
5	Katsuya Furue	[2]
6	Mitsuhiro Hamada	[1]
7	Masaki Hashizume	[3]
8	Yukiyoshi Koda	[2]
9	Tatsunori Komoike	[2]
10	Shinji Komori	[1]
11	Takeshi Koyama	[3]
12	Kazuo Kyuma	[1]
13	Ikuro Morita	[3]
14	Michael Mullins	[2]
15	Yoshihiro Nagura	[2]
16	Ryuji Ohmura	[2]
17	Takenori Okitaka	[2]
18	Fumihiro Okuda	[1]
19	Narumi Sakashita	[1]
20	Anthony Sauvageau	[2]
21	Hiroki Shimano	[1]
22	Ken'ichi Shimomura	[1]
23	Takeomi Tamesada	[3]
24	Tetsushi Tanizaki	[2]
25	Akihiko Yasuoka	[1]
26	Daisuke Yoneda	[3]
27	Hiroyuki Yotsuyanagi	[3]

Colors in the list of coauthors