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Tetsuo Tada

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2004
4EETetsuo Tada: Opportunities with the open architecture test system. ASP-DAC 2004: 343
3EEMasaki Hashizume, Daisuke Yoneda, Hiroyuki Yotsuyanagi, Tetsuo Tada, Takeshi Koyama, Ikuro Morita, Takeomi Tamesada: I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment. Asian Test Symposium 2004: 112-117
2001
2 Yoshihiro Nagura, Michael Mullins, Anthony Sauvageau, Yoshinoro Fujiwara, Katsuya Furue, Ryuji Ohmura, Tatsunori Komoike, Takenori Okitaka, Tetsushi Tanizaki, Katsumi Dosaka, Kazutami Arimoto, Yukiyoshi Koda, Tetsuo Tada: Test cost reduction by at-speed BISR for embedded DRAMs. ITC 2001: 182-187
1996
1 Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe: A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM. ITC 1996: 319-324

Coauthor Index

1Haruhiko Abe [1]
2Kazutami Arimoto [2]
3Katsumi Dosaka [2]
4Yoshinoro Fujiwara [2]
5Katsuya Furue [2]
6Mitsuhiro Hamada [1]
7Masaki Hashizume [3]
8Yukiyoshi Koda [2]
9Tatsunori Komoike [2]
10Shinji Komori [1]
11Takeshi Koyama [3]
12Kazuo Kyuma [1]
13Ikuro Morita [3]
14Michael Mullins [2]
15Yoshihiro Nagura [2]
16Ryuji Ohmura [2]
17Takenori Okitaka [2]
18Fumihiro Okuda [1]
19Narumi Sakashita [1]
20Anthony Sauvageau [2]
21Hiroki Shimano [1]
22Ken'ichi Shimomura [1]
23Takeomi Tamesada [3]
24Tetsushi Tanizaki [2]
25Akihiko Yasuoka [1]
26Daisuke Yoneda [3]
27Hiroyuki Yotsuyanagi [3]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)