| 2006 |
|---|
| 8 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Simone Borri,
Magali Bastian Hage-Hassan:
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions.
J. Electronic Testing 22(3): 287-296 (2006) |
| 2005 |
|---|
| 7 | EE | Simone Borri,
Magali Bastian Hage-Hassan,
Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel:
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test.
J. Electronic Testing 21(2): 169-179 (2005) |
| 6 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Simone Borri,
Magali Bastian Hage-Hassan:
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories.
J. Electronic Testing 21(5): 551-561 (2005) |
| 2004 |
|---|
| 5 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Simone Borri,
Magali Bastian Hage-Hassan:
Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution.
Asian Test Symposium 2004: 266-271 |
| 4 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Simone Borri:
March iC-: An Improved Version of March C- for ADOFs Detection.
VTS 2004: 129-138 |
| 2003 |
|---|
| 3 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Simone Borri:
Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders.
Asian Test Symposium 2003: 250-255 |
| 2002 |
|---|
| 2 | EE | Emmanuel Rondey,
Yann Tellier,
Simone Borri:
A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios.
IOLTW 2002: 251-255 |
| 1 | EE | Emmanuel Rondey,
Yann Tellier,
Simone Borri:
A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios.
MTDT 2002: 57-61 |
