| 2008 |
|---|
| 5 | EE | Zhiyuan He,
Zebo Peng,
Petru Eles,
Paul M. Rosinger,
Bashir M. Al-Hashimi:
Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving.
J. Electronic Testing 24(1-3): 247-257 (2008) |
| 2006 |
|---|
| 4 | EE | Zhiyuan He,
Zebo Peng,
Petru Eles:
Power constrained and defect-probability driven SoC test scheduling with test set partitioning.
DATE 2006: 291-296 |
| 3 | EE | Zhiyuan He,
Zebo Peng,
Petru Eles,
Paul M. Rosinger,
Bashir M. Al-Hashimi:
Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving.
DFT 2006: 477-485 |
| 2005 |
|---|
| 2 | EE | Zhiyuan He,
Gert Jervan,
Zebo Peng,
Petru Eles:
Power-Constrained Hybrid BIST Test Scheduling in an Abort-on-First-Fail Test Environment.
DSD 2005: 83-87 |
| 2004 |
|---|
| 1 | EE | Zhiyuan He,
Gert Jervan,
Zebo Peng,
Petru Eles:
Hybrid BIST Test Scheduling Based on Defect Probabilities.
Asian Test Symposium 2004: 230-235 |
